Yaqiong Fu

Measurement and Error Analysis on Embed Heat Flux Sensor

The basic principle of embed-in-wall heat flux sensor as well as its structure and manufacturing are introduced in this paper. And the flux distribution of embed-in-wall heat flux sensor and its deviation are analyzed. The concept of isolation layer is proposed. The introduction of isolation layer has important significance to improve the measurement accuracy of heat flux sensor.

The Infrared Flash Thermography Nondestructive Testing for the Defect in Steel Products Based on Finite Element Method

The infrared non-destructive testing (NDT) is widely applied in inspecting inner defects of different products as the development of infrared technology. In this paper, by establishing model of the steel product with different defects, the three dimensional heat conduction behavior simulation of Infrared Flash Thermography to detect blowhole defects in the steel products is carried out by using finite element analysis software ANSYS. Then, the surface temperature distribution is calculated and cloud maps of the surface temperature can be obtained in heating and cooling processing. The emphasis is placed on the relationship between the ratio of width to depth (L/H) and the surface temperature characteristic. The work is valuable for analyzing blowhole defects in the steel products qualitatively and semi-quantitatively.

The Application of Epsilon-SVR in Infrared Temperature Demarcating

A ε - SVR (ε -Support Vector Regression) based modeling method is introduced to process data acquired from infrared temperature demarcating experiment. In the process of the temperature of black body ranging from 30 to 72, 22 groups of samples are acquired, which include 17 groups of training samples and 5 groups of forecasting samples. The fitting curves are got through training samples and forecasting samples under MATLAB. Compared with traditional method of least square, the precision of this method is far higher. In conclusion, the method of ε -SVR can become a method of data processing to infrared temperature demarcating.