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Dive into the research topics where V. K. Sankaranarayanan is active.

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Featured researches published by V. K. Sankaranarayanan.


Journal of Applied Physics | 2004

Exchange bias in NiFe∕FeMn∕NiFe trilayers

V. K. Sankaranarayanan; S. M. Yoon; Dong-Yu Kim; C.O. Kim; C.G. Kim

NiFe∕FeMn∕NiFe trilayer structure forms an integral part of many conventional and tunneling magnetoresistance spin valve structures with FeMn antiferromagnetic layer. A systematic investigation of the exchange bias variations of the seed and top pinned NiFe layers in the NiFe∕FeMn∕NiFe trilayer structure is reported as a function of thickness of all the three constituting layers, in multilayers prepared by rf magnetron sputtering. X-ray diffraction patterns show the (111) texture for the NiFe and FeMn layers, necessary for the development of antiferromagnetic γ-fcc phase. In thickness variation studies of all the three magnetic layers, seed NiFe layer shows greater bias (150Oe) than the top pinned NiFe layer (80Oe only). The exchange bias shows the expected 1∕t behavior for increasing NiFe layer thickness after initial maxima at low thickness. In the FeMn antiferromagnet layer thickness variation on the other hand, the large bias values attained around 5nm thickness is nearly retained up to a thickness of...


Physica Status Solidi (a) | 2004

Distribution of interlayer‐exchange coupling on MTJ multilayer

Cheol Gi Kim; V. K. Sankaranarayanan; Chong-Oh Kim; Masakiyo Tsunoda; Migaku Takahashi

Local M-H loops have been measured on the free layer of a magnetic tunnelling junction using a magneto-optical Kerr effect system, with 2-μm spatial resolution, to investigate the distribution of the interlayer exchange-coupling field (HE) and the coercivity (H c ) on the free layer. HE and He increase gradually from a junction edge, reach a maximum at the centre and then fall off gradually at the other edge. Annealing enhances HE and smooths it out at the junction centre but H c decreases after annealing. Two-dimensional plots of HE and H c show symmetric saddle shapes with their axes aligned with the pinned layer due to the shadow-mask effect during deposition. HE measured along the pinned layer in this case shows a ridge curve with peaks at junction edges but H c is nearly constant. Atomic force microscopy measurements show that the roughness variations over the junction are similar to HE with greater roughness at the centre, indicating mutual correlation and confirming the origin of HE to be Neels orange-peel coupling based on surface roughness.


Physics of Metals and Metallography | 2006

Exchange bias investigations in FeMn based multilayers

V. K. Sankaranarayanan; Seok-Soo Yoon; C.G. Kim; C.O. Kim

We have carried out a systematic investigation of the development of exchange bias in an NiFe/FeMn/NiFe trilayer and in a trilayer with a nonmagnetic interlayer, in order to understand the development of bias in FeMn-based rf magnetron-sputtered multilayers. The trilayer shows two bias loops corresponding to the two NiFe layers where the seed layer shows a greater bias. The bias shows the expected 1/t variation with increasing seed layer thickness. The bias for the top NiFe layer of 5 nm constant thickness increases initially in the 2–6-nm range to reach a maximum value, and thereafter shows a surprising increase in bias at larger seed-layer thicknesses. The introduction of an Al layer of increasing thickness at the top FeMn surface causes the vanishing of the bias for the top NiFe layer and an increase in bias for the seed layer up to 1-nm thickness of Al layer and a decrease thereafter. The seed layer interestingly shows greater bias when an Al layer is present.


Journal of Magnetism and Magnetic Materials | 2005

Exchange bias variations of the seed and top NiFe layers in NiFe/FeMn/NiFe trilayer as a function of seed layer thickness

V. K. Sankaranarayanan; Seok-Soo Yoon; C.G. Kim; C.O. Kim


Physica Status Solidi (a) | 2004

Development of exchange bias in IrMn3 based tunnel junctions

V. K. Sankaranarayanan; Yongkang Hu; CheolGi Kim; Chong-Oh Kim; Masakiyo Tsunoda; Migaku Takahashi


European Physical Journal B | 2005

Exchange bias studies of NiFe/FeMn/NiFe trilayer by ion beam etching

V. K. Sankaranarayanan; Dong-Yu Kim; Seok-Soo Yoon; C.O. Kim; C.G. Kim


Physica Status Solidi (a) | 2004

Anomalous exchange bias of the bottom NiFe layer in NiFe/FeMn/Al/NiFe

S. M. Yoon; J. J. Lim; Young-Woo Lee; V. K. Sankaranarayanan; Choul-Young Kim; C.O. Kim


Physica Status Solidi (a) | 2004

Temperature dependence of exchange coupling in Mn75Ir25/Co70Fe30/AlOx/Co70Fe30/Ni80Fe20 MTJs

Yongkang Hu; S. M. Yoon; J. J. Lim; V. K. Sankaranarayanan; Chong-Oh Kim; C.O. Kim; Masakiyo Tsunoda; Migaku Takahashi


Journal of Magnetism and Magnetic Materials | 2004

Correlation among exchange coupling, surface roughness and junction size in magnetic tunnel junctions

V. K. Sankaranarayanan; Yongkang Hu; CheolGi Kim; Chong-Oh Kim; Masakiyo Tsunoda; Migaku Takahashi


Physica Status Solidi B-basic Solid State Physics | 2004

Coercivity Variations at the Top and Bottom NiFe layers in NiFe / FeMn / NiFe Trilayers

V. K. Sankaranarayanan; S. M. Yoon; CheolGi Kim; Chong-Oh Kim; Heebok Lee

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Chong-Oh Kim

Chungnam National University

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C.O. Kim

Chungnam National University

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CheolGi Kim

Daegu Gyeongbuk Institute of Science and Technology

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Yongkang Hu

Chungnam National University

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S. M. Yoon

Chungnam National University

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C.G. Kim

Chungnam National University

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Heebok Lee

Kongju National University

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Seok-Soo Yoon

Chungnam National University

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