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Featured researches published by Tang Min.


european conference on radiation and its effects on components and systems | 2005

Experimental Investigation of Radiation Damage on CCD with Protons and Cobalt 60 Gamma Rays

Yu Qingkui; Tang Min; Zhu Hengjing; Zhang Haiming; Zhang Yanwei; Sun Jixing

TDI CCD IL-E2-0512B was irradiated with protons and cobalt 60 gamma rays respectively. The doses levels of failure due to displacement damage and/or ionizing radiation were obtained. The total ionizing dose (TID) and displace damage dose (DDD) on orbit are calculated. It is concluded that the protons displacement damage is dominated the degradation of IL-E2-0512B in space environment. The method to quantitative evaluate the degradation of CCD in space environment is proposed.


prognostics and system health management conference | 2017

Research on single event upset cross-section of DICE SRAM

Zhu Ming; Zhu Hengjing; Hang He; Gu Hantian; Zhang Wei; Yu Qingkui; Sun Yi; Tang Min

In radiation hardened SRAMs and flip-flops, DICE (Dual Interlocked Cell) design is commonly used. DICE is supposed not to flip under normally incident heavy ion beams. But tests show a non-zero SEU cross-section of SICE SRAM. The paper presents a quantitative analysis of the phenomenon. Elastic collision between the incident particle and the silicon atom in the device is considered to be responsible for the SEU in DICE. The simulated results match the experimental results very well. Energy dependency of SEU cross-section is analyzed.


international conference on circuits | 2017

Based on improved subset sampling algorithm for SEU physical simulation

Zhu Ming; Kang He; Zhu Hengjing; Yu Qingkui; Sun Yi; Tang Min

This paper proposes an improved subset sampling algorithm based on machine learning. The physical simulation is executed on SEU cross section of SRAM, which can effectively simulate the real physical process in the single particle effect and reduce the simulation time. The simulation results are good agreement with the experimental results. The proposed method is validly verified.


Archive | 2014

SRAM type FPGA single event upset effect simulation method

Zhu Ming; Zhang Lei; Luo Lei; Yu Qingkui; Sun Yi; Tang Min


Archive | 2013

Method for testing single event upset characteristics of partial triple modular redundancy static random access memory (SRAM) type field programmable gate arrays (FPGA)

Yu Qingkui; Luo Lei; Zhang Dayu; Liu Yinghui; Tang Min; Zhu Ming


Archive | 2013

DC/DC power supply converter single event effect detection system based on voltage adaptive technology

Li Pengwei; Luo Lei; Wang Wenyan; Yu Qingkui; Tang Min


Archive | 2013

Non-destructive power MOS tube single-event burnout effect detecting circuit and non-destructive power MOS tube single-event burnout effect detecting method

Wang Wenyan; Li Pengwei; Luo Lei; Yu Qingkui; Zhang Lei; Tang Min


Archive | 2013

Single event effect detection system and detection method of DC/DC (Direct Current/Direct Current) converter

Wang Wenyan; Li Pengwei; Luo Lei; Yu Qingkui; Zhang Lei; Tang Min


Archive | 2013

Single event upset characteristic testing method for partially triple modular redundancy reinforced SRAM (static random access memory) type FPGA (field programmable gate array)

Yu Qingkui; Luo Lei; Zhang Dayu; Liu Yinghui; Tang Min; Zhu Ming


Archive | 2016

Electron device back trompil attenuate device

Mei Bo; Wei Zhichao; Luo Lei; Yu Qingkui; Zhang Hongwei; Tang Min

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Zhu Ming

China Academy of Space Technology

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Sun Yi

China Academy of Space Technology

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Yu Qingkui

China Academy of Space Technology

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Zhu Hengjing

China Academy of Space Technology

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Zhang Wei

China Academy of Space Technology

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Zhang Yanwei

China Academy of Space Technology

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Gu Hantian

China Academy of Space Technology

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Hang He

China Academy of Space Technology

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Kang He

China Academy of Space Technology

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Liu Hui

China Academy of Space Technology

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