Viswanath Bavigadda

Electronic speckle-pattern interferometer using holographic optical elements for vibration measurements

We report a simple, compact electronic speckle-pattern interferometer (ESPI) incorporating holographic optical elements (HOEs) for the study of out-of-plane vibration. Reflection and transmission HOEs provide reference and object beams in the interferometer. The alignment difficulties with conventional ESPI systems are minimized using HOEs. The time-average ESPI subtraction method is used to generate the fringe pattern and remove background speckle noise by introducing a phase shift between consecutive images. The amplitude and phase maps are obtained using path-difference modulation.

Real-time shrinkage studies in photopolymer films using holographic interferometry

Polymerisation induced shrinkage is one of the main reasons why photopolymer materials are not more widely used for holographic applications. The aim of this study is to evaluate the shrinkage in an acrylamide photopolymer layer during holographic recording using holographic interferometry. Shrinkage in photopolymer layers can be measured by real time capture of holographic interferograms during holographic recording. Interferograms were captured using a CMOS camera at regular intervals. The optical path length change and hence the shrinkage were determined from the captured fringe patterns. It was observed that the photopolymer layer shrinkage is in the order of 3.5%.

Out-of-plane Vibration Analysis with a Transmission Holographic Optical Element Based Electronic Speckle Pattern Interferometer

A simple electronic speckle pattern interferometer (ESPI) using a transmission holographic optical element (THOE) is presented. The THOE is designed to create a speckled reference beam in the interferometer. It is a transmission hologram of a diffusely transmitting glass plate. A specific requirement for the fabrication of the THOEs is for them to be recorded at one wavelength, at which the recording material is photosensitive and reconstructed using a near-infrared laser diode which can be current modulated for phase shifting purposes. A partially reflective glass plate provides illumination of the object along the normal to its surface, ensuring that the system is sensitive only to out-of-plane displacement of the object. The intensity of the object beam can be controlled by using reflective glass plates with different reflection coefficients. It is demonstrated that the HOE based system can be used for vibration measurements and modal analysis. A big advantage of the system is its simplicity.

Whole field out-of-plane vibration analysis with a HOE-based ESPI system

Electronic speckle pattern interferometry (ESPI) is a full-field measurement technique, capable of displaying vibrational mode shapes. A simple optical set-up for an ESPI system using a holographic optical element (HOE) is presented. The HOE is designed to create a speckled reference beam in the interferometer. A partially reflective glass plate provides illumination of the object along the normal to its surface, ensuring that the system is sensitive only to out-of-plane displacement of the object. It is demonstrated that the HOE-based system can be used for vibration measurements. Phase shifting can be implemented for fringe analysis. A big advantage of the system is its simplicity. It requires a small number of components: a coherent light source, a holographic optical element, a glass plate and a CCD camera. Introducing holographic optical elements in ESPI gives the advantage of large aperture optical elements at relatively low cost.

Design and Fabrication of Holographic Optical Elements for Applications in Electronic Speckle Pattern Interferometry and Laser Doppler Vibrometry

An important area of application of holographic optical elements (HOEs) is in optical and electronic speckle pattern interferometry. The design, fabrication and characterization of holographic optical elements (HOEs) for electronic speckle pattern interferometry are presented. Reflection HOEs (RHOEs) were fabricated for use in electronic speckle pattern interferometers (ESPI) and laser Doppler vibrometers (LDV). The HOE-based interferometer is sensitive to out-of-plane displacements only. The results obtained are promising for future applications of the system for modal analysis.

Vibration phase measurements using holographic optical elements based electronic speckle pattern interferometry

The application of an out-of-plane sensitive electronic speckle pattern interferometer (ESPI) using holographic optical element (HOE) to vibration amplitude and phase mapping is reported. The novelty of the proposed system is the use of a speckle reference wave stored in a reflection holographic optical element (HOE). The incorporation of a HOE minimizes the alignment difficulties. The HOE based ESPI system is compact containing only a diode laser, HOE and a digital CMOS camera. The measurement technique is a combination of time averaged ESPI and reference beam phase modulation in an unbalanced interferometer. The reference beam phase modulation is implemented by modulating the drive current of the diode laser. The presented HOE based ESPI system is easy to align and compact and thus suitable for industrial non-destructive testing and vibration analysis.

Compact holographic optical element-based electronic speckle pattern interferometer for rotation and vibration measurements

An out-of-plane sensitive electronic speckle pattern interferometer (ESPI) using holographic optical elements (HOEs) for studying rotations and vibrations is presented. Phase stepping is implemented by modulating the wavelength of the laser diode in a path length imbalanced interferometer. The time average ESPI method is used for vibration measurements. Some factors influencing the measurements accuracy are reported. Some advantages and limitations of the system are discussed.

Application of phase shifting electronic speckle pattern interferometry in studies of photoinduced shrinkage of photopolymer layers

Photoinduced shrinkage occurring in photopolymer layers during holographic recording was determined by phase shifting electronic speckle pattern interferometry. Phase maps were calculated from the changes in intensity at each pixel due to the phase differences introduced between object and reference beams. Shrinkage was then obtained from the changes in phase as recording proceeded. The technique allows for whole field measurement of the dimensional changes in photopolymers during holographic recording.

Quantitative measurement of displacement in photopolymer layers during holographic recording using phase shifting electronic speckle pattern interferometry

The aim of this study is to determine the displacement profile due to shrinkage in acrylamide-based photopolymer layer during holographic recording. Using phase shifting electronic speckle pattern interferometry the displacement at each pixel in the image of the object is measured by phase shifting technique so that a complete displacement profile of the object can be obtained. It was observed that the displacement profile is Gaussian and resembles to the profile of the recording beam. We observed an increase in shrinkage from 2 μm at 20 seconds of recording to 7.5 μm after 120 seconds of recording. The technique allows for real time measurement of the shrinkage profile.

Sensing and metrological applications of holography

An analyte or measurand may change the diffraction efficiency of a hologram or the colour of a reflection hologram. The formation of a holographic grating can itself be a sensing action. Holographic optical elements (HOEs) can provide the reference and object beams in an unbalanced, out-of-plane sensitive, electronic speckle pattern interferometer for metrology, with wavelength modulation enabling the fringe analysis.