Takehiro Tachizaki

A Real-Time Terahertz Time-Domain Polarization Analyzer with 80-MHz Repetition-Rate Femtosecond Laser Pulses

We have developed a real-time terahertz time-domain polarization analyzer by using 80-MHz repetition-rate femtosecond laser pulses. Our technique is based on the spinning electro-optic sensor method, which we recently proposed and demonstrated by using a regenerative amplifier laser system; here we improve the detection scheme in order to be able to use it with a femtosecond laser oscillator with laser pulses of a much higher repetition rate. This improvement brings great advantages for realizing broadband, compact and stable real-time terahertz time-domain polarization measurement systems for scientific and industrial applications.

Video-rate terahertz electric-field vector imaging

We present an experimental setup to dramatically reduce a measurement time for obtaining spatial distributions of terahertz electric-field (E-field) vectors. The method utilizes the electro-optic sampling, and we use a charge-coupled device to detect a spatial distribution of the probe beam polarization rotation by the E-field-induced Pockels effect in a ⟨110⟩-oriented ZnTe crystal. A quick rotation of the ZnTe crystal allows analyzing the terahertz E-field direction at each image position, and the terahertz E-field vector mapping at a fixed position of an optical delay line is achieved within 21 ms. Video-rate mapping of terahertz E-field vectors is likely to be useful for achieving real-time sensing of terahertz vector beams, vector vortices, and surface topography. The method is also useful for a fast polarization analysis of terahertz beams.

Nanometer-precise optical length measurement using near-field scanning optical microscopy with sharpened single carbon nanotube probe

We have developed and characterized a plasmon-excitation scattering-type near-field scanning optical microscope with sharpened single carbon nanotube probe. The developed microscope can optically capture differences in the refractive index of single-nanometer surface structures. Statistical analysis enabled us to estimate the precision of the optical length measurement to 1.8 nm.

Optical imaging of nanosized structures by using plasmonically excited cascade near-field coupling with a carbon nanotube probe

Near-field scanning optical microscopy (NSOM) overcomes the diffraction limit, thereby realizing a spatial resolution far beyond the wavelength of light used. However, NSOM still has a problem in repeatable imaging at the high spatial resolution and high contrast with conventional aperture or apertureless probes that are needed for practical applications. Here, we describe an optical imaging technique based on plasmonically excited cascade near-field coupling that has the potential to achieve single-nanometer spatial resolution with high imaging repeatability. This technique makes use of a plasmon waveguide coupled with a high-stiffness carbon nanotube optical probe. Through the action of surface plasmon polaritons, the input far-field light is converted into an optical near field that is used as an excitation source. This excitation near field is strongly enhanced and concentrated on the probe tip such that it generates a second near field as a nanosized probe spot on the apex of the tip. Extremely high-...

High Reproducible Scanning Near-field Optical Microscopy with a Few Nanometer Lateral Spatial Resolution

Scanning near-field optical microscopes (SNOM) have enabled sub-diffraction limit optical imaging and measurement [1]. A number of research and development activities on SNOM and related technique realized spectroscopic measurement of a few nanometer lateral spatial resolution with nondestructive and noninvasive method [2]. Practicability of sub-diffraction resolution and spectroscopic measurement made SNOM a major tool in various scientific fields. However, SNOM has an awaiting solution: measurement reproducibility under a few nanometer resolution.