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Featured researches published by Tiecheng Li.


International Conference on Optical Instruments and Technology 2017: Optoelectronic Measurement Technology and System | 2018

Research on the measurement of the ultraviolet irradiance in the xenon lamp aging test chamber

Tiecheng Li; Fangsheng Lin; Dejin Yin; Muyao Ji; Weihai Cheng; Biyong Huang; Lei Lai; Ming Xia; Jigui Zhu; Kexin Xu; Liquan Dong; Hwa-Yaw Tam; Hai Xiao

This paper briefly introduces the methods of calibrating the irradiance in the Xenon lamp aging test chamber. And the irradiance under ultraviolet region is mainly researched. Three different detectors whose response wave range are respectively UVA (320~400nm), UVB (275~330nm) and UVA+B (280~400nm) are used in the experiment. Through comparing the measuring results with different detectors under the same xenon lamp source, we discuss the difference between UVA, UVB and UVA+B on the basis of the spectrum of the xenon lamp and the response curve of the detectors. We also point out the possible error source, when use these detectors to calibrate the chamber.


International Conference on Optical Instruments and Technology 2017: Optoelectronic Measurement Technology and System | 2018

The measurement of luminous flux for single LEDs

Tiecheng Li; Jiangang Zhu; Muyao Ji; Fangsheng Lin; Biyong Huang; Ming Xia; Lei Lai; Leibing Shi; Jigui Zhu; Kexin Xu; Liquan Dong; Hwa-Yaw Tam; Hai Xiao

The total luminous flux is one of the most important characteristics of a LED. According to the CIE standard, the luminous flux for LEDs can be measured by an integrating sphere equipped with a spectroradiometer. The luminous flux of LEDs has been measured in the 4π geometry, which is suitable for LEDs with different luminous intensity distributions. The results between NIM and SIMT validate our calibration ability. The experiments indicate that the standard LEDs and the measurement repeatability play important roles in the uncertainty analysis.


AOPC 2017: Optoelectronics and Micro/Nano-Optics | 2017

Research on the calibration methods of the luminance parameter of radiation luminance meters

Weihai Cheng; Muyao Ji; Biyong Huang; Fangsheng Lin; Tiecheng Li; Dejin Yin; Lei Lai

This paper introduces standard diffusion reflection white plate method and integrating sphere standard luminance source method to calibrate the luminance parameter. The paper compares the effects of calibration results by using these two methods through principle analysis and experimental verification. After using two methods to calibrate the same radiation luminance meter, the data obtained verifies the testing results of the two methods are both reliable. The results show that the display value using standard white plate method has fewer errors and better reproducibility. However, standard luminance source method is more convenient and suitable for on-site calibration. Moreover, standard luminance source method has wider range and can test the linear performance of the instruments.


AOPC 2017: Optoelectronics and Micro/Nano-Optics | 2017

The calibration of specular gloss meters and gloss plates

Tiecheng Li; Lei Lai; Dejin Yin; Muyao Ji; Fangsheng Lin; Leibing Shi; Ming Xia; Yi Fu

Specular gloss is the perception by an observer of the mirror-like appearance of a surface. Specular gloss is usually measured by a glossmeter, which can be calibrated by a group of gloss plates according to JJG 696-2015. The characteristics of a gloss meter include stability, zero error, and error of indication. The characteristics of a gloss plate include roughness and spectral transmissivity of a high gloss plate, spectral reflectivity of a ceramic gloss plate. The experiment results indicate that calibration of both gloss meters and gloss plates should be carefully performed according to the latest verification regulation in order to reduce the measurement error.


International Symposium on Optoelectronic Technology and Application 2016 | 2016

Research on the calibration of ultraviolet energy meters

Fangsheng Lin; Dejin Yin; Tiecheng Li; Lei Lai; Ming Xia

Ultraviolet (UV) radiation is a kind of non-lighting radiation with the wavelength range from 100nm to 400nm. Ultraviolet irradiance meters are now widely used in many areas. However, as the development of science and technology, especially in the field of light-curing industry, there are more and more UV energy meters or UV-integrators need to be measured. Because the structure, wavelength band and measured power intensity of UV energy meters are different from traditional UV irradiance meters, it is important for us to take research on the calibration. With reference to JJG879-2002, we SIMT have independently developed the UV energy calibration device and the standard of operation and experimental methods for UV energy calibration in detail. In the calibration process of UV energy meter, many influencing factors will affect the final results, including different UVA-band UV light sources, different spectral response for different brands of UV energy meters, instability and no uniformity of UV light source and temperature. Therefore we need to take all of these factors into consideration to improve accuracy in UV energy calibration.


