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Dive into the research topics where W. Knap is active.

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Featured researches published by W. Knap.


Nature Materials | 2012

Graphene field-effect transistors as room-temperature terahertz detectors

L. Vicarelli; Miriam S. Vitiello; D. Coquillat; A. Lombardo; A. C. Ferrari; W. Knap; Marco Polini; Vittorio Pellegrini; Alessandro Tredicucci

The unique optoelectronic properties of graphene make it an ideal platform for a variety of photonic applications, including fast photodetectors, transparent electrodes in displays and photovoltaic modules, optical modulators, plasmonic devices, microcavities, and ultra-fast lasers. Owing to its high carrier mobility, gapless spectrum and frequency-independent absorption, graphene is a very promising material for the development of detectors and modulators operating in the terahertz region of the electromagnetic spectrum (wavelengths in the hundreds of micrometres), still severely lacking in terms of solid-state devices. Here we demonstrate terahertz detectors based on antenna-coupled graphene field-effect transistors. These exploit the nonlinear response to the oscillating radiation field at the gate electrode, with contributions of thermoelectric and photoconductive origin. We demonstrate room temperature operation at 0.3 THz, showing that our devices can already be used in realistic settings, enabling large-area, fast imaging of macroscopic samples.


Journal of Applied Physics | 2002

Nonresonant detection of terahertz radiation in field effect transistors

W. Knap; V. Kachorovskii; Yanqing Deng; S. L. Rumyantsev; Jian-Qiang Lu; R. Gaska; M. S. Shur; Grigory Simin; X. Hu; M. Asif Khan; C. A. Saylor; Louis-Claude Brunel

We present an experimental and theoretical study of nonresonant detection of subterahertz radiation in GaAs/AlGaAs and GaN/AlGaN heterostructure field effect transistors. The experiments were performed in a wide range of temperatures (8–300 K) and for frequencies ranging from 100 to 600 GHz. The photoresponse measured as a function of the gate voltage exhibited a maximum near the threshold voltage. The results were interpreted using a theoretical model that shows that the maximum in photoresponse can be explained by the combined effect of exponential decrease of the electron density and the gate leakage current.


Applied Physics Letters | 2006

Plasma wave detection of terahertz radiation by silicon field effects transistors: Responsivity and noise equivalent power

R. Tauk; F. Teppe; S. Boubanga; D. Coquillat; W. Knap; Y. M. Meziani; C. Gallon; F. Boeuf; T. Skotnicki; C. Fenouillet-Beranger; D. K. Maude; S. L. Rumyantsev; M. S. Shur

Si metal oxide semiconductor field effect transistors (MOSFETs) with the gate lengths of 120–300nm have been studied as room temperature plasma wave detectors of 0.7THz electromagnetic radiation. In agreement with the plasma wave detection theory, the response was found to depend on the gate length and the gate bias. The obtained values of responsivity (⩽200V∕W) and noise equivalent power (⩾10−10W∕Hz0.5) demonstrate the potential of Si MOSFETs as sensitive detectors of terahertz radiation.


Applied Physics Letters | 2004

Terahertz emission by plasma waves in 60 nm gate high electron mobility transistors

W. Knap; J. Lusakowski; T. Parenty; S. Bollaert; A. Cappy; V. V. Popov; M. S. Shur

We report on the resonant, voltage tunable emission of terahertz radiation (0.4–1.0 THz) from a gated two-dimensional electron gas in a 60 nm InGaAs high electron mobility transistor. The emission is interpreted as resulting from a current driven plasma instability leading to oscillations in the transistor channel (Dyakonov–Shur instability).


Applied Physics Letters | 2004

Plasma wave detection of sub-terahertz and terahertz radiation by silicon field-effect transistors

W. Knap; F. Teppe; Y. Meziani; N. Dyakonova; J. Lusakowski; F. Boeuf; T. Skotnicki; D. K. Maude; S. L. Rumyantsev; M. S. Shur

We report on experiments on photoresponse to sub-THz (120GHz) radiation of Si field-effect transistors (FETs) with nanometer and submicron gate lengths at 300K. The observed photoresponse is in agreement with predictions of the Dyakonov–Shur plasma wave detection theory. This is experimental evidence of the plasma wave detection by silicon FETs. The plasma wave parameters deduced from the experiments allow us to predict the nonresonant and resonant detection in THz range by nanometer size silicon devices—operating at room temperature.


