Xin-Guang Wu

MICROWAVE DIELECTRIC PROPERTIES AND RAMAN SPECTROSCOPY OF SCHEELITE SOLID SOLUTION [(Li0.5Bi0.5)1-xCax]MoO4 CERAMICS WITH ULTRA-LOW SINTERING TEMPERATURES

A Scheelite solid solution was formed based on [(Li0.5Bi0.5)1-xCax]MoO4 ceramics and prepared via a solid state reaction method in the range 0.0 ≤ x ≤ 1.0. High performance microwave dielectric properties were obtained in the [(Li0.5Bi0.5)0.15Ca0.85]MoO4 ceramic sintered at 760°C with a relative permittivity of 14.1, a Qf value of 24,000 GHz (at 10.0 GHz), and a temperature coefficient value of +10.7 ppm/°C and the [(Li0.5Bi0.5)0.1Ca0.9]MoO4 ceramic sintered at 850°C with a relative permittivity of 12.7, a Qf value of 41,300 GHz (at 10.3 GHz), and a temperature coefficient value of -16.5 ppm/°C. X-ray diffraction, Raman spectroscopy and the classical damped oscillator model were applied to study the relationship between the microwave dielectric properties and structures.