William F. Egelhoff
National Institute of Standards and Technology
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Featured researches published by William F. Egelhoff.
Physical Review B | 2004
G. T. Woods; R. J. Soulen; I. I. Mazin; B. Nadgorny; M. S. Osofsky; J. Sanders; Hariharan Srikanth; William F. Egelhoff; R. Datla
We present a systematic analysis of point-contact Andreev reflection (PCAR) spectra for ferromagnetic materials, using both modeling and experimental data. We emphasize the importance of consistent data analysis to avoid possible misinterpretation of the data. We consider the relationship between ballistic and diffusive transport, the effect of different transport regimes on spin polarization measurements, and the importance of unambiguous identification of the type of transport regime. We find that in a realistic parameter range, the analysis of PCAR spectra of purely diffusive character by a ballistic model yield approximately the same (within
Applied Physics Letters | 2009
Judy J. Cha; J. C. Read; William F. Egelhoff; Pinshane Y. Huang; Hsin-wei Tseng; Yulin Li; R. A. Buhrman; David A. Muller
\ensuremath{\sim}3%
Electrochemical and Solid State Letters | 2004
Jonathan J. Mallett; Erik B. Svedberg; S. Sayan; Alexander J. Shapiro; L. Wielunski; T. E. Madey; William F. Egelhoff; Thomas P. Moffat
) values of the spin polarization and the barrier strength
IEEE Transactions on Magnetics | 2011
Z. Q. Lei; Guijun Li; William F. Egelhoff; P. T. Lai; Philip W. T. Pong
Z
Ultramicroscopy | 2011
D.J. Larson; Ty J. Prosa; Brian P. Geiser; William F. Egelhoff
larger by
Applied Physics Letters | 2008
Ann N. Chiaramonti; Daniel K. Schreiber; William F. Egelhoff; David N. Seidman; Amanda K. Petford-Long
\ensuremath{\sim}0.5--0.6
Journal of The Electrochemical Society | 2008
Jonathan J. Mallett; Erik B. Svedberg; John E. Bonevich; Alexander J. Shapiro; William F. Egelhoff; Thomas P. Moffat
. We also consider the dependence of polarization values on
IEEE Transactions on Magnetics | 2005
James O. Rantschler; Brian B. Maranville; Jonathan J. Mallett; Peijei Chen; Robert D. McMichael; William F. Egelhoff
Z
Applied Physics Letters | 2001
Manuel Muñoz; G. G. Qian; N. Karar; Hao Cheng; I. G. Saveliev; Nicolás García García; Thomas P. Moffat; P. J. Chen; L. Gan; William F. Egelhoff
, and have shown by simple modeling that letting the superconducting gap vary as an adjustable parameter can result in a spurious dependence of the spin-polarization
Journal of The Electrochemical Society | 2006
Erik B. Svedberg; Jonathan J. Mallett; L. A. Bendersky; A. G. Roy; William F. Egelhoff; Thomas P. Moffat
{P}_{c}