Thomas P. A. Hase
University of Warwick
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Featured researches published by Thomas P. A. Hase.
Applied Physics Letters | 2001
Thomas P. A. Hase; B. D. Fulthorpe; S.B Wilkins; B. K. Tanner; C. H. Marrows; B. J. Hickey
We present evidence from soft x-ray resonant magnetic scattering measurements at the Mn L3 edge for the existence of a small magnetic moment on the antiferromagnetic IrMn pinning layer in a NiFe/Cu/Co/IrMn spin valve structure. The variation of the signal in an applied magnetic field shows that the moment lies antiparallel to the Co moment. Changes in the Mn L3 edge signal as the Co moment is rotated into the hard direction are rapid and do not appear to be associated with thermal reordering of the antiferromagnetic domain structure.
Physica B-condensed Matter | 1998
I. Pape; Thomas P. A. Hase; B. K. Tanner; M. Wormington
Abstract Grazing incidence diffuse X-ray scattering data from a Co–Cu multilayer with stepped interfaces grown by molecular beam epitaxy on a copper silicide buffer on a silicon substrate has been analysed using a computer code based on a fractal interface within the distorted wave Born approximation. We have extended the theory to include the scattering from a stepped interface and have shown that a single set of structural parameters can be used to obtain an excellent agreement between simulation and experimental data taken under very different X-ray optical conditions. The symmetry of the diffuse scatter on rotation about the surface normal can be explained if it arises from step bunching at the ends of extensive flat terraces. These steps have a self-affine nature, enabling the fractal model to be used successfully.
Applied Physics Letters | 2002
J. D. R. Buchanan; Thomas P. A. Hase; B. K. Tanner; N. D. Hughes; R. J. Hicken
The barrier thickness in magnetic spin-dependent tunnel junctions with Al2O3 barriers has been measured using grazing incidence x-ray reflectivity and by fitting the tunneling current to the Simmons model. We have studied the effect of glow discharge oxidation time on the barrier structure, revealing a substantial increase in Al2O3 thickness with oxidation. The greater thickness of barrier measured using grazing incidence x-ray reflectivity compared with that obtained by fitting current density–voltage to the Simmons electron tunneling model suggests that electron tunneling is localized to specific regions across the barrier, where the thickness is reduced by fluctuations due to nonconformal roughness.
Journal of Physics: Condensed Matter | 2005
A S H Rozatian; C. H. Marrows; Thomas P. A. Hase; B. K. Tanner
The relationship between the interface structure and perpendicular anisotropy in sputtered Co/Pd multilayers has been investigated using grazing incidence x-ray scattering and vibrating sample magnetometry. Using fits to a self-affine fractal model of the interfaces, the variation in in-plane correlation length, fractal parameter and conformality has been determined as a function of the number of repeats in the Co/Pd bilayers. As the number of interfaces rises, the roughness becomes predominantly non-conformal and the in-plane length scale associated with the roughness increases as a power law with multilayer thickness. It is suggested that the loss of conformality, characterized by a relatively short out-of-plane correlation length, may be the cause of the reduction in anisotropy energy per interface observed for high numbers of bilayer repeats. There is a weak association between fractal parameter and interface anisotropy; a reduction in the fractal dimension of the interface appears to result in a higher surface anisotropy.
Review of Scientific Instruments | 2010
T. A. W. Beale; Thomas P. A. Hase; Takamichi Iida; K. Endo; P. Steadman; A. R. Marshall; S. S. Dhesi; G. van der Laan; P. D. Hatton
We report the design and construction of a novel soft x-ray diffractometer installed at Diamond Light Source. The beamline endstation RASOR is constructed for general users and designed primarily for the study of single crystal diffraction and thin film reflectivity. The instrument is comprised of a limited three circle (theta, 2theta, and chi) diffractometer with an additional removable rotation (phi) stage. It is equipped with a liquid helium cryostat, and post-scatter polarization analysis. Motorized motions are provided for the precise positioning of the sample onto the diffractometer center of rotation, and for positioning the center of rotation onto the x-ray beam. The functions of the instrument have been tested at Diamond Light Source, and initial test measurements are provided, demonstrating the potential of the instrument.
