Thomas Hänsel
Leibniz Association
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Publication
Featured researches published by Thomas Hänsel.
Proceedings of SPIE | 2005
Frank Siewert; Heiner Lammert; T. Noll; Thomas Schlegel; Thomas Zeschke; Thomas Hänsel; Andreas Nickel; Axel Schindler; Bernd Grubert; Carsten Schlewitt
The performance of x-ray beamlines at 3rd generation synchrotron radiation sources and Free Electron Lasers (FELs) is limited by the quality of the state of the art optical elements. Proposed FEL beamlines require optical components which are of better quality than is available from the optical manufacturing technology of today. As a result of a joint research project (Nanometer Optik Komponenten - NOK) coordinated by BESSY, involving both metrologists and manufacturers it is possible now to manufacture optical components beyond the former limit of 0.1 arcsec rms slope error [1, 2]. To achieve the surface finishing of optical components with a slope error in the range of 0.04 arcsec rms (for flat or spherical surfaces up to 300 mm in length) by polishing and finally by ion beam figuring technology it is essential that the optical surface be mapped and the mapping data used as input for the multiple ion beam figuring stages. Metrology tools of at least five times superior accuracy to that required of the component have been developed in the course of the project. The Nanometer Optical Component measuring Machine (NOM) was developed at BESSY for line and area measurements of the figure of optical components used at grazing incidence in synchrotron radiation beamlines. Surfaces up to 730 cm2 have been measured with the NOM a measuring uncertainty in the range of 0.01 arcsec rms and a correspondingly high reproducibility [3]. Three dimensional measurements were used to correct polishing errors some nanometers high and only millimeters in lateral size by ion beam treatment. The design of the NOM, measurement results and results of NOM supported surface finishing by ion beam figuring will be discussed in detail. The improvement of beamline performance by the use of such high quality optical elements is demonstrated.
Frontiers in Optics 2004/Laser Science XXII/Diffractive Optics and Micro-Optics/Optical Fabrication and Testing (2004), paper OMD5 | 2004
Thomas Hänsel; Andreas Nickel; Axel Schindler; Hans-Jürgen Thomas
Deterministic surface finishing using small-spot ion-beam figuring combined with stitching interferometry surface shape measurements for the enhanced lateral resolution have been developed to achieve 20marcsec slope-error on a 100mm flat Si synchrotron beam line optic.
Frontiers in Optics 2004/Laser Science XXII/Diffractive Optics and Micro-Optics/Optical Fabrication and Testing (2004), paper OMD3 | 2004
Axel Schindler; Thomas Hänsel; Frank Frost; Andreas Nickel; Renate Fechner; B. Rauschenbach
The talk gives an overview on latest results on ion-beam technology development for optics fabrication: RIBE proportional transfer of 3-D micro- and nanostructures, smoothing down to the 0.1nm rms range and figuring below 0.5nm rms.
Vakuum in Forschung Und Praxis | 2007
Thomas Hänsel; F. Frost; A. Nickel; T. Schindler
Optical Fabrication and Testing (2002), paper OTuB5 | 2002
Axel Schindler; Thomas Hänsel; Frank Frost; Renate Fechner; Andreas Nickel; Hans-Jürgen Thomas; Horst Neumann; Dietmar Hirsch
Archive | 2008
Thomas Hänsel; Peter Dipl.-Phys. Dr.rer.nat. Seidel; Andreas Nickel; Istvan Dipl.-Ing. Bucsi
Frontiers in Optics 2008/Laser Science XXIV/Plasmonics and Metamaterials/Optical Fabrication and Testing (2008), paper OThC7 | 2008
Thomas Franz; Thomas Hänsel
Archive | 2003
Jochen Alkemper; Lutz Aschke; Renate Fechner; Frost Frost; Thomas Hänsel; Axel Schindler; Markus Schweizer
Archive | 2003
Jochen Alkemper; Lutz Aschke; Renate Fechner; Frank Frost; Thomas Hänsel; Axel Schindler; Markus Schweizer
Archive | 2008
Frank Siewert; Heiner Lammert; Thomas Zeschke; Thomas Hänsel; Andreas Nickel; Axel Schindler