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Publication
Featured researches published by William A. Tolbert.
Proceedings of SPIE | 2005
Sergey A. Lamansky; Thomas R. Hoffend; Ha Le; Vivian W. Jones; Martin B. Wolk; William A. Tolbert
Laser Induced Thermal Imaging (LITI) allows for high-resolution patterning of a variety of materials that often cannot be patterned efficiently by other conventional techniques such as photolithography. Application of LITI towards patterning vacuum-coated OLED materials is particularly attractive because of high LITI patterning resolution and accuracy and good compatibility of vacuum-coated OLED materials. However, LITI may induce thermal transfer defects within OLED materials. We are developing methods to address these potential thermal defects while maintaining patterning quality, device operation efficiency, voltage, and lifetime. Recent results regarding optimization of LITI for patterning vacuum-coated OLEDs will be discussed.
SID Symposium Digest of Technical Papers | 2008
Martin B. Wolk; Sergey A. Lamansky; William A. Tolbert
We have developed Laser Induced Thermal Imaging (LITI) as a high resolution patterning method for OLED materials. The process is compatible with high throughput OLED manufacture on large format display glass. OLED devices fabricated using LITI technology have attained a level of performance that is acceptable for commercial applications.
Archive | 1997
Jeffrey C. Chang; John S. Staral; William A. Tolbert; Martin B. Wolk; Claire A. Jalbert; Hsin-Hsin Chou
Archive | 1997
Thomas A. Isberg; Claire A. Jalbert; John S. Staral; William A. Tolbert; Martin B. Wolk
Archive | 2007
John E. Potts; Fred B. McCormick; Martin B. Wolk; Jun-Ying Zhang; Terry L. Smith; James M. Battiato; Ding Wang; William A. Tolbert; Mark A. Roehrig; Clark I. Bright
Archive | 1996
John S. Staral; Claire A. Jalbert; William A. Tolbert; Martin B. Wolk; Allan R. Martens; Thomas A. Isberg
Archive | 1996
John S. Staral; William A. Tolbert; Hsin Hsin Chou; Wu Shyong Li
Archive | 2009
Martin Kristoffersen; Rolf W. Biernath; Thomas R. J. Corrigan; David G. Freier; Raymond P. Johnston; Michael A. Meis; Kenneth A. P. Meyer; Vadim N. Savvateev; William A. Tolbert; Phillip E. Tuma
Archive | 2008
Robin E. Wright; Khanh T. Huynh; Leslie A. Kreilich; Lan H. Liu; Rachel K. Swanson; Richard L. Walter; Martin B. Wolk; Stephen A. Johnson; William A. Tolbert
Archive | 2006
William A. Tolbert; James M. Nelson; Thomas A. Isberg; Andrew L. Hightower; Dean Faklis