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Featured researches published by Toshio Maruyama.


Materials Science Forum | 2006

Void Formation in Magnetite Scale Formed on Iron at 823 K -Elucidation by Chemical Potential Distribution-

Mitsutoshi Ueda; Kenichi Kawamura; Toshio Maruyama

Estimation of void formation in oxide scale is important for predicting exfoliation of the oxide scale. Void formation in magnetite scale formed on iron at 823 K has been elucidated by chemical potential distribution, flux of oxide ion and its divergence. This calculation also estimates a effective diffusion coefficient, which includes both lattice diffusion and grain boundary diffusion in magnetite scale. The resulting effective diffusion coefficients give the quantitative elucidation of the morphology of the magnetite scale. The divergence of oxide ion explains well a position and an amount of void in magnetite scale.


Materials at High Temperatures | 2005

Oxygen potential distribution during disappearance of the internal oxidation zone formed in the steam oxidation of Fe–9Cr–0.26Si ferritic steel at 973 K

Mitsutoshi Ueda; Yukiko Oyama; Kenichi Kawamura; Toshio Maruyama

Abstract For discussing quantitatively the disappearance of the internal oxidation zone (IOZ), which was observed in the high temperature steam oxidation of the commercial Fe–9Cr–0.26Si ferritic steel (ASME T91), the oxygen potential distribution in the IOZ was calculated as a function of the normalized thickness of the IOZ. The distribution of the internal oxides was predicted with the calculated oxygen potential distribution and thermodynamic data. The predicted distribution of the internal oxides was in good agreement with the TEM observation at the internal oxidation front. When a sheet of amorphous SiO2 formed at the internal oxidation front, the oxygen potential at IOZ/SiO2 interface was calculated to be almost as same as that at the inner scale/IOZ interface because of the low oxygen permeability in the sheet of the SiO2. The increase in the oxygen potential oxidizes the matrix of iron in the IOZ and converts the IOZ to the inner scale.


Materials Science Forum | 2008

Void Formation in Growing Oxide Scales with Schottky Defects and P-Type Conduction

Toshio Maruyama; Kojiro Akiba; Mitsutoshi Ueda; Kenichi Kawamura

A quantitative elucidation of the void formation in a growing scale with Schottky defects and p-type conduction during high temperature oxidation of metals. The evaluation of the divergence of ionic fluxes indicates that (1) Voids form in the scale preferentially in the vicinity of the metal/scale interface, (2) The volume of voids increases in a parabolic manner, (3) The volume fraction of voids and the scale is independent of time. The comparison between the calculation and the experimentally observed scale microstructure of NiO and CoO confirmed well the validity of the prediction.


Solid State Ionics | 2004

Oxidation behavior of Fe–16Cr alloy interconnect for SOFC under hydrogen potential gradient

Hideto Kurokawa; Kenichi Kawamura; Toshio Maruyama


Materials Transactions | 2007

Quantitative Prediction of Voids Formation in a Growing Nickel Oxide Scale at 1373 K

Kojiro Akiba; Mitsutoshi Ueda; Kenichi Kawamura; Toshio Maruyama


Materials Transactions | 2007

Quantitative Prediction of Voids Formation in a Growing Cobaltous Oxide Scale at 1373 K

Kojiro Akiba; Mitsutoshi Ueda; Kenichi Kawamura; Toshio Maruyama


Meeting Abstracts | 2008

The Measurement of Fe Activity In Pd-Fe Alloys

Minoru Tanaka; Tomohiro Mizutani; Mitsutoshi Ueda; Kenichi Kawamura; Toshio Maruyama


Meeting Abstracts | 2008

Oxygen Potential on the Protective / Non-protective Scales during High Temperature Oxidation of Fe-Cr Alloys at 1073 K

Mohd Hanafi Bin Ani; Mitsutoshi Ueda; Kenichi Kawamura; Toshio Maruyama


Meeting Abstracts | 2008

Morphology of Oxides Formed on Fe-Si Alloy at Early Stage of High Temperature Oxidation at 973 K

Atsuo Tanaka; Mitsutoshi Ueda; Kenichi Kawamura; Toshio Maruyama


Meeting Abstracts | 2008

Accurate Sensing of the Oxygen Activity at the Surface of Growing Oxide Scale

Kenichi Kawamura; Atsuo Tanaka; Mitsutoshi Ueda; Toshio Maruyama

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Kenichi Kawamura

Tokyo Institute of Technology

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Mitsutoshi Ueda

Tokyo Institute of Technology

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Kojiro Akiba

Tokyo Institute of Technology

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Hideto Kurokawa

Tokyo Institute of Technology

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Minoru Tanaka

Tokyo Institute of Technology

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Mohd Hanafi Bin Ani

Tokyo Institute of Technology

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Yukiko Oyama

Tokyo Institute of Technology

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