Wen Bao

Orthogonal dispersive spectral-domain optical coherence tomography.

Ultrahigh depth range spectral domain optical coherence tomography (SDOCT) can be realized based on the orthogonal dispersive spectrometer consisted by a high spectral resolution virtually-imaged phased array (VIPA) and a low spectral resolution grating. However, two critical issues result in the challenge of obtaining desirable one-dimensional (1-D) spectra from the recorded two-dimensional (2-D) orthogonal spectra for high-quality OD-SDOCT imaging. One is the wavenumber mapping errors and the other is the periodic intensity modulations. The paper proposes a method for desirable reconstruction of 1-D spectra from the recorded 2-D orthogonal spectra. A sample etalon with identical parameters to the dispersive VIPA is used to determine the free spectrum range (FSR) of the VIPA, and spectral phases from two reflecting mirrors are further applied for broadband wavenumber calibration. The cascading of column spectra are performed from interval of four lines of column spectra, and four records of cascaded 1-D spectra are obtained and then averaged to alleviate the periodic intensity modulations. Broadband 1-D spectra are thus reconstructed with an ultrahigh spectral resolution. To demonstrate the feasibility of the proposed method, three typical samples are imaged by the OD-SDOCT system.

Identification of surface defects on glass by parallel spectral domain optical coherence tomography

Defects can dramatically degrade glass quality, and automatic inspection is a trend of quality control in modern industry. One challenge in inspection in an uncontrolled environment is the misjudgment of fake defects (such as dust particles) as surface defects. Fortunately, optical changes within the periphery of a surface defect are usually introduced while those of a fake defect are not. The existence of changes within the defect peripheries can be adopted as a criterion for defect identification. However, modifications within defect peripheries can be too small to be noticeable in intensity based optical image of the glass surface, and misjudgments of modifications may occur due to the incorrectness in defect demarcation. Thus, a sensitive and reliable method for surface defect identification is demanded. To this end, a nondestructive method based on optical coherence tomography (OCT) is proposed to precisely demarcate surface defects and sensitively measure surface deformations. Suspected surface defects are demarcated using the algorithm based on complex difference from expectation. Modifications within peripheries of suspected surface defects are mapped by phase information from complex interface signal. In this way, surface defects are discriminated from fake defects using a parallel spectral domain OCT (SD-OCT) system. Both simulations and experiments are conducted, and these preliminary results demonstrate the advantage of the proposed method to identify glass surface defects.

Motion correction using overlapped data correlation based on a spatial-spectral encoded parallel optical coherence tomography

This paper presents an approach to remove motion artifacts based on a spatial-spectral encoded parallel OCT (SSE-POCT) system, where encoded rectangular illumination is employed. Motion artifacts within a B-scan are avoided due to parallel detection intrinsic to parallel OCT, while those between successive B-scans are estimated and corrected by a proposed overlapped data correlation (ODC) algorithm. To preserve axial resolution, decoded B-scan corresponding to complete spectrum is stitched from successive encoded B-scans after motion correction. Imaging is conducted on several samples under preset motion trajectories, and OCT images with unnoticed motion artifacts and well-preserved resolutions are reconstructed. The approach based on the developed SSE-POCT system and the proposed ODC algorithm for motion correction can be applicable for in vivo imaging where uncontrolled motion is usually unavoidable.

High-speed high-precision and ultralong-range complex spectral domain dimensional metrology

A precise, nondestructive dimensional metrological system is crucial to manufacturing and packaging of multi-component optical system. To this end, an orthogonal dispersive spectrometer based complex spectral domain interferometric system for high-speed high-precision and ultralong-range dimensional metrology is developed. An improved complex method based on actual spectral phase shift is proposed to achieve ultrahigh suppression of artifacts. Suppression ratios of 80 dB for DC and 60 dB for mirror images are realized, the highest ratios among existing complex methods. To ensure high-precision in distance determination, an averaged spectral phase measurement algorithm is adopted. A precision of 60 nm within a measurement range of 200 mm without axial movement of the sample is demonstrated. The measurement range is readily extendable if axial movement of the sample and range cascading are involved. The system holds potential applications in various areas for real-time nondestructive testing and evaluation.