Vincent D. Lee
National Institute of Standards and Technology
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Publication
Featured researches published by Vincent D. Lee.
Metrologia | 2009
Zeina J. Jabbour; Patrick J. Abbott; Edwin R. Williams; Ruimin Liu; Vincent D. Lee
This paper describes a new approach to link air and vacuum mass measurements using magnetic levitation techniques. This procedure provides direct traceability to national standards, presently defined in ambient air. We describe the basic principles, challenges, initial modelling calculations and performance expectations.
Measurement Science and Technology | 2013
Balasubramanian Muralikrishnan; Vincent D. Lee; Christopher J. Blackburn; Daniel S. Sawyer; Steven D. Phillips; Wei Ren; Ben Hughes
Tilt and radial error motion of a laser tracker head as it spins about the two rotation axes result in small but measurable ranging and angle errors. The laser tracer, on the other hand, measures range with respect to the center of a high quality stationary sphere. It is therefore not expected to be influenced by the radial error motions of the carriage that carries the optics and the source, but the form error of the reference sphere and possibly the eccentricity in its placement with respect to the circular path traced by the carriage will be contributors to the ranging errors. In this paper, we describe experiments to assess the magnitude of these ranging errors as a function of the azimuth angle in different laser trackers and a laser tracer.
Measurement Science and Technology | 2017
Prem K. Rachakonda; Bala Muralikrishnan; Luc Cournoyer; Geraldine S. Cheok; Vincent D. Lee; Meghan Shilling; Daniel S. Sawyer
The Dimensional Metrology Group (DMG) at the National Institute of Standards and Technology (NIST) is performing research to support the development of documentary standards within ASTM E57 committee. This committee is addressing the point-to-point performance evaluation of a subclass of 3D imaging systems called Terrestrial Laser Scanners (TLSs) which are laser-based and use spherical coordinate system. This paper discusses the usage of sphere targets for this effort and methods to minimize the errors due to the determination of their centers. The key contributions of this paper include the methods to segment sphere data from TLS point cloud and the study of some of the factors that influence the determination of sphere centers.
Measurement | 2017
Bala Muralikrishnan; Prem K. Rachakonda; Vincent D. Lee; Meghan Shilling; Daniel S. Sawyer; Geraldine S. Cheok; Luc Cournoyer
Terrestrial laser scanners (TLS) are a class of 3D imaging systems that produce a 3D point cloud by measuring the range and two angles to a point. The fundamental measurement of a TLS is range. Relative range error is one component of the overall range error of TLS and its estimation is therefore an important aspect in establishing metrological traceability of measurements performed using these systems. Target geometry is an important aspect to consider when realizing the relative range tests. The recently published ASTM E2938-15 mandates the use of a plate target for the relative range tests. While a plate target may reasonably be expected to produce distortion free data even at far distances, the target itself needs careful alignment at each of the relative range test positions. In this paper, we discuss relative range experiments performed using a plate target and then address the advantages and limitations of using a sphere target. We then present a novel dual-sphere-plate target that draws from the advantages of the sphere and the plate without the associated limitations. The spheres in the dual-sphere-plate target are used simply as fiducials to identify a point on the surface of the plate that is common to both the scanner and the reference instrument, thus overcoming the need to carefully align the target.
Precision Engineering-journal of The International Societies for Precision Engineering and Nanotechnology | 2015
Balasubramanian Muralikrishnan; Massimiliano M. Ferrucci; Daniel S. Sawyer; G. Gerner; Vincent D. Lee; Christopher J. Blackburn; Steven D. Phillips; P. Petrov; Y. Yakovlev; A. Astrelin; S. Milligan; J. Palmateer
Precision Engineering-journal of The International Societies for Precision Engineering and Nanotechnology | 2014
Vincent D. Lee; James M. Gibert; John C. Ziegert
Annual Meeting of the ASPE | 2013
Balasubramanian Muralikrishnan; Massimiliano M. Ferrucci; Daniel S. Sawyer; Grant Gerner; Vincent D. Lee; Christopher J. Blackburn; Steven D. Phillips; Peter Petrov; Yuri Yakovlev; Andrey Astrelin; Spike Milligan; John Palmateer
The Coordinate Metrology Society Conference | 2016
Prem K. Rachakonda; Balasubramanian Muralikrishnan; Katharine M. Shilling; Geraldine S. Cheok; Vincent D. Lee; Christopher J. Blackburn; Dennis S. Everett; Daniel S. Sawyer
Journal of Manufacturing Systems | 2015
Bala Muralikrishnan; Meghan Shilling; Prem K. Rachakonda; Wei Ren; Vincent D. Lee; Daniel S. Sawyer
Volumetric Performance Evaluation of Laser Scanners Using a Calibrated Grid of Spheres | 2014
Prem K. Rachakonda; Balasubramanian Muralikrishnan; Vincent D. Lee; Daniel S. Sawyer; Steven D. Phillips; John Palmateer
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Balasubramanian Muralikrishnan
National Institute of Standards and Technology
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