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Ulrich Meisel

Carl Zeiss AG

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Publication

Featured researches published by Ulrich Meisel.

Archive | 1999

Process and arrangement for confocal microscopy

Ulrich Simon; Sebastian Tille; Gunter Moehler; Stefan Wilhelm; Ulrich Meisel; Ernst H. K. Stelzer

Archive | 1998

Confocal microscopy method, especially for laser scanning microscope

Sebastian Tille; Ulrich Simon; Gunter Moehler; Stefan Wilhelm; Ulrich Meisel

Archive | 1999

Method and apparatus for confocal microscopy

Sebastian Tille; Ulrich Simon; Gunter Möhler; Stefan Wilhelm; Ulrich Meisel; Ernst H. K. Stelzer

Archive | 1999

Inspection method by confocal microscope and its system configuration

Ulrich Meisel; Gunter Moehler; Ulrich Simon; Hans Karl Stelzer; Sebastian Tille; Stefan Wilhelm; サイモン （原語表記）Ｕｌｒｉｃｈ Ｓｉｍｏｎ ウルリッヒ; マイゼル （原語表記）Ｕｌｒｉｃｈ Ｍｅｉｓｅｌ ウルリッヒ; メーラー （原語表記）Ｇｕｎｔｅｒ Ｍｏｅｈｌｅｒ グンテル; ヴィルヘルム （原語表記）Ｓｔｅｆａｎ Ｗｉｌｈｅｒｕｍｕ ステファン; タイレ （原語表記）Ｓｅｂａｓｔｉａｎ Ｔｉｌｌｅ セバスチャン; カール ステルツァー （原語表記）Ｈａｎｓ Ｋａｒｌ Ｓｔｅｌｚｅｒ ハンス

Archive | 2004

Process for the observation of at least one sample region with a light raster microscope with linear sampling

Ralf Engelmann; Joerg-Michael Funk; Joerg Steinert; Bernhard Zimmermann; Stefan Wilhelm; Joerg Engel; Ulrich Meisel

Archive | 2004

Method for acquisition of at least one region of interest with a light scanning microscope having a linear illumination

Ralf Engelmann; Joerg-Michael Funk; Joerg Steinert; Bernhard Zimmermann; Stefan Wilhelm; Joerg Engel; Ulrich Meisel

Archive | 2006

Process for the observation of at least one sample region with a light raster microscope

Ralf Engelmann; Joerg-Michael Funk; Joerg Steinert; Bernhard Zimmermann; Stefan Wilhelm; Joerg Engel; Ulrich Meisel

Archive | 2004

Process for the observation of at least one sample region with a light raster microscope with light distribution in the form of a point

Ralf Engelmann; Joerg-Michael Funk; Joerg Steinert; Bernhard Zimmermann; Stefan Wilhelm; Joerg Engel; Ulrich Meisel

Archive | 2006

Verfahren zur Erfassung mindestens eines Probenbereiches mit einem Lichtrastermikroskop mit punktförmiger Lichtquellenverteilung

Stefan Wilhelm; Bernhard Zimmermann; Ralf Engelmann; Jörg Steinert; Jörg-Michael Dr. Funk; Jörg Engel; Ulrich Meisel

Archive | 2006

Arrangement for the detection of illumination radiation in a laser scanning microscope

Thomas Mehner; Stefan Wilhelm; Ulrich Meisel; Mirko Liedtke

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Stefan Wilhelm

Carl Zeiss AG

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Bernhard Zimmermann

Carl Zeiss AG

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Ralf Engelmann

Carl Zeiss AG

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Jörg Engel

Carl Zeiss AG

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Jörg Steinert

Carl Zeiss AG

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Jörg-Michael Dr. Funk

Carl Zeiss AG

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Sebastian Tille

Carl Zeiss AG

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Ulrich Simon

Carl Zeiss AG

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Gunter Moehler

Carl Zeiss AG

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Joerg Engel

Carl Zeiss AG

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