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Dive into the research topics where Venkata C. Kummari is active.

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Featured researches published by Venkata C. Kummari.


RADIATION PHYSICS: IX International Symposium on Radiation Physics | 2013

An overview of the facilities, activities, and developments at the University of North Texas Ion Beam Modification and Analysis Laboratory (IBMAL)

Bibhudutta Rout; Mangal Dhoubhadel; Prakash R. Poudel; Venkata C. Kummari; Bimal Pandey; Naresh T. Deoli; Wickramaarachchige J. Lakshantha; Stephen Juma Mulware; Jacob D. Baxley; Jack E. Manuel; Jose Pacheco; S.Z. Szilasi; D.L. Weathers; Tilo Reinert; Gary A. Glass; Jerry L. Duggan; F.D. McDaniel

The Ion Beam Modification and Analysis Laboratory (IBMAL) at the University of North Texas includes several accelerator facilities with capabilities of producing a variety of ion beams from tens of keV to several MeV in energy. The four accelerators are used for research, graduate and undergraduate education, and industrial applications. The NEC 3MV Pelletron tandem accelerator has three ion sources for negative ions: He Alphatross and two different SNICS-type sputter ion sources. Presently, the tandem accelerator has four high-energy beam transport lines and one low-energy beam transport line directly taken from the negative ion sources for different research experiments. For the low-energy beam line, the ion energy can be varied from ∼20 to 80 keV for ion implantation/modification of materials. The four post-acceleration beam lines include a heavy-ion nuclear microprobe; multi-purpose PIXE, RBS, ERD, NRA, and broad-beam single-event upset; high-energy ion implantation line; and trace-element accelerator...


International Journal of Modern Physics: Conference Series | 2014

ION BEAM MATERIALS ANALYSIS AND MODIFICATIONS AT keV TO MeV ENERGIES AT THE UNIVERSITY OF NORTH TEXAS

Bibhudutta Rout; Mangal Dhoubhadel; Prakash R. Poudel; Venkata C. Kummari; Wickramaarachchige J. Lakshantha; Jack E. Manuel; Gyanendra Bohara; S.Z. Szilasi; Gary A. Glass; Floyd Del McDaniel

The University of North Texas (UNT) Ion Beam Modification and Analysis Laboratory (IBMAL) has four particle accelerators including a National Electrostatics Corporation (NEC) 9SDH-2 3 MV tandem Pelletron, a NEC 9SH 3 MV single-ended Pelletron, and a 200 kV Cockcroft-Walton. A fourth HVEC AK 2.5 MV Van de Graaff accelerator is presently being refurbished as an educational training facility. These accelerators can produce and accelerate almost any ion in the periodic table at energies from a few keV to tens of MeV. They are used to modify materials by ion implantation and to analyze materials by numerous atomic and nuclear physics techniques. The NEC 9SH accelerator was recently installed in the IBMAL and subsequently upgraded with the addition of a capacitive-liner and terminal potential stabilization system to reduce ion energy spread and therefore improve spatial resolution of the probing ion beam to hundreds of nanometers. Research involves materials modification and synthesis by ion implantation for photonic, electronic, and magnetic applications, micro-fabrication by high energy (MeV) ion beam lithography, microanalysis of biomedical and semiconductor materials, development of highenergy ion nanoprobe focusing systems, and educational and outreach activities. An overview of the IBMAL facilities and some of the current research projects are discussed.


APPLICATION OF ACCELERATORS IN RESEARCH AND INDUSTRY: Twenty-Second International Conference | 2013

Investigation of beam transmission in A 9SDH-2 3.0 MV NEC pelletron tandem accelerator

Naresh T. Deoli; Venkata C. Kummari; Jose Pacheco; J.L. Duggan; Gary A. Glass; Floyd Del McDaniel; Tilo Reinert; Bibhudutta Rout; D.L. Weathers

Electrostatic tandem accelerators are widely used to accelerate ions for experiments in materials science such as high energy ion implantation, materials modification, and analyses. Many applications require high beam current as well as high beam brightness at the target; thus, maximizing the beam transmission through such electrostatic accelerators becomes important. The Ion Beam Modification and Analysis Laboratory (IBMAL) at University of North Texas is equipped with four accelerators, one of which is a 9SDH-2 3.0 MV National Electrostatic Corporation (NEC) Pelletron® tandem accelerator. The tandem accelerator is equipped with three ion sources: one radio frequency-He ion source (Alphatross) and two ion sources of Cs-sputter type, the SNICS II (Source of Negative Ions by Cesium Sputtering) and a Cs-sputter source for trace-element accelerator based mass spectrometry. This work presents a detailed study of the beam transmission of hydrogen, silicon, and silver ions through the accelerator using the SNIC...


Nuclear Instruments & Methods in Physics Research Section B-beam Interactions With Materials and Atoms | 2014

Depth profile investigation of β-FeSi2 formed in Si(1 0 0) by high fluence implantation of 50 keV Fe ion and post-thermal vacuum annealing

Wickramaarachchige J. Lakshantha; Venkata C. Kummari; Tilo Reinert; F.D. McDaniel; Bibhudutta Rout


Revista Mexicana De Fisica | 2010

Formation and characterization of ion beam assisted nanosystems in silicon

P. R. Poudel; Bibhudutta Rout; K. M. Hossain; Mangal Dhoubhadel; Venkata C. Kummari; Arup Neogi; F.D. McDaniel


Nuclear Instruments & Methods in Physics Research Section B-beam Interactions With Materials and Atoms | 2014

Characterization of Defects in N-type 4H-SiC After High-Energy N Ion Implantation by RBS-Channeling and Raman Spectroscopy

Venkata C. Kummari; Tilo Reinert; Weilin Jiang; F.D. McDaniel; Bibhudutta Rout


Ninth Annual University Scholars Day, 2012, Denton, Texas, United States | 2012

Trace Element Analysis of Mineral Water Samples through XRF and ICP-MS

Akshar Dash; Casey Thurber; Venkata C. Kummari; Guido F. Verbeck; J.L. Duggan


Archive | 2011

Defect Characterization after Si and C Implantation in 4H-SiC.

Venkata C. Kummari; Mangal Dhoubhadel; Bibhudutta Rout; Floyd Del McDaniel; Weilin Jiang; Tilo Reinert


Eighth Annual University Scholars Day, 2011, Denton, Texas, United States | 2011

A Study of the Accuracy and Precision Among XRF, ICP-MS, and PIXE on Trace Element Analyses of Small Water Samples

Ritish Patnaik; Sahil Naik; Aaron S. Hart; Venkata C. Kummari; Lucas Phinney; Mangal Dhoubhadel; Guido F. Verbeck; J.L. Duggan; Bibhudutta Rout


Bulletin of the American Physical Society | 2011

Characterization of Si and C implantation induced defects in 4H-SiC

Venkata C. Kummari; Mangal Dhoubhadel; Bibhudutta Rout; Tilo Reinert; D. Spemann; Weilin Jiang; F.D. McDaniel

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Bibhudutta Rout

University of North Texas

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F.D. McDaniel

University of North Texas

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Floyd Del McDaniel

Sandia National Laboratories

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Gary A. Glass

University of North Texas

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J.L. Duggan

University of North Texas

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Weilin Jiang

Pacific Northwest National Laboratory

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D.L. Weathers

University of North Texas

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