Tobias H. Sienel
Carrier Corporation
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Featured researches published by Tobias H. Sienel.
IEEE Transactions on Reliability | 2006
Payman Sadegh; Adrian Thompson; Xiaodong Luo; Young T. Park; Tobias H. Sienel
This paper summarizes a methodology for reliability prediction of new products where field data are sparse, and the allowed number & length of experiments are limited. The methodology relies on estimating a set where the unknown parameters are most likely to be found, calculation of an upper bound for the reliability metric of interest conditioned that the parameters reside in the estimated set, and tightening the bounds via design of experiments. Models of failure propagation, failure acceleration, system operations, and time/cycle to failure at various levels of fidelity & expert elicited information may be incorporated to enhance the accuracy of the predictions. The application of the model is illustrated through numerical studies.
Archive | 2002
Tobias H. Sienel
Archive | 2002
Tobias H. Sienel
Archive | 1998
Frank R. Biancardi; D. J. McFarlin; Raymond L. DeBlois; Tobias H. Sienel
Archive | 2002
Sivakumar Gopalnarayanan; Tobias H. Sienel; Lili Zhang
Archive | 2005
Tobias H. Sienel
Archive | 2005
Tobias H. Sienel; Yu Chen; Bryan A. Eisenhower; Julio Concha; Young K. Park; Lili Zhang; Jeffrey J. Nieter; Nicholas Pondicq-Cassou
Archive | 2004
Tobias H. Sienel
Archive | 2003
Tobias H. Sienel
Archive | 2003
Sivakumar Gopalnarayanan; Yu Chen; Tobias H. Sienel; Lili Zhang