Xiongyao Wang

Silicon nanocrystals on bottle resonators: Mode structure, loss mechanisms and emission dynamics

Bottle resonators can support high Q-factor whispering gallery modes (WGMs) and demonstrate a rich mode spectrum. Resonators were fabricated using a fiber tapering apparatus and were coated with a thin, smooth layer of luminescent silicon nanocrystals. The photoluminescence spectrum showed WGM peaks with Q-factors near 2,500; however, evanescent measurements showed that these modes are a composite of many modes with Q-factors exceeding 106, the highest yet seen for a silicon-nanocrystalcoated microresonators. The mode structure showed strong polarization and sensitivity to position within the bottle resonator. An analysis of loss mechanisms establishes surface roughness scattering as the limiting factor in these nanocrystal-coated bottle resonators in the absence of excited carriers.

A convenient method for electron tomography sample preparation using a focused ion beam

Here we report a new sample preparation method for three‐dimensional electron tomography. The method uses the standard film deposition and focused ion beam (FIB) methods to significantly reduce the problems arising from the projected sample thickness at high tilt angles. The method can be used to prepare tomography samples that can be imaged up to a ±75° tilt range which is sufficient for many practical applications. The method can minimize the problem of Ga+ contamination, as compared to the case of FIB preparation of rod‐shaped samples, and provides extended thin regions for standard 2D projection analyses. Microsc. Res. Tech. 75:1165–1169, 2012.