Tine De Ridder
Ghent University
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Publication
Featured researches published by Tine De Ridder.
optical fiber communication conference | 2010
C. Melange; Xin Yin; Bart Baekelandt; Tine De Ridder; Xing-Zhi Qiu; Johan Bauwelinck; Jan Gillis; Pieter Demuytere; Jan Vandewege
This paper presents a chain of four fully DC-coupled 10Gb/s burst-mode prototypes operating with 58ns overhead for the first time. 10Gb/s upstream burst-mode experiments are performed without a time-critical reset signal from test equipment.
optical fiber communication conference | 2009
Peter Ossieur; Tine De Ridder; Johan Bauwelinck; C. Melange; Bart Baekelandt; Xing-Zhi Qiu; Jan Vandewege; Giuseppe Talli; Cleitus Antony; Paul D. Townsend; C. Ford
We present a 10 Gb/s burst-mode receiver featuring automatic reset generation. The measured sensitivity is -12.5 dBm at a loud/soft ratio of 11.5 dB with a guard time of 25.6 ns and a short preamble of 23.8 ns.
Journal of Lightwave Technology | 2006
Peter Ossieur; Tine De Ridder; Xing-Zhi Qiu; Jan Vandewege
This paper presents the influence of random direct current (dc) offsets on the sensitivity of dc-coupled burst-mode receivers (BMRxs). It is well known that a BMRx exhibits a noisy decision threshold, resulting in a sensitivity penalty. If the BMRx is dc coupled, an additional penalty is incurred by random dc offsets. This penalty can only be determined for a statistically significant number of fabricated BMRx samples. Using Monte Carlo (MC) simulations and a detailed BMRx model, the relationship between the variance of this random dc offset, the resulting sensitivity penalty, and BMRx yield (the fraction of fabricated BMRx samples that meets a given sensitivity specification) is evaluated as a function of various receiver parameters. The obtained curves can be used to trade off BMRx die area against sensitivity for a given yield. It is demonstrated that a thorough understanding of the relationship between BMRx sensitivity, BMRx yield, and the variance of the random dc offsets is needed to optimize a dc-coupled BMRx with respect to sensitivity and die area for a given yield. It is shown that compensation of dc offsets with a resolution of 8 bits results in a sensitivity penalty of 1 dB for a wide range of random dc offsets
IEICE Transactions on Electronics | 2008
Xin Yin; Peter Ossieur; Tine De Ridder; Johan Bauwelinck; Xing-Zhi Qiu; Jan Vandewege
A current-mode squarer/divider circuit with a novel translinear cell is presented for automotive applications. The proposed circuit technique increases the accuracy of the squarer/divider function with better input dynamic range and temperature insensitivity. Simulation results show that the variation of the output current is within ±0.2% over the temperature range from -40°C to 140°C.
Archive | 2008
Peter Ossieur; Tine De Ridder; Johan Bauwelinck; Xing-Zhi Qiu; Jan Vandewege
Aeu-international Journal of Electronics and Communications | 2009
Peter Ossieur; Johan Bauwelinck; Xin Yin; C. Melange; Bart Baekelandt; Tine De Ridder; Xing-Zhi Qiu; Jan Vandewege
Proceedings of BroadBand Europe Conference | 2006
Russell Davey; Tine De Ridder; Xing-Zhi Qiu; Peter Ossieur; H Krimmel; David W. Smith; L Lealman; A. Poustie; Giuseppe Talli; Chi-Wai Chow; Paul D. Townsend; Sebastian Randel; Harald Rohde
international solid-state circuits conference | 2008
Tine De Ridder; Peter Ossieur; Bart Baekelandt; C. Melange; Johan Bauwelinck; C. Ford; Xing-Zhi Qiu; Jan Vandewege
lasers and electro optics society meeting | 2005
Tine De Ridder; Xin Yin; Peter Ossieur; Xing-Zhi Qiu; Jan Vandewege; O Chasles; A Devos; P De Pauw
IEICE Transactions on Electronics | 2009
Xin Yin; Johan Bauwelinck; Tine De Ridder; Peter Ossieur; Xing-Zhi Qiu; Jan Vandewege; O Chasles; A Devos; Piet De Pauw