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Featured researches published by Uta Stürzebecher.


Solid State Phenomena | 2012

Wet Chemical Oxidation of Silicon Surfaces Prior to the Deposition of All-PECVD AlOx/a-SiNx Passivation Stacks for Silicon Solar Cells

A. Laades; Heike Angermann; Hans Peter Sperlich; Uta Stürzebecher; Carlos Alberto Díaz Álvarez; Mario Bähr; Alexander Lawerenz

Aluminum oxide (AlOx) is currently under intensive investigation for use in surface passivation schemes in solar cells. AlOx films contain negative charges and therefore generate an accumulation layer on p-type silicon surfaces, which is very favorable for the rear side of p-type silicon solar cells as well as the p+-emitter at the front side of n-type silicon solar cells. However, it has been reported that quality of an interfacial silicon sub-oxide layer (SiOx), which is usually observed during deposition of AlOx on Silicon, strongly impacts the silicon/AlOx interface passivation properties [1]. The present work demonstrates that a convenient way to control the interface is to form thin wet chemical oxides of high quality prior to the deposition of AlOx/a-SiNx:H stacks by the plasma enhanced chemical vapor deposition (PECVD).


Solid State Phenomena | 2012

Wet-Chemical Conditioning of H-Terminated Silicon Solar Cell Substrates Investigated by Surface Photovoltage Measurements

Heike Angermann; Uta Stürzebecher; Jan Kegel; Christiane Gottschalk; Klaus Wolke; A. Laades; E. Conrad; Carola Klimm; Bert Stegemann

For further enhancement of solar energy conversion efficiency the passivation of silicon (Si) substrate surfaces and interfaces of Si-based solar cell devices is a decisive precondition to reduce recombination losses of photogenerated charge carriers. These losses are mainly controlled by surface charges, the density and the character of rechargeable interface states (Dit) [], which are induced by defects localised in a small interlayer extending over only few Å. Therefore, the application of fast non-destructive methods for characterization of the electronic interface properties directly during the technological process has received an increasing interest in recent years.


Solid State Phenomena | 2012

Wet-Chemical Preparation of Textured Silicon Solar Cell Substrates: Surface Conditioning and Electronic Interface Properties

Heike Angermann; A. Laades; Uta Stürzebecher; E. Conrad; Carola Klimm; Tim F. Schulze; K. Jacob; Alexander Lawerenz; Lars Korte

The dominance of crystalline silicon (Si) in photovoltaics can be ascribed partly to the extensive knowledge about this material, which has been accumulated in microelectronics technology. Methods to passivate Si interfaces, which were developed for microelectronic device technologies, have been extended to solar cell manufacturing in the past. These methods, however, have been optimised for polished substrates, and do not work so effective with textured surfaces, which commonly used in the fabrication of high efficiency Si solar cells to enhance anti-reflection properties.


Solid State Phenomena | 2013

On the Trade-Off between Industrially Feasible Silicon Surface Preconditioning Prior to Interface Passivation and Iron Contaminant Removal Effectiveness

A. Laades; Uta Stürzebecher; Hans Peter Sperlich; Christian Möller; Kevin Lauer; Alexander Lawerenz

We are investigating the effect of different wet chemical surface preconditioning sequences for silicon wafers prior to the deposition of aluminum oxide based passivation layers coated by plasma enhanced chemical vapor deposition. We are focusing on the development of a simple and industrially feasible preconditioning process to achieve a high level of interface passivation after the firing process applied to industrial solar cells. Our process optimization is monitored by characterizing the passivation quality before and after a firing process. We are also investigating the effectiveness of the removal of residual surface iron concentrations by the wet chemical process.


Applied Surface Science | 2014

Over 20% conversion efficiency on silicon heterojunction solar cells by IPA-free substrate texturization

Jan Kegel; Heike Angermann; Uta Stürzebecher; E. Conrad; Mathias Mews; Lars Korte; Bert Stegemann


Energy Procedia | 2013

Passivation of Textured Silicon Wafers:Influence of Pyramid Size Distribution, a-Si:H Deposition Temperature, and Post-treatment☆

Bert Stegemann; Jan Kegel; Mathias Mews; E. Conrad; Lars Korte; Uta Stürzebecher; Heike Angermann


Solar Energy Materials and Solar Cells | 2015

PECVD-AlOx/SiNx passivation stacks on wet chemically oxidized silicon: Constant voltage stress investigations of charge dynamics and interface defect states

Jan Amaru Töfflinger; A. Laades; Lars Korte; Caspar Leendertz; Liz Margarita Montañez; Uta Stürzebecher; Hans-Peter Sperlich; Bernd Rech


Energy Procedia | 2014

PECVD-AlOx/SiNx Passivation Stacks on Silicon: Effective Charge Dynamics and Interface Defect State Spectroscopy

Jan Amaru Töfflinger; A. Laades; Caspar Leendertz; Liz Margarita Montañez; Lars Korte; Uta Stürzebecher; Hans-Peter Sperlich; Bernd Rech


Physica Status Solidi (c) | 2011

Effect of wet‐chemical substrate pretreatment on electronic interface properties and recombination losses of a ‐Si:H/c ‐Si and a ‐SiNx:H/c ‐Si hetero‐interfaces

Heike Angermann; Frank Wünsch; Marinus Kunst; A. Laades; Uta Stürzebecher; E. Conrad; Lars Korte; M. Schmidt


Energy Procedia | 2013

IPA-free Texturization of n-type Si Wafers: Correlation of Optical, Electronic and Morphological Surface Properties☆

Jan Kegel; Heike Angermann; Uta Stürzebecher; Bert Stegemann

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A. Laades

Helmholtz-Zentrum Berlin

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Lars Korte

Helmholtz-Zentrum Berlin

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Bert Stegemann

HTW Berlin - University of Applied Sciences

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E. Conrad

Helmholtz-Zentrum Berlin

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Jan Kegel

HTW Berlin - University of Applied Sciences

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Mathias Mews

Helmholtz-Zentrum Berlin

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Bernd Rech

Helmholtz-Zentrum Berlin

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Carola Klimm

Helmholtz-Zentrum Berlin

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