Applied Physics Letters | 2014
Jennifer King; Arnab Ganguly; David M. Burn; S. Pal; E. A. Sallabank; Thomas P. A. Hase; A. T. Hindmarch; Anjan Barman; D. Atkinson
The influence of interfacial intermixing on the picosecond magnetization dynamics of ferromagnetic/non-magnetic thin-film bilayers was studied. Low-dose focused-ion-beam irradiation was used to induce intermixing across the interface between a 10 nm Ni 81Fe19 layer and a 2–3 nm capping layer of either Au or Cr. Time-resolved magneto-optical Kerr effect was used to study magnetization dynamics as a function of ion-beam dose. With an Au cap, the damping of the un-irradiated bilayer was comparable with native Ni 81Fe19 and increased with increasing ion dose. In contrast, for Ni 81Fe19/Cr the damping was higher than that for native Ni 81Fe19, but the damping decreased with increasing dose.
Journal of Applied Physics | 2004
X. S. Wu; H. L. Cai; Jianbin Xu; W.S. Tan; A. Hu; S. S. Jiang; Thomas P. A. Hase; B. K. Tanner; G. Xiong
La0.67Ca0.33MnO3 (LCMO) thin films with the thickness varying from 200 to 500 A have been deposited by magnetron sputtering on sapphire, SrTiO3, yttrium-stabilized ZrO2 substrates. A metal-to-insulator transition behavior was observed for all samples with the transition temperature and width varying with the substrate and the film thickness. A percolation model has been used to obtain the physical parameters on low-temperature metallic transport behavior and the adiabatic thermal small polaron hopping progress. The surface of the deposited films was measured by atomic force microscopy and grazing incidence x-ray specular and diffuse scattering. Fits to the data show the presence of a mixed layer between the substrate and the LCMO films the extent of which depends on the substrate used.
Applied Physics Letters | 2013
Fridrik Magnus; Reda Moubah; Arne Roos; A. Kruk; Vassilios Kapaklis; Thomas P. A. Hase; Björgvin Hjörvarsson; Gabriella Andersson
SmCo thin films have been grown by magnetron sputtering at room temperature with a composition of 2–35 at. % Sm. Films with 5 at. % or higher Sm are amorphous and smooth. A giant tunable uniaxial in-plane magnetic anisotropy is induced in the films which peaks in the composition range 11–22 at. % Sm. This cross-over behavior is not due to changes in the atomic moments but rather the local configuration changes. The excellent layer perfection combined with highly tunable magnetic properties make these films important for spintronics applications.
Philosophical Magazine | 2004
B. K. Tanner; Houzheng Wu; S.G. Roberts; Thomas P. A. Hase
The subsurface plastic deformation below alumina (Al2O3) and Al2O3–silicon carbide (SiC) nanocomposite surfaces subjected to grinding, polishing and annealing has been measured by high-resolution grazing-incidence parallel-beam X-ray powder diffraction and transmission electron microscopy. The variation with angle in the full width at half-height maximum (FWHM) of the X-ray Bragg peaks was successfully modelled by a FWHM distribution that fell exponentially with increasing depth. Consistent parameters were extracted from data taken using both prism and pyramidal reflecting planes. Correlation was found between the depth at which the FWHM fell to 1/e of the surface value and the depth of damage observed by transmission electron microscopy. The associated surface strain in the nanocomposite was found to increase linearly with increasing diameter of the diamond polishing particles. In ground 5 vol.% SiC nanocomposite, these random surface strains fell by a factor of 7 and the depth of damage increased by a factor of 3 after annealing at 1250°C for 2 h. No differences were observed in the Bragg peak FWHM as a function of angle for material polished with 1 µm diamond grit before and after annealing.
Journal of Applied Physics | 2003
J D. Buchanan; Thomas P. A. Hase; B. K. Tanner; P. J. Chen; L Gan; Cedric J. Powell; William F. Egelhoff
Grazing incidence x-ray scattering has been used to study interfacial intermixing in thin films of aluminum/transition metal bilayers grown by dc magnetron sputter deposition at room temperature. As with all transition metals, the ferromagnets Fe, Co and Ni have dramatically different interface widths between X/Al and Al/X (X=Fe,Co,Ni). Intermixing lengths are larger for X on Al than for Al on X.