Taizo Fujii

Three Dimensional Molecular Dynamics Study of Void Electromigration in a Strained Bicrystal with a Grain Boundary

Stabilities and movements due to electromigration of a void in an Al lattice or in a bicrystal grain boundary are investigated by thrree-dimensional molecular dynamics simulations empioying ttre empirical pairpotential and the ballistic model for an electron wind force. It is shown ttrat a void becomes more stable when a grain boundary energy increases. A void movement toward cathode direction, which is in good agreement with experiments, is simulated when a void is in the latice. However, the drift velocity of the void is significantly retarded when the void come close to the grain boundary. This may be due to the stabilaization effect of the grain boundary on the void. s-il-16