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Dive into the research topics where Wolfram Schillinger is active.

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Featured researches published by Wolfram Schillinger.


Intermetallics | 2001

Micromechanical mechanism of texture formation in γ-TiAl

Arno Bartels; Wolfram Schillinger

Abstract Texture evolution in TiAl depends on the type of deformation such as uniaxial compression, tension or rolling as well as on the initial microstructure. Cast TiAl shows a lamellar microstructure with an alignment of the lamellae and exhibits a strong texture. Deformation parallel to the aligned lamellae results in a plane-strain deformation which leads to a brass type texture. From room temperature up to 700 °C, compression tests of TiAl specimens with equiaxed microstructures result in -fiber textures where the component is shifted to . At higher temperatures the orientation is caused by dynamic recrystallization. In rolled sheets of TiAl with equiaxed microstructure the main texture component is a modified cube texture {100} where the tetragonal c-axis is aligned in transverse direction of the sheet. This texture component is caused by dynamic recrystallization and appears to be stable against further rolling.


Zeitschrift Fur Metallkunde | 2002

Strain Rate Dependence of the Deformation Mechanisms in a Fully Lamellar γ-TiAl-Based Alloy

Arno Bartels; Helmut Clemens; Gerhard Dehm; Erhardt Lach; Wolfram Schillinger

Abstract The intention of this study was to investigate the mechanical properties of an engineering γ-TiAl-based alloy with fully lamellar microstructure under quasistatic and dynamic compression at room temperature and strain rates ranging from 5.0 × 10-3 s−1 to 4.0 × 103 s−1. The microstructure of undeformed and deformed specimens was investigated by means of optical and electron microscopy. The results of the compression tests exhibit a slight strain rate sensitivity of the postyield stress. The fracture behavior of the studied γ-TiAl alloy strongly depends on the applied strain rates. Transmission electron microscopy observations conducted on deformed specimens revealed the existence of a high number of tangled ordinary dislocations, curved superdislocations and mechanical twins. The analysis of the deformation texture confirms the high activity of superdislocations and mechanical twinning during dynamic compression testing.


Intermetallics | 2002

Microstructural stability and creep behavior of a lamellar γ-TiAl based alloy with extremely fine lamellar spacing

Wolfram Schillinger; Helmut Clemens; Gerhard Dehm; Arno Bartels


Intermetallics | 2006

Texture evolution of the γ- and the α/α2-phase during hot rolling of γ-TiAl based alloys

Wolfram Schillinger; Arno Bartels; Rainer Gerling; Frank Peter Schimansky; Helmut Clemens


Materials Science and Engineering A-structural Materials Properties Microstructure and Processing | 2002

Anisotropic mechanical behavior of textured γ-TiAl caused by the directionality of twinning

Wolfram Schillinger; Björn Lorenzen; Arno Bartels


MRS Proceedings | 2000

Creep Behavior and Microstructural Stability of Lamellar γ-T1AI (Cr, Mo, Si, B) with Extremely Fine Lamellar Spacing

Wolfram Schillinger; Dezhi Zhang; Gerhard Dehm; Arno Bartels; Helmut Clemens


Archive | 2006

Mechanical Anisotropy in Textured Sheets of γ‐TiAl

Wolfram Schillinger; Arno Bartels; Kyosuke Kishida


High-Temperature Ordered Intermetallic Alloys IX | 2001

Creep behavior and microstructural stability of lamellar γ-TiAl (Cr, Mo, Si, B) with extremely fine lamellar spacing

Wolfram Schillinger; D. Zhang; Gerhard Dehm; H. Clemens


Archive | 2002

Dedicated to Professor Dr. mont. Karl Leopold Maurer on the occasion of his 75th birthday

Arno Bartels; Helmut Clemens; Gerhard Dehm; Erhardt Lach; Wolfram Schillinger


Archive | 2002

Vorrichtung und Verfahren zur quantitativen Analyse der Verteilung der kristallographischen Orientierung von Kristalliten in einem Polykristall mit Hilfe von Röntgenstrahlen Apparatus and method for the quantitative analysis of the distribution of the crystallographic orientation of crystallites in a polycrystalline using X-rays

Rüdiger Prof. Dr. Bormann; Björn Lorenzen; Wolfram Schillinger

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Arno Bartels

Hamburg University of Technology

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D. Zhang

Hamburg University of Technology

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Rainer Gerling

Hamburg University of Technology

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