W. Limmer
University of Ulm
Network
Latest external collaboration on country level. Dive into details by clicking on the dots.
Publication
Featured researches published by W. Limmer.
Journal of Applied Physics | 2004
F. Reuss; C. Kirchner; Th. Gruber; R. Kling; S. Maschek; W. Limmer; A. Waag; P. Ziemann
Gallium and nitrogen ions have been implanted into ZnO crystals and metal organic vapor phase epitaxy grown ZnO layers. Postimplantation annealing behavior in the temperature range between 200 and 900 °C has been studied by means of Raman scattering and low-temperature photoluminescence. The temperature for healing of the implantation-induced defects was found to be 800 °C. Implanted gallium acts as donor with a donor binding energy ED of 53 meV, thus allowing the control of n-type doping in ZnO. From photoluminescence measurements of the donor-acceptor pair transition of a series of nitrogen-implanted ZnO samples we estimate the binding energy EA of the nitrogen acceptor between 163 and 196 meV. Electrical characterization of nitrogen-implanted samples shows a behavior ranging from low n-type to highly compensated. But no unambiguous and reproducible type conversion could be achieved.
Journal of Applied Physics | 1999
A. Link; K. Bitzer; W. Limmer; R. Sauer; C. Kirchner; V. Schwegler; M. Kamp; D. G. Ebling; K. W. Benz
The frequencies and dampings of the zone-center optical phonons E2 and A1(LO) in wurtzite-type GaN and AlN layers have been measured by Raman spectroscopy in the temperature range from 85 to 760 K. The GaN layer was grown by metalorganic vapor phase epitaxy and the AlN layer by molecular beam epitaxy both on sapphire substrate. The experimentally obtained frequencies and dampings are modeled by a theory taking into account the thermal expansion of the lattice, a symmetric decay of the optical phonons into two and three phonons of lower energy, and the strain in the layers induced by the different thermal expansion coefficients of layer and substrate. The results were used to determine the local temperature of a GaN pn diode in dependence on the applied voltage.
Journal of Applied Physics | 2004
Th. Gruber; G. M. Prinz; C. Kirchner; R. Kling; F. Reuss; W. Limmer; A. Waag
We have investigated the structural, optical, and vibrational properties of strained heteroepitaxial ZnO layers by high resolution x-ray diffraction, reflectivity, and Raman measurements. The ZnO layers were grown by metalorganic vapor phase epitaxy on sapphire substrates under varying growth conditions. A Poisson number of μ=0.303 and phonon deformation-potential parameters of a=−690 cm−1, b=−940 cm−1 for the high-energy E2 optical phonon mode have been determined. The shift of the excitonic resonances due to the strain in the layers agrees well with the experimentally determined Poisson ratio using the deformation-potentials D1–D4 determined by Wrzesinski and Frohlich [Phys. Rev. B 56, 13087 (1997)].
Journal of Micromechanics and Microengineering | 2007
Erwin Peiner; A. Tibrewala; Ralf Bandorf; Holger Lüthje; Lutz Doering; W. Limmer
Sputter-deposited amorphous diamond-like carbon (DLC, a-C) on silicon has been investigated with respect to micro electro mechanical systems (MEMS) applications. Sputtered a-C with a content of diamond-like sp3 bonded carbon of around 25% showed a high hardness of up to 30 GPa. Self-supporting cantilevers of 0.5 µm in thickness, several hundreds of µm in length and some tens of µm in width have been successfully realized using lift-off patterning of DLC and anisotropic silicon etching. The mechanical properties of DLC (Youngs modulus, stress, stress gradient fracture strength) were characterized by cantilever deflection analyses. DLC strain gauge resistors integrated on micromachined silicon boss membranes were investigated under tensile and compressive loading. Piezoresistive gauge factors in the range of 20–30 were observed at temperatures between room temperature and 50 °C.
Physical Review B | 2008
W. Limmer; J. Daeubler; Lukas Dreher; M. Glunk; W. Schoch; S. Schwaiger; R. Sauer
The longitudinal and transverse resistivities of differently strained Ga,MnAs layers are theoretically and experimentally studied as a function of the magnetization orientation. The strain in the series of Ga,MnAs layers is gradually varied from compressive to tensile using In,GaAs templates with different In concentrations. Analytical expressions for the resistivities are derived from a series expansion of the resistivity tensor with respect to the direction cosines of the magnetization. In order to quantitatively model the experimental data, terms up to the fourth order have to be included. The expressions derived are generally valid for any single-crystalline cubic and tetragonal ferromagnet and apply to arbitrary surface orientations and current directions. The model phenomenologically incorporates the longitudinal and transverse anisotropic magnetoresistance as well as the anomalous Hall effect. The resistivity parameters obtained from a comparison between experiment and theory are found to systematically vary with the strain in the layer.
Physical Review B | 2005
W. Limmer; A. Koeder; S. Frank; Vitaliy Avrutin; W. Schoch; R. Sauer; K. Zuern; Johannes Eisenmenger; P. Ziemann; Erwin Peiner; A. Waag
The effect of annealing at
Physical Review B | 2010
Lukas Dreher; D. Donhauser; J. Daeubler; M. Glunk; C. Rapp; W. Schoch; R. Sauer; W. Limmer
250\phantom{\rule{0.2em}{0ex}}\ifmmode^\circ\else\textdegree\fi{}\mathrm{C}
Physical Review B | 2009
M. Glunk; J. Daeubler; W. Schoch; R. Sauer; W. Limmer
on the carrier depth profile, Mn distribution, electrical conductivity, and Curie temperature of (Ga,Mn)As layers with thicknesses
Applied Physics Letters | 2006
J. Daeubler; M. Glunk; W. Schoch; W. Limmer; R. Sauer
\ensuremath{\geqslant}200\phantom{\rule{0.3em}{0ex}}\mathrm{nm}
Physical Review B | 2013
Lukas Dreher; C. Bihler; Erwin Peiner; A. Waag; W. Schoch; W. Limmer; S. T. B. Goennenwein; M. S. Brandt
, grown by molecular-beam epitaxy at low temperatures, is studied by a variety of analytical methods. The vertical gradient in hole concentration, revealed by electrochemical capacitance-voltage profiling, is shown to play a key role in the understanding of conductivity and magnetization data. The gradient, basically already present in as-grown samples, is strongly influenced by post-growth annealing. From secondary ion mass spectroscopy it can be concluded that, at least in thick layers, the change in carrier depth profile and thus in conductivity is not primarily due to out-diffusion of Mn interstitials during annealing. Two alternative possible models are discussed.