Yaobo Pan

Polarization of edge emission from III-nitride light emitting diodes of emission wavelength from 395to455nm

Polarization-resolved edge-emitting electroluminescence of InGaN∕GaN multiple quantum well (MQW) light emitting diodes (LEDs) from 395to455nm was measured. Polarization ratio decreased from 3.2 of near-ultraviolet LEDs (395nm) to 1.9 of blue LEDs (455nm). Based on TE mode dominant emissions in InGaN∕GaN MQWs, compressive strain in well region favors TE mode, indium induced quantum-dot-like behavior leads to an increased TM component. As wavelength increased, indium enhanced quantum-dot-like behavior became obvious and E‖C electroluminescence signal increased thus lower polarization ratio. Electroluminescence spectrum shifts confirmed that quantum dotlike behaviors rather than strain might be dominant in modifying luminescence mode of InGaN∕GaN MQWs from near ultraviolet to blue.

Modified transmission line model to investigate non-Ohmic contact behavior and its application on GaN

In this article we proposed a modified transmission line model method to analyze non-Ohmic contact. It can differentiate the contact resistance while the current flows into and out of the contact. When the earlier two factors are equal, this method degenerate to traditional method. By this method, we obtained contact parameters for both p-GaN and n-GaN and revealed the validity of this method. To further study the contact characteristics and transportation mechanism between alloyed Ni/Au and p-GaN, we also measured barrier information at different temperature and current. The result indicates the hole passes through the barrier by thermionic emission and the barrier may lowered by image force.