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Featured researches published by Takahiro Daikoku.


Journal of Heat Transfer-transactions of The Asme | 1982

Effects of Pore Diameters and System Pressure on Saturated Pool Nucleate Boiling Heat Transfer From Porous Surfaces

Wataru Nakayama; Takahiro Daikoku; Tadakatsu Nakajima

The porous surface structure was manufactured with precision for the experimental study of nucleate boiling heat transfer in R-11. Boiling curves and the data of bubble formation were obtained with a variety of geometrical and operational parameters; the pore diameters were of 50, 100, 150 ..mu..m, there was a combination of pores of different sizes; and the system pressures were of 0.04, 0.1, 0.23 MPa. The boiling curves exhibit certain trends effected by the diameter and population density of pores. A combination of high system pressure and pore sizes of 100 or 150 ..mu..m dia enables boiling to persist even when the wall superheat is reduced to an extremely low level of 0.1 K. A noteworthy feature of porous surface boiling is that intense bubble formation does not necessarily yield a high heat-transfer performance. Examination of the data indicates that liquid suction and evaporation inside the cavities are a proable mechanism of boiling with small temperature differences.


electronic components and technology conference | 1991

Hardware technology for Hitachi M-880 processor group

Fumiyuki Kobayashi; Yutaka Watanabe; Masakazu Yamamoto; Akio Anzai; Akio Takahashi; Takahiro Daikoku; Tuyoshi Fujita

The authors explain the high-speed high-density semiconductor technology and high-density installation technology developed for the super-high-speed high-reliability M-880 processor groups. To achieve the design goals, a set of advanced hardware technologies has been developed in such areas as semiconductor, ceramic module board, printed circuit board, electric part, cooling, and power feeding. The innovative hardware technologies have been brought into realization by the development of advanced manufacturing techniques and process techniques in addition to the conventional design automation techniques, inspection and diagnosis techniques, and reliability evaluation techniques. During the design, high-precision high-efficiency design evaluations were carried out using software simulation technologies including a three-dimensional electrical characteristic analyzing program a circuit analyzing program, and a thermal stress analyzing program.<<ETX>>


Heat Transfer Engineering | 1988

Forced Convective Heat Transfer from LSI Packages in an Air-Cooled Wiring card Array

Noriyuki Ashiwake; Wataru Nakayama; Takahiro Daikoku; Fumiyuki Kobayashi

The resistance to heat flow from finned LSI packages to the cooling air flow has been studied by combining the physical models with the results of heat transfer experiments, flow visualization experiments, and pressure drop measurements. Although crude assumptions are employed in analytical modeling, the proposed method of prediction of heat transfer and pressure drop has proved useful to cooling system designers. A notable finding is the advantage obtained by placing the packages in a staggered arrangement on the card. This reduces the local air temperature rise by as much as 70% over the conventional in-line arrangement, where the fan power is given as a constraint.


Transactions of the Japan Society of Mechanical Engineers. B | 2007

Conditions for Homogeneous and Rapid Deposition of Si Film on Semiconductor Wafers

Kazuhiro Morimitsu; Takafumi Sasaki; Masanao Fukuda; Takahiro Daikoku; Kazushige Kikuta; Takemi Chikahisa; Takao Hishinuma

The paper investigates the method of improving deposition rate in semiconductor deposition process, while maintaining film thickness uniformity and step coverage in a vertical LPCVD (Low-Pressure Chemical Vapor Deposition) system. In general increasing pressure improves deposition rate, but it decreases uniformity of thickness. The result of experiment and the numerical simulation showed that the non-uniformity of film thickness in high-pressure condition can be improved by controlling flow patterns in the space between wafers. In the molecular flow region (low pressure), the deposition rate and the step coverage were not influenced by the source gas flow rate. In the viscous flow region (high pressure), the step coverage can be improved by increasing source gas flow rate. For the flow the nozzle design and exhaust port location are important. Installation of rings outside of wafers is also effective for the improvement of thickness uniformity.


Journal of Heat Transfer-transactions of The Asme | 1980

Dynamic Model of Enhanced Boiling Heat Transfer on Porous Surfaces—Part I: Experimental Investigation

Wataru Nakayama; Takahiro Daikoku; Heikichi Kuwahara; Tadakatsu Nakajima


Archive | 2000

Device and method for cooling multi-chip modules

Takahiro Daikoku; Junri Ichikawa; Atsuo Nishihara; Kenichi Kasai


Archive | 1984

Cooling module for integrated circuit chips

Minoru Yamada; Akira Masaki; Masakazu Yamamoto; Keiichirou Nakanishi; T. Nishida; Takahiro Daikoku; Fumiyuki Kobayashi; Kuninori Imai


Archive | 1989

Cooling system for cooling an electronic device and heat radiation fin for use in the cooling system

Toshio Hatada; Takayuki Atarashi; Takahiro Daikoku; Satomi Kobayashi; Shizuo Zushi; Fumiyuki Kobayashi; Susumu Iwai


Archive | 1992

Cooling apparatus for electronic device

Takahiro Daikoku; Nobuo Kawasaki; Noriyuki Ashiwake; Keizou Kawamura; Shizuo Zushi; Mitsuo Miyamoto; Atsushi Morihara


Archive | 1992

Liquid impingement cooling module for semiconductor devices

Tadakatsu Nakajima; Shigeo Ohashi; Heikichi Kuwahara; Noriyuki Ashiwake; Motohiro Sato; Toshio Hatsuda; Takahiro Daikoku; Toshio Hatada; Shigeyuki Sasaki; Hiroshi Inouye; Atsuo Nishihara; Kenichi Kasai

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