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Dive into the research topics where Yasemin Şafak is active.

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Featured researches published by Yasemin Şafak.


Microelectronics Reliability | 2011

Electrical characterization of MS and MIS structures on AlGaN/AlN/GaN heterostructures

Engin Arslan; Serkan Butun; Yasemin Şafak; Habibe Uslu; İlke Taşçıoğlu; Ş. Altındal; Ekmel Ozbay

The forward and reverse bias I–V, C–V, and G/x–V characteristics of (Ni/Au) Schottky barrier diodes (SBDs) on the Al0.22Ga0.78N/AlN/GaN high-electron-mobility-transistor (HEMTs) without and with SiNx insulator layer were measured at room temperature in order to investigate the effects of the insulator layer (SiNx) on the main electrical parameters such as the ideality factor (n), zero-bias barrier height (UB0), series resistance (Rs), interface-state density (Nss). The energy density distribution profiles of the Nss were obtained from the forward bias I–V characteristics by taking into account the voltage dependence of the effective barrier height (Ue) and ideality factor (nV) of devices. In addition, the Nss as a function of Ec–Ess was determined from the low-high frequency capacitance methods. It was found that the values of Nss and Rs in SBD HEMTs decreases with increasing insulator layer thickness.


Journal of Applied Physics | 2012

On the energy distribution of interface states and their relaxation time profiles in Al/pentacene/p-GaAs heterojunction diode

Yasemin Şafak; M. Soylu; F. Yakuphanoglu; Ş. Altındal

The energy density distribution profile of the interface states (Nss) and their relaxation time (τ) of Al/pentacene/p-GaAs heterojunction diodes were obtained from the admittance spectroscopy method, which is included in capacitance/conductance-voltage measurements in the frequency range of 10 kHz-1 MHz at room temperature. The values of Nss were also obtained from the forward bias current-voltage measurements by taking into account voltage-dependent barrier height, and the results were compared with those obtained using admittance method. The values of Nss and τ obtained from admittance measurements range from 1.53 × 1011 eV–1 cm–2 and 1.33 µs in (0.596-Ev) eV to 1.90 × 1011 eV–1 cm–2 and 8.18 µs in (0.673-Ev) eV, respectively. In addition, the values of Nss were obtained using Hill-Coleman method as a function of frequency. The values of Nss obtained from these three methods are in the same order and in good agreement with one another. Low values of Nss can be attributed to the interfacial pentacene lay...


Journal of Non-crystalline Solids | 2010

Temperature dependent negative capacitance behavior in (Ni/Au)/AlGaN/AlN/GaN heterostructures

Engin Arslan; Yasemin Şafak; Ş. Altındal; Özgür Kelekçi; Ekmel Ozbay


Current Applied Physics | 2010

Current–voltage characteristics of Al/Rhodamine-101/n-GaAs structures in the wide temperature range

Ö. Vural; Yasemin Şafak; Ş. Altındal; A. Türüt


Journal of Alloys and Compounds | 2012

Temperature dependent negative capacitance behavior of Al/rhodamine-101/n-GaAs Schottky barrier diodes and Rs effects on the C–V and G/ω–V characteristics

Özkan Vural; Yasemin Şafak; A. Türüt; Ş. Altındal


Microelectronic Engineering | 2010

Frequency and temperature dependence of the dielectric and AC electrical conductivity in (Ni/Au)/AlGaN/AlN/GaN heterostructures

Engin Arslan; Yasemin Şafak; İlke Taşçıoğlu; Habibe Uslu; Ekmel Ozbay


Journal of Electronic Materials | 2010

Investigation of Trap States in AlInN/AlN/GaN Heterostructures by Frequency-Dependent Admittance Analysis

Engin Arslan; Serkan Butun; Yasemin Şafak; Ekmel Ozbay


Microelectronics Reliability | 2011

Current transport mechanisms and trap state investigations in (Ni/Au)-AlN/GaN Schottky barrier diodes

Engin Arslan; Serkan Butun; Yasemin Şafak; Hüseyin Altuğ Çakmak; Hongbo Yu; Ekmel Ozbay


Surface and Interface Analysis | 2010

The effect of insulator layer thickness on the main electrical parameters in (Ni/Au)/AlxGa1−xN/AlN/GaN heterostructures

Ş. Altındal; Yasemin Şafak; İlke Taşçıoğlu; Ekmel Ozbay


Archive | 2010

Frequency dependent electrical characteristics of (Ni/Au)/AlGaN/AlN/GaN heterostructures

Habibe Uslu; Yasemin Şafak; Ekmel Ozbay

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Serkan Butun

Northwestern University

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A. Türüt

Istanbul Medeniyet University

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