Tevfik Onur Menteş

Spectromicroscopy of single and multilayer graphene supported by a weakly interacting substrate

We report measurements of the electronic structure and surface morphology of exfoliated graphene on an insulating substrate using angle-resolved photoemission and low-energy electron diffraction. Our results show that, although exfoliated graphene is microscopically corrugated, the valence band retains a massless fermionic dispersion with a Fermi velocity of

Current-induced vortex nucleation and annihilation in vortex domain walls

\ensuremath{\sim}{10}^{6}\text{ }\text{m}/\text{s}

Corrugation in Exfoliated Graphene: An Electron Microscopy and Diffraction Study

. We observe a close relationship between the morphology and electronic structure, which suggests that controlling the interaction between graphene and the supporting substrate is essential for graphene device applications.

Magnetism in nanometer-thick magnetite

We report observations of the effect of electrical currents on the propagation and spin structure of vortex walls in NiFe wires. We find that magnetic vortices are nucleated and annihilated due to the spin torque effect. The velocity is found to be directly correlated with these transformations and decreases with increasing number of vortices. The transformations are observed in wide elements, while in narrower structures the propagation of single vortex walls prevails.

Coexistence of multiple silicene phases in silicon grown on Ag(1 1 1)

Low-energy electron microscopy and microprobe diffraction are used to image and characterize corrugation in SiO(2)-supported and suspended exfoliated graphene at nanometer length scales. Diffraction line-shape analysis reveals quantitative differences in surface roughness on length scales below 20 nm which depend on film thickness and interaction with the substrate. Corrugation decreases with increasing film thickness, reflecting the increased stiffness of multilayer films. Specifically, single-layer graphene shows a markedly larger short-range roughness than multilayer graphene. Due to the absence of interactions with the substrate, suspended graphene displays a smoother morphology and texture than supported graphene. A specific feature of suspended single-layer films is the dependence of corrugation on both adsorbate load and temperature, which is manifested by variations in the diffraction line shape. The effects of both intrinsic and extrinsic corrugation factors are discussed.

Observation of Bloch-point domain walls in cylindrical magnetic nanowires

The oldest known magnetic material, magnetite, is of current interest for use in spintronics as a thin film. An open question is how thin can magnetite films be and still retain the robust ferrimagnetism required for many applications. We have grown 1-nm-thick magnetite crystals and characterized them in situ by electron and photoelectron microscopies including selected-area x-ray circular dichroism. Well-defined magnetic patterns are observed in individual nanocrystals up to at least 520 K, establishing the retention of ferrimagnetism in magnetite two unit cells thick.

Spin configurations in Co2FeAl0.4Si0.6 Heusler alloy thin film elements

Silicene, the silicon equivalent of graphene, is attracting increasing scientific and technological attention in view of the exploitation of its exotic electronic properties. This novel material has been theoretically predicted to exist as a free-standing layer in a low-buckled, stable form, and can be synthesized by the deposition of Si on appropriate crystalline substrates. By employing low-energy electron diffraction and microscopy, we have studied the growth of Si on Ag(1 1 1) and observed a rich variety of rotationally non-equivalent silicene structures. Our results highlight a very complex formation diagram, reflecting the coexistence of different and nearly degenerate silicene phases, whose relative abundance can be controlled by varying the Si coverage and growth temperature. At variance with other studies, we find that the formation of single-phase silicene monolayers cannot be achieved on Ag(1 1 1).

Image blur and energy broadening effects in XPEEM

Topological protection is an elegant way of warranting the integrity of quantum and nanosized systems. In magnetism one example is the Bloch-point, a peculiar object implying the local vanishing of magnetization within a ferromagnet. Its existence had been postulated and described theoretically since several decades, however it has never been observed. We con rm experimentally the existence of Bloch points, imaged within domain walls in cylindrical magnetic nanowires, combining surface and transmission XMCD-PEEM magnetic microscopy. This opens the way to the experimental search for peculiar phenomena predicted during the motion of Bloch-point-based domain walls.

Making angle-resolved photoemission measurements on corrugated monolayer crystals: Suspended exfoliated single-crystal graphene

We determine experimentally the spin structure of half-metallic Co2FeAl0.4Si0.6 Heusler alloy elements using magnetic microscopy. Following magnetic saturation, the dominant magnetic states consist of quasi-uniform configurations, where a strong influence from the magnetocrystalline anisotropy is visible. Heating experiments show the stability of the spin configuration of domain walls in confined geometries up to 800 K. The switching temperature for the transition from transverse to vortex walls in ring elements is found to increase with ring width, an effect attributed to structural changes and consequent changes in magnetic anisotropy, which start to occur in the narrower elements at lower temperatures.

Tuning the electronic structure of monolayer graphene/ Mo S 2 van der Waals heterostructures via interlayer twist

We report image blurring and energy broadening effects in energy-filtered XPEEM when illuminating the specimen with soft X-rays at high flux densities. With a flux of 2 × 10(13)photons/s, the lateral resolution in XPEEM imaging with either core level or secondary electrons is degraded to more than 50 nm. Fermi level broadening up to several hundred meV and spectral shift to higher kinetic energies are also systematically observed. Simple considerations suggest that these artifacts result from Boersch and Loeffler effects, and that the electron-electron interactions are strongest in the initial part of the microscope optical path. Implications for aberration corrected instruments are discussed.