Takaaki Furuyama

Method and apparatus for initialization control in a non-volatile memory device

Method and apparatus for address allotting and verification in a semiconductor device

Non-volatile memory and write method of the same

Semiconductor storage device and redundancy control method for semiconductor storage device

Memory device and control method therefor

Method and apparatus for applying bias to a storage device

Time reduction of address setup/hold time for semiconductor memory

Memory system and test method therefor

Halbleiterbauelement, Adressenzuordnungsverfahren und Verifizierungsverfahren

Verfahren zum Steuern der Initialisierung eines nicht-flüchtigen Speicherbauelements und nicht-flüchtiges Speicherbauelement