William Brown Farnham

Single layer fluropolymer resists for 157-nm lithography

We have developed a family of 157 nm resists that utilize fluorinated terpolymer resins composed of 1) tetrafluoroethylene (TFE), 2) a norbornene fluoroalcohol (NBFOH), and 3) t-butyl acrylate (t-BA). TFE incorporation reduces optical absorbance at 157 nm, while the presence of a norbornene functionalized with hexafluoroisopropanol groups contributes to aqueous base (developer) solubility and etch resistance. The t-butyl acrylate is the acid-catalyzed deprotection switch that provides the necessary contrast for high resolution 157 nm imaging. 157 nm optical absorbances of these resists depend strongly upon the amount of t-BA in the polymers, with the TFE/NBFOH dipolymers (which do not contain t-BA) exhibiting an absorbance lower than 0.6 μm-1. The presence of greater amounts of t-BA increases the absorbance, but also enhances the dissolution rate of the polymer after deprotection, yielding higher resist contrast. Formulated resists based upon these fluorinated terpolymer resins have been imaged at International Sematech, using the 157 nm Exitech microstepper with either 0.6 NA or 0.85 NA optics. We have carefully explored the relationship between imaging performance, resist contrast, optical absorbance, and t-BA content of these terpolymer resist resins, and describe those results in this contribution.

High chi polymer development for DSA applications using RAFT technology

Directed self-assembly (DSA) of block copolymers is proving to be an interesting and innovative method to make three-dimensional periodic, uniform patterns useful in a variety of microelectronics applications. Attributes critical to acceptable DSA performance of block copolymers include molecular weight uniformity, final purity, and reproducibility in all the steps involved in producing the polymers. Reversible Addition Fragmentation Chain Transfer (RAFT) polymerization technology enables the production of such materials provided that careful process monitoring and compositional homogeneity measurement systems are employed. It is uniquely suited to construction of multiblocks with components of widely divergent surface energies and functionality. We describe a high chi diblock system comprising partially fluorinated methacrylates and substituted styrenics. While special new polymer separation strategies involving controlled polymer particle assembly in liquid media are required for some monomer systems and molecular weight regimes, we have been able to demonstrate high yield and compositionally homogeneous diblocks of lamellar and cylindrical morphology with polydispersities < 1.1. During purification processes, these diblock materials undergo assembly processes in liquid media, and with appropriate controls, this allows for removal of soluble homopolymer contaminants. SAXS analyses of solid polymer samples provide estimates of lamellar d-spacing, and a good correlation with molecular weight is shown. This system will be described.