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Dive into the research topics where Volker Paquet is active.

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Optical Thin Films III: New Developments | 1990

Radio frequency and microwave plasma for optical thin-film deposition

Juergen Dr Otto; Volker Paquet; Ralf T. Kersten; Heinz-Werner Etzkorn; Raymond M. Brusasco; Jerald A. Britten; John H. Campbell; J. B. Thorsness

For the next generation of fusion lasers reflecting mirrors with laser damage thresholds of at least 40 J/cm2 for 1 0 ns laser pulses at 1 .064 pm are needed. Up to now, no deposition technique has been developed to produce such mirrors. Best R&D-values realized today are around 30 J/cm2 for e-beam evaporated mirrors. R&D on conventional e-beam coating processes over the last 1 0 years has come up with marginal improvements in laser damage thresholds only. However, new technologies, like PICVD (Plasma-Impulse CVD) developed for the fabrication of ultra-low loss fiber preforms, seem to offer the potential to solve this problem. First results have been reported already [1-3]. It is well known that fused silica produced by CVD processes can have laser damage thresholds as high as 80 J/cm2. However, the thickness of a single deposited film is in the pm-range for most of the CVD-processes used for preform manufacturing; since interference optics need films in the ; /4n range (where n is the refractive index of the dielectric material) the use of preform-fabrication processes for the purpose of interference mirror fabrication is limited to a few plasma based CVD technologies, namely PCVD (Plasma-CVD, Philips [4]; PICVD, SCHOTT [5]). Especially PICVD is a very powerful technology to fabricate thin film multilayers for interference mirrors, because this technique is able to produce films down to monolayer thickness with nearly perfect stoichiometry and morphology. In first and preliminary experiments the usual deposition in a circular tube at high temperatures has been used for simplicity. However, to produce large area high quality laser mirrors this principle know-how has to be transfered from circular to planar geometry. Experiments showed, that there may be some limitations with respect to the homogeneity of a planar deposition using microwave excitation for the plasma. Therefore experiments have been performed in parallel with both RF and microwave excitation for comparison. In the following we will restrict ourselves to the description and discussions of the planar processes; the principle and details of the PICVD-process are described elsewhere [5] while RF-plasma technology is a well known process.


Archive | 1995

Plasma CVD method of producing a gradient layer

Jurgen Otto; Johannes Dr Segner; Volker Paquet


Archive | 1989

Plasma CVD process using a plurality of overlapping plasma columns

Volker Paquet; Ulrich Ackermann; Heniz-W. Etzkorn; Ralf T. Kersten; Uwe Rutze


Archive | 1991

Plasma cvd process for coating a dome-shaped substrate

Heinz Werner Dr. Etzkorn; Harald Krummel; Volker Paquet; Günter Weidmann


Archive | 1992

Optical inorganic waveguide with a substantially planar organic substrate

Martin Dr Heming; Roland Hochhaus; Ralf Prof Dr Kersten; Dieter Prof Dr Krause; Jurgen Otto; Volker Paquet; Johannes Dr Segner; Christof Fattinger


Archive | 1989

Plasma-enhanced CVD coating process

Ulrich Ackermann; Ralf T. Kersten; Heinz-Werner Etzkorn; Volker Paquet; Uwe Rutze


Archive | 1995

PICVD process and device for the coating of curved substrates

Martin Dr Heming; Ulrich Lange; Roland Langfeld; Wolfgang Möhl; Jurgen Otto; Volker Paquet; Johannes Dr Segner; Martin Walther


Archive | 1988

PLASMAVERFAHREN ZUM BESCHICHTEN EBENER SUBSTRATE

Volker Paquet; Ulrich Ackermann; Heinz-W Dr Etzkorn; Ralf Prof Dr Kersten; Uwe Ruetze


Archive | 1992

Process for the production of a thin film optical waveguide of tio2

Martin Dr Heming; Roland Hochhaus; Jurgen Otto; Volker Paquet


Archive | 1989

Cvd coating process for producing coatings and apparatus for carrying out the process

Ulrich Ackermann; Ralf T. Kersten; Heinz-Werner Etzkorn; Volker Paquet; Uwe Rutze

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