Toshinori Ishii
Mitsubishi
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Publication
Featured researches published by Toshinori Ishii.
international test conference | 1998
Toshinori Ishii; Hideaki Yoshida
We describe the P4 (photolithographic pattern plating process) probe card. This technology has enabled very fine (45 micron) pitch, high pin count (more than 1000 pins) and high speed (>2 GHz) probing. We summarize the design, the manufacturing process, standard specifications and performance properties of the P4 probe card. The results of contact tests are also described.
Archive | 2004
Hideaki Yoshida; Toshinori Ishii; Atushi Matsuda; Mitsuyoshi Ueki; Noriyoshi Tachikawa; Tadashi Nakamura; Naoki Katou; Shou Tai; Hayato Sasaki; Naohumi Iwamoto; Akihumi Mishima; Toshiharu Hiji; Akihiro Masuda
Archive | 1999
Toshinori Ishii; Naoki Kato; Isato Sasaki; Hideaki Yoshida; 勇人 佐々木; 直樹 加藤; 秀昭 吉田; 利昇 石井
Archive | 2005
Katsutoshi Usuki; Yuzo Yano; Toshinori Ishii; Masahiro Hamano; Yuichi Imamura; Mitsuo Kunou
Archive | 1997
Hiroshi Kanagawa Factory Tanaka; Yoshihiro Ishii; Toshinori Ishii
Archive | 1992
Toshinori Ishii; Yuzo Yano; Takahiro Taki; Yoichi Furuichi; Kenji Suzuki
Archive | 1999
Takeshi Kondo; Isamu Terasawa; Hiroshi Tanaka; Toshinori Ishii; Yoshihiro Ishii
Archive | 1994
Yoichi Furuichi; Katsumasa Imai; Toshinori Ishii; Yoshimasa Nagayoshi; Shoji Nakamura; 尚司 中村; 勝政 今井; 曜一 古市; 由昌 永吉; 俊則 石井
Archive | 1998
Toshinori Ishii; Atsushi Matsuda; Nobuyoshi Tachikawa; Mitsuyoshi Ueki; Hideaki Yoshida; 秀昭 吉田; 厚 松田; 光芳 植木; 利昇 石井; 宣芳 立川
Archive | 1997
Toshinori Ishii; Naoki Kato; Isato Sasaki; Akira Tai; Hideaki Yoshida; 勇人 佐々木; 直樹 加藤; 秀昭 吉田; 利昇 石井
