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Featured researches published by Tomoki Uemura.


Journal of Applied Physics | 1995

Raman scattering from anisotropic LO‐phonon–plasmon–coupled mode in n‐type 4H– and 6H–SiC

Hiroshi Harima; Shin-ichi Nakashima; Tomoki Uemura

LO‐phonon–plasmon–coupled modes in n‐type 4H– and 6H–SiC single crystals with free‐carrier concentrations of 1016–1018 cm−3 have been measured by Raman scattering at room temperature. The axial‐type mode for which plasma oscillation and atomic displacement are parallel to the c axis, and the planar‐type mode for which these oscillations lie in the c plane, have been individually observed. From a line‐shape analysis of the observed spectra, the plasmon frequency, carrier damping, and phonon damping have been deduced. These quantities have large differences between the axial‐ and planar‐type mode in 6H–SiC, indicating its large crystal anisotropy. On the contrary, 4H–SiC shows small anisotropy. The longitudinal and transverse effective mass components of the electron have been determined from the plasmon frequency using carrier densities derived from Hall measurements. The deduced values are m∥=1.4m0 and m⊥=0.35m0 for 6H–SiC, and m∥=0.48m0 and m⊥=0.30m0 for 4H–SiC. The carrier mobility obtained from the ana...


IEEE Transactions on Ultrasonics Ferroelectrics and Frequency Control | 2005

Effect of crystalline quality of diamond film to the propagation loss of surface acoustic wave devices

Satoshi Fujii; Shinichi Shikata; Tomoki Uemura; Hideaki Nakahata; Hiroshi Harima

Diamond films with various crystal qualities were grown by chemical vapor deposition on silicon wafers. Their crystallinity was characterized by Raman scattering and electron backscattering diffraction. By fabricating a device structure for surface acoustic wave (SAW) using these diamond films, the propagation loss was measured at 1.8 GHz arid compared with the crystallinity. It was found that the propagation loss was lowered in relatively degraded films having small crystallites, a narrow distribution in the diamond crystallite size, and preferential grain orientation. This experiment clarifies diamond film characteristics required for high-frequency applications in SAW filters.


Archive | 2001

Method for separating chips from diamond wafer

Satoshi Fujii; Noboru Gotou; Tomoki Uemura; Toshiaki Saka; Katsuhiro Itakura


Archive | 2002

Diamond substrate for surface acoustic wave device, and surface acoustic wave device

Keiji Ishibashi; Takahiro Imai; Tomoki Uemura; Daichi Kawaguchi; Hideaki Nakahata; Satoshi Fujii


Archive | 2006

METHOD FOR PRODUCTION OF GaxIn1-xN (0 x 1) CRYSTAL, GaxIn1-xN (0 x 1) CRYSTAL SUBSTRATE, METHOD FOR PRODUCTION OF GaN CRYSTAL, GaN CRYSTAL SUBSTRATE AND PRODUCT

Tomoki Uemura; Shinsuke Fujiwara; Takuji Okahisa; Ryu Hirota; Hideaki Nakahata


Archive | 2009

Semiconductor crystal growing method, semiconductor crystal substrate fabrication method, and semiconductor crystal substrate

Takuji Okahisa; Tomohiro Kawase; Tomoki Uemura; Muneyuki Nishioka; Satoshi Arakawa


Archive | 2009

窒化ガリウム基板、窒化ガリウム基板の製造方法、及び半導体デバイス

Tomoki Uemura; 智喜 上村; Keiji Ishibashi; 石橋 恵二; Fumitake Nakanishi; 中西 文毅


Archive | 2008

Iii族窒化物単結晶インゴット、iii族窒化物単結晶基板、iii族窒化物単結晶インゴットの製造方法、及びiii族窒化物単結晶基板の製造方法

Takuji Okahisa; Seiji Nakahata; Tomoki Uemura


Archive | 2006

SUBSTRAT CRISTALLIN À L’AlxGayIn1-x-yN, DISPOSITIF SEMI-CONDUCTEUR ET SON PROCÉDÉ DE FABRICATION

Shinsuke Fujiwara; Tomoki Uemura; Takuji Okahisa; Koji Uematsu; Manabu Okui; Muneyuki Nishioka; Shin Hashimoto


Archive | 2006

GaxIn1-xN(0≦x≦1)結晶の製造方法、GaxIn1-xN(0≦x≦1)結晶基板、GaN結晶の製造方法、GaN結晶基板および製品

Tomoki Uemura; Shinsuke Fujiwara; Takuji Okahisa; Ryu Hirota; Hideaki Nakahata

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Hideaki Nakahata

Sumitomo Electric Industries

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Takuji Okahisa

Sumitomo Electric Industries

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Keiji Ishibashi

Sumitomo Electric Industries

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Muneyuki Nishioka

Sumitomo Electric Industries

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Koji Uematsu

Sumitomo Electric Industries

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Manabu Okui

Sumitomo Electric Industries

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Ryu Hirota

Sumitomo Electric Industries

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