International Symposium on Optoelectronic Technology and Application 2016 | 2016

Study of laser energy standard and establishment of calibration device

Ming Xia; Jianqiang Gao; Junwen Xia; Dejin Yin; Tiecheng Li; Dong Zhang

This paper studied the standard laser energy meter. A self calibration of the thermoelectric type standard laser energy meter is developed, which is provided with a suitable electric heater. It can be used to simulate and replace the equivalent thermal effect, and to realize the absolute measurement of the laser energy. Because the standard laser energy meter can bulk absorb laser radiation, it can bear higher laser energy density. The material absorption spectrum of the standard laser energy meter is relatively flat from the ultraviolet to the infrared, so it can be used for the measurement of laser energy at any wavelength. In addition, an electric calibration instrument is developed. The electric calibration instrument can be directly displayed or synchronous display by the digital frequency meter. The laser energy calibration device is composed of standard laser energy meter, pulsed laser source, monitoring system, digital multi meter and complete set of electric calibration system. Laser energy calibration device uses split beam detection method. The laser is divided into two beams by means of a wedge shaped optical beam splitter. A laser energy meter is used to monitor the change of the reflected light to reduce the influence of the output laser energy stability of the pulsed laser source, thereby improving the uncertainty of the calibration result. The sensitivity, correction factor and indication error of the laser energy meter can be calibrated by using the standard laser energy meter and the under calibrated laser energy meter to measure the transmission laser beam.


International Symposium on Optoelectronic Technology and Application 2016 | 2016

Accuracy of a reference instrument for specular gloss measurements

Tiecheng Li; Lei Lai; Leibing Shi; Dejin Yin; Fangsheng Lin; Ming Xia; Weihai Cheng

Specular gloss is the perception by an observer of the mirror-like appearance of a surface. The measurement of specular gloss consists of comparing the luminous flux reflected from an object to that reflected from a gloss reference standard. The accuracy of specular gloss measurements depends not only on the characteristics of the instrument but also on the properties of the gloss reference standard. Experiments have been performed to analyze the possible sources of error such as gloss reference standard variation, photodetector linearity and measurement repeatability, which are three most important components of uncertainty. The results indicate that the instrument should be carefully examined before the specular gloss measurement in order to acquire a satisfied result.


8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment | 2016

Development of high power UV irradiance meter calibration device

Ming Xia; Jianqiang Gao; Dejin Yin; Tiecheng Li

With the rapid development of Chinas economy, many industries have more requirements for UV light applications, such as machinery manufacturing, aircraft manufacturing using high power UV light for detection, IT industry using high power UV light for curing component assembly, building materials, ink, paint and other industries using high power UV light for material aging test etc. In these industries, there are many measuring instruments for high power UV irradiance which are need to traceability. But these instruments are mostly imported instruments, these imported UV radiation meter are large range, wide wavelength range and high accuracy. They have exceeded our existing calibration capability. Expand the measuring range and improve the measurement accuracy of UV irradiance calibration device is a pressing matter of the moment. The newly developed high power UV irradiance calibration device is mainly composed of high power UV light, UV filter, condenser, UV light guide, optical alignment system, standard cavity absolute radiometer. The calibration device is using optical alignment system to form uniform light radiation field. The standard is standard cavity absolute radiometer, which can through the electrical substitution method, by means of adjusting and measuring the applied DC electric power at the receiver on a heating wire, which is equivalent to the thermo-electromotive force generated by the light radiation power, to achieve absolute optical radiation measurement. This method is the commonly used effective method for accurate measurement of light irradiation. The measuring range of calibration device is (0.2~200) mW/cm2, and the uncertainty of measurement results can reached 2.5% (k=2).


8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment | 2016

Specular gloss scales comparison between the SIMT and the NIST

Dejin Yin; Tiecheng Li; Biyong Huang; Weihai Cheng; Fangsheng Lin

Specular gloss is the fraction of light reflected in the specular direction for specified incident and receptor apertures, it is the perception by an observer of the mirror-like appearance of a surface. The measurement of specular gloss consists of comparing the luminous reflectance from a test sample to that from a calibrated gloss standard which generally is a polished piece of black glass, under the same experimental conditions. Gloss is a dimensionless quantity whose accurate determination requires standardized experimental conditions such as spectral distribution of the incident beam of light, incident and viewing angles, and a gloss standard. The Shanghai Institute of Measurement and Testing Technology (SIMT) provides test service to calibrate gloss reference standards. This facility is built around a reference goniophotometer, containing an instrument that measures flux as a function of angles of illumination or observation and a primary gloss standard, which is a piece of three wedges of highly polished, high-quality optical glass. The system has an overall (k=2) uncertainty of 0.5 Gloss Unit(GU). The service offers calibration measurements of working gloss standards at the geometries of 20°, 60°, and 85°, in compliance with the ISO 2813 and the ASTM D523 documentary standards. This article describes a bilateral comparison of specular gloss scales between SIMT and the National Institute of Standards and Technology (NIST) that has been performed. The results of this comparison show agreement within the combined uncertainties for the measurement of specular gloss of highly polished black glass.


8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment | 2016

Influencing factors and error analysis for specular gloss measurement

Tiecheng Li; Leibing Shi; Lei Lai; Fangsheng Lin; Dejin Yin; Ming Xia; Limin Wu

Specular gloss has been widely used to characterize the ability of a surface to reflect light specularly. Specular gloss is theoretically related to the physical properties of a surface, such as roughness, directionality and uniformity. Specular gloss, mainly determined by incident angle and refractive index of a surface, is a relative measurement quantity. Specular gloss is usually measured by a glossmeter. The topographical and optical properties of a surface have been analyzed on how to affect the measurements. The experiment results indicate that a less rough/flatter, more isotropic and more uniform surface will result in a more accurate measurement value. Therefore, physical properties of a surface must be carefully inspected before the specular gloss measurement in order to acquire a satisfied result.

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