Tracy E. Thieret
Xerox
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Publication
Featured researches published by Tracy E. Thieret.
Surface Science | 2002
Charles B. Duke; Jaan Noolandi; Tracy E. Thieret
Over the past four decades xerography, the dry ink marking process developed by the photocopy industry, has grown from nothing into a
conference on decision and control | 1996
Lingappa K. Mestha; Yao Rong Wang; Sohail A. Dianat; Eric Jackson; Tracy E. Thieret; Pramod P. Khargonekar; Daniel E. Koditschek
170 billion industry worldwide. This amazing commercial success is due to the fact that during this period, xerographic technology experienced constant and often-dramatic improvement created by sustained industrywide research and development. Indeed, the development of the xerographic copying and printing industry is one of the great applied surface science successes of all time. In this article we outline the story of the advances in xerographic technology during the past four decades, describe the profound dependence on these advances of the control of surface and interface properties of increasingly sophisticated multi-component materials systems, and indicate the potential impact on the industry of the continuing development of the surface and interface science of the multi-component materials packages used in xerographic technology.
Archive | 1999
Meera Sampath; Charles P. Coleman; Tracy E. Thieret; Ronald M. Rockwell; Charles B. Duke
This paper presents some preliminary results from a research collaboration concerning the modeling and control of color xerography. In this first communication of our work, we describe our efforts to develop a model for a monochrome marking engine. We adopt the technique of principal component analysis for choice of output coordinates and demonstrate preliminary experimental evidence suggesting that this procedure yields accuracy in data reconstruction superior to present industry practice. Preliminary analysis of the experimental evidence suggests that the process has a nonlinear component that we seek to model using a mixture of physical and empirical insight.
Archive | 2003
Naveen Sharma; Michael R. Furst; Claude S. Fillion; Weixia Huang; Michael P. Kehoe; Arturo M. Lorenzo; Mary Catherine Mccorkindale; Robert J. St. Jacques; Tracy E. Thieret; John C. Austin; Marc Dennis Daniels; Michael F. Cavanaugh
Archive | 2003
Michael R. Furst; Ronald M. Rockwell; Naveen Sharma; Claude S. Fillion; Robert J. St. Jacques; Weixia Huang; Arturo M. Lorenzo; Mary Catherine Mccorkindale; Michael P. Kehoe; Tracy E. Thieret
Archive | 2007
Stefania Castellani; Antonietta Grasso; Aaron N. Kaplan; Frederic Roulland; Claude Roux; Tracy E. Thieret; Roger T. Kramer; Ronald M. Rockwell; Donald J. Gusmano
Archive | 1996
Tracy E. Thieret; Charles P. Holt; Michael M. Shahin; Robert P. Siegel
Archive | 1993
Tracy E. Thieret; Thomas A. Henderson; Michael A. Butler
Archive | 1996
Lingappa K. Mestha; Yao Rong Wang; Sohail A. Dianat; Pramod P. Khargonekar; Daniel E. Koditschek; Eric Jackson; Tracy E. Thieret
Archive | 2011
Michael R. Furst; Loranzo Whitfield; Naveen Sharma; Ronald M. Rockwell; Tracy E. Thieret; Claude S. Fillion; Weixia Huang; Michael P. Kehoe; Arturo M. Lorenzo; Mary Catherine Mccorkindale; Robert J. St. Jacques; Michael F. Cavanaugh; Christopher J. Regruit