Optics Express | 2011

Broadband terahertz imaging with highly sensitive silicon CMOS detectors

Franz Schuster; D. Coquillat; H. Videlier; M. Sakowicz; F. Teppe; Laurent Dussopt; Benoît Giffard; T. Skotnicki; W. Knap

This paper investigates terahertz detectors fabricated in a low-cost 130 nm silicon CMOS technology. We show that the detectors consisting of a nMOS field effect transistor as rectifying element and an integrated bow-tie coupling antenna achieve a record responsivity above 5 kV/W and a noise equivalent power below 10 pW/Hz(0.5) in the important atmospheric window around 300 GHz and at room temperature. We demonstrate furthermore that the same detectors are efficient for imaging in a very wide frequency range from ~0.27 THz up to 1.05 THz. These results pave the way towards high sensitivity focal plane arrays in silicon for terahertz imaging.


Applied Physics Letters | 2002

Resonant detection of subterahertz and terahertz radiation by plasma waves in submicron field-effect transistors

W. Knap; Yanqing Deng; S. L. Rumyantsev; M. S. Shur

We report on the experiments on resonant photoresponse of the gated two-dimensional electron gas to the terahertz radiation. The visible-light-induced, metastable increase of the carrier density in the transistor channel shifts the resonance position to the higher gate voltages, in agreement with plasma wave detection theory. In this way, an unambiguous proof of the origin of the observed resonant detection is provided. The visible light illumination also leads to an increase of the electron mobility and, as a result, to an increase of the resonant detection quality factor. Resonant detection of the harmonics of the Gunn diode-based emission system is demonstrated up to 1.2 THz.


Applied Physics Letters | 2000

Large, nitrogen-induced increase of the electron effective mass in InyGa1−yNxAs1−x

C. Skierbiszewski; P. Perlin; P. Wisniewski; W. Knap; T. Suski; W. Walukiewicz; W. Shan; K. M. Yu; Joel W. Ager; E. E. Haller; J. F. Geisz; J. M. Olson

A dramatic increase of the conduction band electron mass in a nitrogen-containing III–V alloy is reported. The mass is found to be strongly dependent on the nitrogen content and the electron concentration with a value as large as 0.4m0 in In0.08Ga0.92As0.967N0.033 with 6×1019 cm−3 free electrons. This mass is more than five times larger than the electron effective mass in GaAs and comparable to typical heavy hole masses in III–V compounds. The results provide a critical test and fully confirm the predictions of the recently proposed band anticrossing model of the electronic structure of the III–N–V alloys.


Applied Physics Letters | 2006

Resonant and voltage-tunable terahertz detection in InGaAs∕InP nanometer transistors

A. El Fatimy; F. Teppe; N. Dyakonova; W. Knap; D. Seliuta; Gintaras Valušis; A. Shchepetov; Y. Roelens; S. Bollaert; A. Cappy; S. L. Rumyantsev

The authors report on detection of terahertz radiation by high electron mobility nanometer InGaAs∕AlInAs transistors. The photovoltaic type of response was observed at the 1.8–3.1THz frequency range, which is far above the cutoff frequency of the transistors. The experiments were performed in the temperature range from 10to80K. The resonant response was observed and was found to be tunable by the gate voltage. The resonances were interpreted as plasma wave excitations in the gated two-dimensional electron gas. The minimum noise equivalent power was estimated, showing possible application of these transistors in sensing of terahertz radiation.


Journal of Infrared, Millimeter, and Terahertz Waves | 2009

Field Effect Transistors for Terahertz Detection: Physics and First Imaging Applications

W. Knap; Mikhail Dyakonov; D. Coquillat; F. Teppe; N. Dyakonova; J. Łusakowski; K. Karpierz; M. Sakowicz; Gintaras Valušis; D. Seliuta; Irmantas Kašalynas; Abdelouahad El Fatimy; Y. M. Meziani; Taiichi Otsuji

Resonant frequencies of the two-dimensional plasma in FETs increase with the reduction of the channel dimensions and can reach the THz range for sub-micron gate lengths. Nonlinear properties of the electron plasma in the transistor channel can be used for the detection and mixing of THz frequencies. At cryogenic temperatures resonant and gate voltage tunable detection related to plasma waves resonances is observed. At room temperature, when plasma oscillations are overdamped, the FET can operate as an efficient broadband THz detector. We present the main theoretical and experimental results on THz detection by FETs in the context of their possible application for THz imaging.

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D. Coquillat

University of Montpellier

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F. Teppe

Rensselaer Polytechnic Institute

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N. Dyakonova

University of Montpellier

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D. But

University of Montpellier

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M. S. Shur

Rensselaer Polytechnic Institute

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V. I. Gavrilenko

Russian Academy of Sciences

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F. Teppe

Rensselaer Polytechnic Institute

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C. Consejo

University of Montpellier

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S. L. Rumyantsev

Rensselaer Polytechnic Institute

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