Toshihiro Tsuji
National Institute of Advanced Industrial Science and Technology
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Featured researches published by Toshihiro Tsuji.
ieee symposium on ultrasonics | 2003
Kazushi Yamanaka; Tsuyoshi Mihara; Toshihiro Tsuji
Cracks in solids can be detected by ultrasound if they are opened. However, it is not easy when they are closed, or with only nanoscale opening. It is the fundamental problem in ultrasonic NDE. Harmonics (2f, 3f,) is a good candidate, but it has a problem since it is generated also by transducers and liquid media (water), and it disturbs the measurement. So, we propose that subharmonics (f/2) and DC effect, which are regarded as low pass effect, is the best approach. Through theoretical and experimental investigations, we found that subharmonics is useful to detect closed fatigue cracks in aluminum, not easy to detect by conventional methods. Since it was successfully analyzed by approximate and detailed theories, it will be possible to estimate the size and property of closed crack planes by fitting measured waveforms to theories.
Archive | 2018
Yoshikazu Ohara; Jack Potter; Sylvain Haupert; Hiromichi Nakajima; Toshihiro Tsuji; Tsuyoshi Mihara
Crack closure is one of the serious issues in ultrasonic testing that may cause underestimation or misdetection. Nonlinear ultrasonics is a primary means to solve this problem. Recently, several techniques using ultrasonic phased arrays to measure elastic nonlinearity, referred to commonly as nonlinear ultrasonic phased array imaging, have been proposed and have had their efficacy demonstrated in closed-crack specimens. Note that most of them use nonlinearly scattered longitudinal waves. On the other hand, nonlinear scattering at closed cracks can generate not only longitudinal waves but also mode-converted shear waves, which may have different characteristics from longitudinal one. Here we propose to use both longitudinal and mode-converted shear waves in nonlinear ultrasonic phased array imaging, which is called multi-mode nonlinear ultrasonic phased array imaging. We examined the nonlinear scattering in numerical simulation. Subsequently, it was also experimentally demonstrated.Crack closure is one of the serious issues in ultrasonic testing that may cause underestimation or misdetection. Nonlinear ultrasonics is a primary means to solve this problem. Recently, several techniques using ultrasonic phased arrays to measure elastic nonlinearity, referred to commonly as nonlinear ultrasonic phased array imaging, have been proposed and have had their efficacy demonstrated in closed-crack specimens. Note that most of them use nonlinearly scattered longitudinal waves. On the other hand, nonlinear scattering at closed cracks can generate not only longitudinal waves but also mode-converted shear waves, which may have different characteristics from longitudinal one. Here we propose to use both longitudinal and mode-converted shear waves in nonlinear ultrasonic phased array imaging, which is called multi-mode nonlinear ultrasonic phased array imaging. We examined the nonlinear scattering in numerical simulation. Subsequently, it was also experimentally demonstrated.
Proceedings of Symposium on Ultrasonic Electronics | 2007
Shingo Akao; Naoya Iwata; Masanori Sakuma; Hidekazu Ohnishi; Kazuhiro Noguchi; Toshihiro Tsuji; Noritaka Nakaso; Kazushi Yamanaka
Archive | 2007
Kazushi Yamanaka; Toshihiro Tsuji; Naoya Iwata
Archive | 2007
Kazushi Yamanaka; Toshihiro Tsuji; Naoya Iwata
Archive | 2007
Dongyoun Sim; Maxey Bryan; Nobuo Takeda; Noritaka Nakaso; Naoya Iwata; Toshihiro Tsuji; Kazushi Yamanaka
超音波エレクトロニクスの基礎と応用に関するシンポジウム講演論文集 | 2006
Toshihiro Tsuji; Kentaro Kobari; Seishiro Ide; Kazushi Yamanaka
超音波エレクトロニクスの基礎と応用に関するシンポジウム講演論文集 | 2006
Takuji Abe; Naoya Iwata; Toshihiro Tsuji; Tsuyoshi Mihara; Shingo Akao; Kazuhiro Noguchi; Noritaka Nakaso; Dong Youn Sim; Yusuke Ebi; Takeshi Fukiura; Hidekazu Tanaka; Kazushi Yamanaka
超音波エレクトロニクスの基礎と応用に関するシンポジウム講演論文集 | 2005
Seishiro Ide; Toshihiro Tsuji; Kazushi Yamanaka
超音波エレクトロニクスの基礎と応用に関するシンポジウム講演論文集 | 2005
Kazushi Yamanaka; Takuji Abe; Naoya Iwata; Toshihiro Tsuji; Tsuyoshi Mihara; Kanwar Jit Singh; Shingo Akao; Noritaka Nakaso; Tsuneo Ohgi; Dong Youn Sim; Yusuke Ebi; Takeshi Fukiura; Hidekazu Tanaka