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Dive into the research topics where Tomohiro Morishita is active.

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Featured researches published by Tomohiro Morishita.


IEEE Sensors Journal | 2007

High-Sensitivity Temperature Measurement With Miniaturized InSb Mid-IR Sensor

Edson Gomes Camargo; Koichiro Ueno; Tomohiro Morishita; Masayuki Sato; Hidetoshi Endo; Masaaki Kurihara; Kazutoshi Ishibashi; Naohiro Kuze

This paper reports the development and evaluation of an InSb photovoltaic infrared sensor (InSb PVS) operating at room temperature. The InSb PVS consists of 700 InSb p<sup>+</sup> - p<sup>-</sup> - n<sup>+</sup> photodiodes connected in series, on a semi-insulating GaAs (100) substrate. An Al<sub>0.17</sub>rIn<sub>0.83</sub>Sb barrier layer between p<sup>+</sup> and p<sup>-</sup> layers was used to reduce diffusion of photo-excited electrons. Cutoff wavelength was 6.8 mum and output signal was almost linear with irradiance up to 0.6 mW/cm<sup>2</sup>. Sensitivity of 67 muV/K and noise equivalent temperature difference of 2.2 mK/Hz<sup>1/2</sup> was obtained at room temperature, which shows the sensor to be a suitable for noncontact thermometry.


Japanese Journal of Applied Physics | 1999

Direct Measurements of Femtosecond Energy Dissipation Processes of Hot Electrons in a Gold Film

Akihide Hibara; Tomohiro Morishita; Isao Tsuyumoto; Akira Harata; Takehiko Kitamori; Tsuguo Sawada

Energy dissipation processes of hot electrons in a gold thin film were measured by a femtosecond time-resolved transient reflecting grating method. The processes were analyzed using the two-temperature model and the theory of the transient grating method. It was found that the electron-phonon coupling and thermal diffusion processes could be investigated independently. Temperature dependence of the electron-phonon coupling factor and the thermal conductivity was investigated quantitatively. The results suggested that the nonthermal states of hot electrons still contribute to the dissipation processes on time scales of several picoseconds.


Japanese Journal of Applied Physics | 2008

Performance Improvement of Molecular Beam Epitaxy Grown InSb Photodiodes for Room Temperature Operation

Edson Gomes Camargo; Koichiro Ueno; Tomohiro Morishita; Hiromasa Goto; Naohiro Kuze; Kazuaki Sawada; Makoto Ishida

In this paper, we report the optimization of the light absorber layer thickness of InSb p+–p-–n+ photodiodes grown by molecular beam epitaxy (MBE) on GaAs(001) substrates. An Al0.17In0.83Sb barrier layer between p+ and p- layers was used to reduce the diffusion of photoexcited electrons, allowing rectifying characteristics and high photovoltage response at room temperature. Photodiodes with a junction area of 90×90 µm2 and p--layer thicknesses varying from 0.5 to 3 µm were fabricated, demonstrating that photocurrent increased with p--layer thickness, which is in good agreement with theoretical calculations. However, the non biased differential resistance did not increase as expected, possibly owing to an increase in film defect density with increasing film thickness, which is considered to produce leakage paths through the light absorber layer. Despite the presence of defects on the grown films, photodiodes with a p--layer thickness of 3 µm showed a sixfold improvement in the signal-to-noise ratio when compared with that of 0.5 µm.


Journal of Luminescence | 1999

Ultrafast electron transport phenomena in highly excited gold films

Akihide Hibara; Tomohiro Morishita; Isao Tsuyumoto; Takehiko Kitamori; Tsuguo Sawada

Abstract Non-equilibrium dynamics of hot electrons in highly excited gold films has been investigated by using the femtosecond transient reflecting grating method. Transport processes which compete with electron–phonon coupling processes were investigated by observing thermal surface displacements. The results were compared with calculations by a simple thermoelastic equation and the two-temperature model with two different conditions for the thermal conductivity. The results suggested that non-thermal states of the hot electrons still contribute transport processes on time scales of several picoseconds.


ieee sensors | 2006

Miniaturized InSb Mid-JR Sensor for Room Temperature Operation

Edson Gomes Camargo; Koichiro Ueno; Tomohiro Morishita; Masayuki Sato; Hidetoshi Endo; Masaaki Kurihara; Kazutoshi Ishibashi; Naohiro Kuze

This paper reports the development and evaluation of an InSb photovoltaic infrared sensor (InSb PVS) operating at room temperature. The InSb PVS consists of 700 InSb p<sup>+</sup>-p<sup>-</sup>-n<sup>+</sup> photodiodes connected in series, on a semi-insulating GaAs (100) substrate. An Al<sub>0.17</sub>In<sub>0.83</sub>Sb barrier layer between p<sup>+</sup> and p<sup>-</sup> layers was used to reduce diffusion of photo-excited electrons. Cutoff wavelength was 6.8 mum and output signal was linear with incident irradiance. Noise equivalent temperature difference (NETD) of 2.2times10<sup>-3</sup> degC/Hz<sup>1/2</sup> was obtained at room temperature, which shows the sensor to be a promising device for human body detection or non-contact thermometry.


Journal of Physical Chemistry B | 1999

Ultrafast Charge Transfer at TiO2/SCN- (aq) Interfaces Investigated by Femtosecond Transient Reflecting Grating Method

Tomohiro Morishita; and Akihide Hibara; Tsuguo Sawada; Isao Tsuyumoto


Journal of Crystal Growth | 2007

High performance miniaturized InSb photovoltaic infrared sensors operating at room temperature

Naohiro Kuze; Edson Gomes Camargo; Koichiro Ueno; Tomohiro Morishita; M. Sato; M. Kurihara; H. Endo; K. Ishibashi


Analytical Sciences | 2000

Femtosecond Transient Reflecting Grating Methods and Analysis of the Ultrafast Carrier Dynamics on Si(111) Surfaces

Tomohiro Morishita; Akihide Hibara; Tsuguo Sawada; Isao Tsuyumoto; Akira Harata


Journal of Crystal Growth | 2011

Uncooled InSb mid-infrared LED used dislocation filtering of AlInSb layer

Koichiro Ueno; Edson Gomes Camargo; Tomohiro Morishita; Yoshitaka Moriyasu; Hiromasa Goto; Naohiro Kuze


Journal of Crystal Growth | 2009

Development of uncooled miniaturized InSb photovoltaic infrared sensors for temperature measurements

Naohiro Kuze; Tomohiro Morishita; Edson Gomes Camargo; Koichiro Ueno; A. Yokoyama; M. Sato; H. Endo; Y. Yanagita; Seiichi Tokuo; Hiromasa Goto

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Isao Tsuyumoto

Kanazawa Institute of Technology

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Akihide Hibara

Tokyo Institute of Technology

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