Wu Aihua

Research on the Verification Method of the Agilent B1505A Semiconductor Device Analyzer

Verification schemes for parameters of semiconductor analyzers, including high voltage and low current, are proposed. As a typical model of the new-generation high-performance semi-conductor analyzer, setup structure and working principals of B1505A is studied. Software for auto verification is coded based on B1505A. Uncertainty analysis confirms the authenticity of results from B1505A. Our work provides an approach for verifying high-performance semiconductor analyzers.

Ways to Improve Temperature Measurement Accuracy of InfraScope Thermal Mapper

In this paper we discuss the ways to improve the accuracy of InfraScope Thermal Mapper. We demonstrate the theory about space resolution and how it influences the temperature measurement using InfraScope Thermal Mapper. Then a way to enhance the accuracy by choosing the space resolution adequately is presented. Some experiments are designed and the results prove the way is effective. Then we study on the basic structures and work procedures of this instrument, combining with theory analysis we conclude an efficient emissivity measurement method. Following which we can measure emissivity at a single temperature. Then we analyze errors brought in by this method in emissivity calculation procedure, deliberately propose ways to improve on the measurement accuracy. At last, we verify the improvement by precise experiments.

Evaluation on uncertainty of noise parameter against commercial measurement

This paper starts the work of evaluation on uncertainty of noise parameters against commercial measurement system built by PNA-X VAN from Agilent and Tuner from Maury, analyzes the input and output data of the measurement system, builds measurement model, designs the method of uncertainty evaluation that can meet requirement of international standard ISO/IEC98-3, develops simulation software and gets four uncertainty data of noise parameter. Through the comparing measurement with same type of system from Agilent and Tsinghua University, it is proved that the uncertainty evaluation data is reasonable and valid.