Vu Xuan Hien
Hanoi University of Science and Technology
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Publication
Featured researches published by Vu Xuan Hien.
Journal of Electronic Materials | 2017
Nguyen Dac Dien; Luong Huu Phuoc; Vu Xuan Hien; Dang Duc Vuong; Nguyen Duc Chien
WO3 nanorods (NRs) and α-Fe2O3 NRs were fabricated by hydrothermal treatment. Composites of these materials were created by mixing with ratios of 1:2, 1:1 and 2:1 in weight. Morphology, structure and composition characteristics of the WO3/Fe2O3 NRs composites were characterized by scanning electron microscopy, x-ray diffraction and energy dispersive x-ray spectroscopy analyses. The results of sensing measurements indicated that the sensor based on WO3:Fe2O3 with the ratio of 2:1 exhibited fairly good sensitivity toward NH3 at 300°C and the sensor based on WO3:Fe2O3 with the ratio of 1:1 can be used as a NH3 sensor with an operating temperature of 350°C. Selectivity and response–recovery times are suitable for practical applications. Finally, the mechanism for the improvement in the gas-sensing property was discussed.
Applied Science and Convergence Technology | 2016
Vu Xuan Hien; Young-Woo Heo
Thermal oxidation has significant potential for use in synthesizing metal-oxide nanostructures from metallic materials. However, this method has limited applicability to the synthesis of multi-morphology NiO from Ni foil. Techniques consisting of mechanical and chemical approaches were used to pre-treat the Ni foil (prior to oxidation) to promote the formation of nanowires and nanoplates on the NiO layer. These morphologies were realized on the Ni foils scratched by sand paper and a knife, respectively, and subsequently heat-treated at 500C for 24 h. Small nanowires (diameter: <10 nm) formed on the Ni foil treated by absolute HNO3 and then oxidized at 500 C for 24 h. The formation of various morphologies (on the pre-treated Ni foil), which differ from that formed in the case of pristine Ni foil after oxidation, may be attributed to the surface melting phenomenon that occurs during the nucleation process.
ACS Applied Materials & Interfaces | 2016
Vu Xuan Hien; Young-Woo Heo
We introduce a simple process for the fabrication of SiO2 films embedded with β-Sn-rich nano/microspheres. Sn spheres with maximum and minimum sizes of 10 μm (near the SiO2 surface) and 5 nm (at the Si/SiO2 interface) were grown within a 0.7-5.7 μm-thick SiO2 layer by evaporating SnO powders onto an Si (100) substrate for 1-600 min at 600-900 °C and 0.001-5.0 Torr. A possible growth mechanism of these materials is discussed. The current-voltage characteristics of the as-fabricated samples were investigated to identify potential applications. During these tests, small flashes of light and the presence of damaged areas were observed at the oxide surfaces of the samples using an optical camera and a field emission scanning electron microscope, respectively. The electrical breakdown and shutdown of the devices observed in the current-voltage curves were attributed to the destruction of the SiO2 surface. In addition, the current-time responses show that the size of the damaged regions can be controlled by the voltage and duration of the applied stress, and are independent of the size and shape of the electrodes. The present materials thus possess great potential for applications in self-destructing devices.
Physica E-low-dimensional Systems & Nanostructures | 2011
Dang Duc Vuong; Vu Xuan Hien; Khuc Quang Trung; Nguyen Duc Chien
Sensors and Actuators B-chemical | 2016
Vu Xuan Hien; Young-Woo Heo
Vacuum | 2018
Vu Xuan Hien; Nguyen Hoang Minh; Dang Tuan Son; Nguyen Thanh Nghi; Luong Huu Phuoc; Cao Tien Khoa; Dang Duc Vuong; Nguyen Duc Chien; Young-Woo Heo
Journal of Electronic Materials | 2017
Vu Xuan Hien; Vu Duy Minh; Luong Huu Phuoc; Dang Duc Vuong; Young-Woo Heo; Nguyen Duc Chien
한국진공학회 학술발표회초록집 | 2014
Vu Xuan Hien; Joon-Hyung Lee; Jeong-Joo Kim; Young-Woo Heo
Materials Chemistry and Physics | 2018
Vu Xuan Hien; Dang Duc Vuong; Nguyen Duc Chien; Young-Woo Heo
Journal of Electronic Materials | 2017
Pham Tien Hung; Vu Xuan Hien; Joon-Hyung Lee; Jeong-Joo Kim; Young-Woo Heo