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Dive into the research topics where Takumi Uesugi is active.

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Featured researches published by Takumi Uesugi.


IEEE Transactions on Magnetics | 2006

A performance study of next generation's TMR heads beyond 200 gb/in/sup 2/

Takeo Kagami; Tetsuya Kuwashima; Satoshi Miura; Takumi Uesugi; Kazuhiro Barada; Naoki Ohta; Noriaki Kasahara; Kazuki Sato; Takayasu Kanaya; Hiroshi Kiyono; Nozomu Hachisuka; Shunji Saruki; Kenji Inage; Norio Takahashi; Koichi Terunuma

Practical level performance for /spl sim/200 Gb/in/sup 2/ has been verified by AlOx barrier tunneling magnetoresistive (TMR) heads, which resistance area product (RA) is more than 3 ohm/spl middot//spl mu/m/sup 2/, in perpendicular recording mode. In addition, improved AlOx barrier magnetic tunnel junctions (MTJs) formed on plated bottom shield with smoothed surface achieved TMR ratio of 25% and 16% with RA of 1.9 and 1.0 ohm/spl middot//spl mu/m/sup 2/, respectively, indicating over 200 Gb/in/sup 2/ is also possible by the AlOx barrier TMR heads with lower RA. Furthermore, TMR heads with crystalline MgO barrier were fabricated. The MgO barrier MTJs formed on plated bottom shield with smoothed surface achieved TMR ratio of 88% with RA of 2.0 ohm/spl middot//spl mu/m/sup 2/, which is 3.5 times higher than that of AlOx barrier MTJs under similar RA. Dynamic electrical test was also performed for TMR heads with the MgO barrier. As a result, good readback waveform with huge output was obtained. This is the first confirmation of readback waveform generated from TMR heads with crystalline MgO barrier. Our results indicate that the future of TMR heads technology is promising beyond 200 Gb/in/sup 2/ application.


IEEE Transactions on Magnetics | 2004

Electrical performance and reliability of tunnel magnetoresistance heads for 100-Gb/in/sup 2/ application

Tetsuya Kuwashima; Kazumasa Fukuda; Hiroshi Kiyono; Kazuki Sato; Takeo Kagami; S. Saruki; Takumi Uesugi; Noriaki Kasahara; Naoki Ohta; Kentaro Nagai; Nozomu Hachisuka; Norio Takahashi; Masamu Naoe; Satoshi Miura; Kazuhiro Barada; Takayasu Kanaya; Kenji Inage; Atsuo Kobayashi

Tunnel magnetoresistance (TuMR) heads are attractive candidates for future high-density recording. To achieve the high areal density, it is necessary for TuMR heads to get lower resistance and higher delta R/R film. A low resistance and high delta R/R tunneling junction film has been developed and used for this study. The resistance area product and delta R/R are 3 /spl Omega//spl middot//spl mu/m/sup 2/ and 18%, respectively. Reliability that includes lifetime was also studied. We have found TuMR heads can be a promising candidate for 100 Gb/in/sup 2/ application.


ieee international magnetics conference | 2000

RuRhMn and PtMn specular spin valve with magnetic oxide layer

Yoshihiro Tsuchiya; S. Le; Masashi Sano; Takumi Uesugi; Satoru Araki; Haruyuki Morita; Mikio Matsuzaki

In this paper, RuRhMn-based and PtMn-based spin valves with magnetic oxide layer (MOL) inserted in the free layer, pinned layer, or both layers were studied. Both magnetoresistance (MR) ratio and /spl Delta/R/sub sq/ were increased in these spin valves, due to the insertion of MOL. Theoretical calculation based on semi-classical Boltzmann equation for transport indicated that the enhancement of MR ratio can be attributed to the strong specular scattering at interface with MOL. PtMn specular spin valves are more thermally stable than RuRhMn spin valves. Their thermal stability can be further improved by using a synthetic pinned layer with MOL, where the effective exchange field degrades less than 20% when the temperature is increased up to 350/spl deg/C.


ieee international magnetics conference | 2005

Low-frequency noise analysis of TMR heads

S. Saruki; Hiroshi Kiyono; Kazumasa Fukuda; Tetsuya Kuwashima; Nozomu Hachisuka; Kenji Inage; Takeo Kagami; Takumi Uesugi; Satoshi Miura; Kazuhiro Barada; Norio Takahashi; Naoki Ohta; Noriaki Kasahara; Kazuki Sato; Takayasu Kanaya; A. Kobayashi

1/f noise as time traces of the fluctuation and low-frequency noise (pulse noise) were observed in TMR heads. These were then related to the quality of the oxide layer in the TMR heads.


IEEE Transactions on Magnetics | 2002

Fabrication and electrical properties of lapped type of TMR heads for /spl sim/50 Gb/in/sup 2/ and beyond

Satoru Araki; Kazuki Sato; Takeo Kagami; S. Saruki; Takumi Uesugi; Noriaki Kasahara; Tetsuya Kuwashima; Naoki Ohta; Jijun Sun; Kentaro Nagai; Shuxiang Li; Nozomu Hachisuka; Hitoshi Hatate; Tsuneo Kagotani; Norio Takahashi; Kunihiro Ueda; Mikio Matsuzaki


Archive | 2002

Magneto-resistive device, and magnetic head and head suspension assembly using same

Takeo Kagami; Kazuki Sato; Shunji Saruki; Takumi Uesugi


Archive | 2004

Magneto-resistive device, and magnetic head, head suspension assembly and magnetic disk apparatus using magneto-resistive device

Takeo Kagami; Takumi Uesugi; Satoshi Miura; Norio Takahashi


Archive | 2006

TMR element having a tunnel barrier which includes crystalline portions and non-crystalline portions

Takumi Uesugi; Satoshi Miura; Takeo Kagami


Archive | 2007

METHOD FOR TESTING NOISE OF THIN-FILM MAGNETIC HEAD, AND MAGNETIC DISK DRIVE APPARATUS WITH NOISE TESTING FUNCTION

Takumi Uesugi; Takeo Kagami; Tetsuro Sasaki; Kei Hirata; Masaru Hirose; Chi Man Lee; Kwok Piu Tso


Archive | 2007

MANUFACTURING METHOD OF TUNNEL MAGNETORESISTIVE EFFECT ELEMENT, MANUFACTURING METHOD OF THIN-FILM MAGNETIC HEAD, AND MANUFACTURING METHOD OF MAGNETIC MEMORY

Satoshi Miura; Takumi Uesugi

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