Tushar Sharma

Structural and optical properties of sintered ZnSxSe1−x films

Abstract Sintered ZnS x Se 1− x films have been prepared in the entire composition range from ZnSe to ZnS by using the screen printing method. To deposit good quality films, optimum conditions have been determined. Wide band gap ternary films have wide applications in solar cells. The band gap of these films are determined by reflection spectra in the wavelength range of 325–600 nm using the Tauc relation. These films have a direct band gap, which varies from 3.50 eV for ZnS to 2.66 eV for ZnSe films. The wurtzite structure of ZnSSe films was confirmed by X-ray diffraction analysis of these films.

Structural and optical properties of sintered Cd1−xZnxS films

Abstract II-VI semiconductors are of great importance due to their applications in various electro-optic devices. Sulphides of zinc and cadmium have been utilized effectively in various opto-electronic devices. We have prepared sintered CdZnS films by the screen printing method. Wide band gap ternary films have wide application in solar cells. The structural and optical properties of these films have been studied. The band gap of these films are studied by reflection spectra in the wavelength range 300–600 nm. The films have a direct band gap which varies from 3.50 eV for zinc sulphide to 2.44 for cadmium sulphide. The X-ray diffraction pattern of these films for structural analysis is also reported.

Optical, structural and electrical properties of CdTe sintered films

Cadmium telluride is considered to be one of the most promising materials for the fabrication of solar cells. Films of CdTe are deposited on glass substrate by a sintering technique. Optical, structural and electrical properties of CdTe sintered films are reported in this paper.

Quality Model Driven Dynamic Analysis

Release managers often face a dilemma about the quality of software under delivery before a release. The presence of run-time errors such as memory leaks, buffer overflows, and deadlocks affects quality attributes such as efficiency, security, and reliability. Such errors are detected using dynamic analysis methods in practice. However, the dynamic analysis methods employed in practice are by and large ad hoc. It is essential to use dynamic analysis focusing on finding the right set of run-time errors in a software component that have the maximum impact on quality. There exists a need to identify quality attributes such as reliability, efficiency, and security that are important for a software component, or, a system. In this paper, a quality model driven dynamic analysis methodology is proposed. Various run-time errors that can arise during the execution of programs written in a language such as C++ are mapped to the respective quality attributes, thereby forming a basis for run-time error classification. Our experiences in the application of dynamic analysis on real projects are reported. The methodology reports the error findings mapped to the quality attributes along with their distributions. The reported findings help management understand quality problems and take appropriate corrective action.

Quantifying Quality of Software Design to Measure the Impact of Refactoring

Software design plays a vital role in a software system. A flexible, maintainable, extensible, and re-usable software design enables easier integration of new requirements. In the current era of software development, refactoring is used periodically to fine-tune a software design. Refactoring limits technical debt and improves overall quality of a software design. However, providing a quantitative measure to estimate the impact of a refactoring exercise on a software design is a non-trivial challenge. In this paper, we present a method to estimate the quality (extendibility, and flexibility aspects) of a software design. The method proposes an index namely Software Design Quality Index (SDQI) to estimate the quality of a software design. The index can be employed to measure the impact of a refactoring exercise on software design. Moreover, the method can be used to benchmark and compare software design quality of different software systems.

Sintered films as smart materials for optoelectronics

New requirement for communication, computing, optoelectronics, medical, space, civil and military systems stress the need for increasing sped, information content and processing of optical energy in specific forms. In order to meet the requirements the device technology must be improvised. The development of new lasers has satisfied the source requirements. New low coast and efficient optoelectronic devices are desirable to process and detect the light derived from such sources, so that the optical system becomes capable of high speed functioning, rapid information density communications and computing. The current available are the devices made from single crystals, epitaxial films and thin films of Si HgCdTe and ZnTe, ZnSe, ZnTeSe and Cd1-xZnxTe.