Xuecheng Du

Measurement of single event effects induced by alpha particles in the Xilinx Zynq-7010 System-on-Chip

ABSTRACT Single event effect susceptibility of the Xilinx Zynq-7010 System-on-Chip (SoC) was investigated. Seven hardware blocks in the Zynq-7010 SoC were tested for single event effects using americium-241 alpha radiation source. Four error types, data error, single event upset and functional interrupt events, time-out, and system halt, were observed in different blocks under test. The dynamic cross sections of the different blocks were obtained and the reasons of some critical error types were analyzed.

Design and simulation of SET and radiation-harden on DPLL

This paper presents the work mechanism of digital phase locked loop(DPLL). DPLL module has been designed using Verilog language. Moreover, DPLL has been simulated and verified based on Questasim software. For each module of DPLL, fault injection tests have been performed by selecting different simulation times and injecting the different pulse widths of single event transient(SET). Furthermore, Divide N counter module has been discovered was the most sensitive part based on the simulation results and analyses. In addition, radiation-harden module on divide N counter has been designed and tested, the tests have evidenced the radiation-harden module is effective.

Studies on the Responses of CR-39 Detector to C3+, O3+, and Proton Irradiations

In the present study, CR-39 detectors with thickness of 1.0mm are irradiated respectively by C3+(10MeV, 20MeV, 20MeV), O3+(10MeV, 20MeV, 30MeV) particles and protons (5MeV) with ion fluences ranging from 1.0×107cm−2 to 5.0×109cm−2. The etching time conditions of the latent tracks for the different irradiation particles with different fluences described above are experimental studied. The curves for track density distributions with irradiation fluences of different energy particles are simulated. The suggested irradiation fluences ranges for the three types of particles detected with CR-39 detector are offered according to the measurement results.Copyright