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Dive into the research topics where William F. Egelhoff is active.

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Featured researches published by William F. Egelhoff.


Physical Review B | 2004

Analysis of point-contact Andreev reflection spectra in spin polarization measurements

G. T. Woods; R. J. Soulen; I. I. Mazin; B. Nadgorny; M. S. Osofsky; J. Sanders; Hariharan Srikanth; William F. Egelhoff; R. Datla

We present a systematic analysis of point-contact Andreev reflection (PCAR) spectra for ferromagnetic materials, using both modeling and experimental data. We emphasize the importance of consistent data analysis to avoid possible misinterpretation of the data. We consider the relationship between ballistic and diffusive transport, the effect of different transport regimes on spin polarization measurements, and the importance of unambiguous identification of the type of transport regime. We find that in a realistic parameter range, the analysis of PCAR spectra of purely diffusive character by a ballistic model yield approximately the same (within


Applied Physics Letters | 2009

Atomic-scale spectroscopic imaging of CoFeB/Mg–B–O/CoFeB magnetic tunnel junctions

Judy J. Cha; J. C. Read; William F. Egelhoff; Pinshane Y. Huang; Hsin-wei Tseng; Yulin Li; R. A. Buhrman; David A. Muller

\ensuremath{\sim}3%


Electrochemical and Solid State Letters | 2004

Compositional Control in Electrodeposition of FePt Films

Jonathan J. Mallett; Erik B. Svedberg; S. Sayan; Alexander J. Shapiro; L. Wielunski; T. E. Madey; William F. Egelhoff; Thomas P. Moffat

) values of the spin polarization and the barrier strength


IEEE Transactions on Magnetics | 2011

Review of Noise Sources in Magnetic Tunnel Junction Sensors

Z. Q. Lei; Guijun Li; William F. Egelhoff; P. T. Lai; Philip W. T. Pong

Z


Ultramicroscopy | 2011

Effect of analysis direction on the measurement of interfacial mixing in thin metal layers with atom probe tomography.

D.J. Larson; Ty J. Prosa; Brian P. Geiser; William F. Egelhoff

larger by


Applied Physics Letters | 2008

Effects of annealing on local composition and electrical transport correlations in MgO-based magnetic tunnel junctions

Ann N. Chiaramonti; Daniel K. Schreiber; William F. Egelhoff; David N. Seidman; Amanda K. Petford-Long

\ensuremath{\sim}0.5--0.6


Journal of The Electrochemical Society | 2008

Compositional Control in Electrodeposited Ni x Pt1 − x Films

Jonathan J. Mallett; Erik B. Svedberg; John E. Bonevich; Alexander J. Shapiro; William F. Egelhoff; Thomas P. Moffat

. We also consider the dependence of polarization values on


IEEE Transactions on Magnetics | 2005

Damping at normal metal/permalloy interfaces

James O. Rantschler; Brian B. Maranville; Jonathan J. Mallett; Peijei Chen; Robert D. McMichael; William F. Egelhoff

Z


Applied Physics Letters | 2001

Ballistic magnetoresistance in a nanocontact between a Ni cluster and a magnetic thin film

Manuel Muñoz; G. G. Qian; N. Karar; Hao Cheng; I. G. Saveliev; Nicolás García García; Thomas P. Moffat; P. J. Chen; L. Gan; William F. Egelhoff

, and have shown by simple modeling that letting the superconducting gap vary as an adjustable parameter can result in a spurious dependence of the spin-polarization


Journal of The Electrochemical Society | 2006

A Structural Study of Electrodeposited Fe on n-GaAs ( 001 )

Erik B. Svedberg; Jonathan J. Mallett; L. A. Bendersky; A. G. Roy; William F. Egelhoff; Thomas P. Moffat

{P}_{c}

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Jonathan J. Mallett

National Institute of Standards and Technology

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Thomas P. Moffat

National Institute of Standards and Technology

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Alexander J. Shapiro

National Institute of Standards and Technology

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Robert D. McMichael

National Institute of Standards and Technology

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John E. Bonevich

National Institute of Standards and Technology

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Mark D. Vaudin

National Institute of Standards and Technology

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P. J. Chen

National Institute of Standards and Technology

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Guijun Li

Hong Kong Polytechnic University

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