Uwe Kirchner
Infineon Technologies
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Publication
Featured researches published by Uwe Kirchner.
Materials Science Forum | 2012
Roland Rupp; Rolf Gerlach; Uwe Kirchner; Andreas Schlögl; Ronny Kern
A significant performance gain of 650V SiC diodes is possible by reducing the wafer thickness from the standard thickness of 350 µm to < 150 µm. Not only the differential resistance of the diodes but also the Rth benefit from this chip thickness reduction. As consequence a further chip size reduction with accompanying capacitive charge reduction leads to a device with improved efficiency in PFC applications under both high load and low load conditions.
Materials Science Forum | 2014
Wolfgang Bergner; Roland Rupp; Uwe Kirchner; Daniel Kueck
This paper presents for the first time a 650V SiC JFET switch. Although this application class is highly competitive and occupied by Silicon devices the characterization data show unique features which make the SiC switch an outstanding option for future system integration.
european conference on power electronics and applications | 2011
Ralf Siemieniec; Uwe Kirchner
Archive | 2010
Ralf Siemieniec; Uwe Kirchner
Archive | 2008
Bernhard Strzalkowski; Marco Seibt; Uwe Kirchner
Archive | 2009
Bernhard Strzalkowski; Marco Seibt; Uwe Kirchner
Archive | 2009
Ralf Otremba; Marco Seibt; Uwe Kirchner; Wolfgang Peinhopf; Michael Treu; Andreas Schloegl; Mario Feldvoss
Archive | 2012
Uwe Kirchner; Ralf Siemieniec
Archive | 2008
Ralf Otremba; Marco Seibt; Uwe Kirchner; Wolfgang Peinhopf; Michael Treu; Andreas Schloegl; Mario Feldvoss
Archive | 2017
Ralf Otremba; Felix Grawert; Amirul Afiq Hud; Uwe Kirchner; Teck Sim Lee; Guenther Lohmann; Hwee Yin Low; Edward Fuergut; Bernd Schmoelzer; Fabian Schnoy; Franz Stueckler