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international test conference | 1995

Capacitive leadframe testing

Ted Trenneth Turner

Reliable pin-level diagnosis of open solder joints allows manufacturers to tune SMT process for maximum output. Repair time and repair-induced damage are both significantly reduced with pin-level diagnostics. Detection of misoriented capacitors prevents expensive and reputation-damaging field failures. Ability to test both sides of PCBs allows maximum fault coverage.


Archive | 1993

Pay-per-use access to multiple electronic test capabilities

Amanda Leigh Constant; David Wightman Webb; Katherine Zalesky Withers-Miklos; Kay Courtney Lannen; Ted Trenneth Turner; Amos Hong-Kiat Leong


Archive | 1994

Pay-per-use access to multiple electronic test capabilities and tester resources

Amanda Leigh Constant; David Wightman Webb; Sharon Eisenstadt Latourrette; Jeffrey Claude Myers; Katherine Zalesky Withers-Miklos; Kay Courtney Lannen; Ted Trenneth Turner; Amos Hong-Kiat Leong


Archive | 1994

System und Verfahren zum Testen einer elektronischen Schaltung

Amanda Leigh Constant; David Wightman Webb; Sharon Eisenstadt Latourrette; Jeffrey Claude Myers; Katherine Zales Withers-Miklos; Kay Courtney Lannen; Ted Trenneth Turner; Amos Hong-Kiat Leong


Archive | 1994

Bezahlung-pro-Anwendung-Zugriff auf vielfache elektronische Testfähigkeiten und Testbetriebsmittel

Amanda Leigh Constant; David Wightman Webb; Sharon Eisenstadt Latourrette; Jeffrey Claude Myers; Katherine Zales Withers-Miklos; Kay Courtney Lannen; Ted Trenneth Turner; Amos Hong-Kiat Leong


Archive | 1995

Pay-per-use circuit board tester

Amanda Leigh Constant; David Wightman Webb; Sharon Eisenstadt Latourrette; Jeffrey Claude Myers; Katherine Zales Withers-Miklos; Kay Courtney Lannen; Ted Trenneth Turner; Amos Hong-Kiat Leong


Archive | 1994

Bezahlung-pro-Anwendung-Zugriff auf vielfache elektronische Testfähigkeiten und Testbetriebsmittel Pay-per-use access to multiple electronic test capabilities and test equipment

Amanda Leigh Constant; David Wightman Webb; Sharon Eisenstadt Latourrette; Jeffrey Claude Myers; Katherine Zales Withers-Miklos; Kay Courtney Lannen; Ted Trenneth Turner; Amos Hong-Kiat Leong


Archive | 1994

Benutzungstarif für vielfache elektronische Testmöglichkeiten

Amanda Leigh Constant; David Wightman Webb; Katherine Zalesky Withers-Miklos; Kay Courtney Lannen; Ted Trenneth Turner; Amos Hong-Kiat Leong


Archive | 1994

Circuit board test system

Amanda Leigh Constant; Leong Amos Hong-Kiat; Kay Courtney Lannen; Ted Trenneth Turner; David Wightman Webb; Katherine Zalesky Withers-Miklos; アマンダ・レイ・コンスタント; エイモス・ホン−キアット・レオン; カイ・コートニー・ラネン; キャサリン・ザレスキー・ウィザース−ミクロス; ディヴィッド・ワイトマン・ウェブ; テッド・トレネス・ターナー


Archive | 1994

System und Verfahren zum Testen einer elektronischen Schaltung System and method for testing an electronic circuit

Amanda Leigh Constant; David Wightman Webb; Sharon Eisenstadt Latourrette; Jeffrey Claude Myers; Katherine Zales Withers-Miklos; Kay Courtney Lannen; Ted Trenneth Turner; Amos Hong-Kiat Leong

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