Tomoyuki Nakamura
Murata Manufacturing
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Publication
Featured researches published by Tomoyuki Nakamura.
IOP Conference Series: Materials Science and Engineering | 2011
Tomoyuki Nakamura; Takayuki Yao; Jun Ikeda; Noriyuki Kubodera; Hiroshi Takagi
To achieve enough reliability of monolithic ceramic capacitor, it is important to know the contribution of grain boundary and grain interior to its reliability and insulation resistance. As the number of grain boundaries per layer increased, mean time to failure (MTTF) increased. In addition, as the number of grain boundaries per layer increased, samples showed lower current leakage in the measured electric field range. Using these data, the grain boundary E-J curves were determined by simulation. As a result, temperature and electric field dependence of insulation resistance of grain boundary were very low. The insulation characteristics of one BaTiO3 grain per layer were examined. The resistance and reliability of grain interior were very low. To improve the degradation resistance of grain interior, Ca-doped BaTiO3-based dielectrics were developed. The influence of Ca substitution on MTTF was investigated and it was found out that MTTF increased with the increase of Ca substitution.
Archive | 2007
Kazuo Muto; Tomoyuki Nakamura; Harunobu Sano
Archive | 1999
Tomoyuki Nakamura; Shinobu Mizuno; Harunobu Sano
Archive | 2004
Tomoyuki Nakamura; Kentaro Sakai; Harunobu Sano
Archive | 2000
Kotaro Hata; Toshihiro Okamatsu; Tomoyuki Nakamura; Kenji Hori; Harunobu Sano
Archive | 2003
Hiroyasu Konaka; Tomoyuki Nakamura; Toshihiro Okamatsu; Harunobu Sano
Archive | 2007
Kazuo Muto; Tomoyuki Nakamura; Akira Kato; Harunobu Sano; Takehisa Sasabayashi; Takashi Hiramatsu
Archive | 2010
Takehisa Sasabayashi; Tomoyuki Nakamura; Masayuki Ishihara; Takayuki Yao
Archive | 2007
Takehisa Sasabayashi; Masayuki Ishihara; Tomoyuki Nakamura; Harunobu Sano
Archive | 2012
Makoto Matsuda; Tomoyuki Nakamura