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Featured researches published by Yasuaki Tanimura.


conference of the industrial electronics society | 1990

Identifying solder surface orientation from color highlight images

Shigeki Kobayashi; Yasuaki Tanimura; Teruhisa Yotsuya

As an attempt to obtain effective machine vision of solder joints, the authors describe a surface slant estimation technique which presents a color highlight map of a solder joint surface partitioned with colored regions. The imaging geometry consists of a single camera placed along the z axis and three circular sources of different elevations with respective colors of red, green, and blue. The concept of this approach is derived from a consideration of the surface tension which acts primarily in solder shape formation and also from a consideration of the relation between the surface normal and the wettability and volume of solder applied. Implementation of the technique has demonstrated its practical applicability to automatic inspection of wave- or reflow-soldered printed circuit boards (PCBs) inserted or mounted with a variety of component parts.<<ETX>>


Archive | 1989

Apparatus for inspecting printed circuit boards and the like, and method of operating same

Shigeki Kobayashi; Yasuaki Tanimura; Teruhisa Yotsuya


Archive | 1989

Substrate examining apparatus and method of operating same

Shigeki Kobayashi; Yasuaki Tanimura; Teruhisa Yotsuya


Archive | 1988

Curved surface nature inspection device

Shigeki Kobayashi; Yasuaki Tanimura; Teruhisa Yotsuya


Archive | 1988

Method for displaying inspection result in substrate inspection device

Shigeki Kobayashi; Yasuaki Tanimura


Archive | 1988

Inspection region setting method in board inspection apparatus

Shigeki Kobayashi; Yasuaki Tanimura


Archive | 1976

Detector of minute picture information

Tokuo Iwasaki; Shigeki Kobayashi; Yasuaki Tanimura


Archive | 1989

Vorrichtung zum Prüfen von Leiterplatten An apparatus for testing circuit boards

Shigeki Kobayashi; Yasuaki Tanimura; Teruhisa Yotsuya


Archive | 1988

Appareil pour inspecter un dispositif électronique fini

Shigeki Kobayashi; Teruhisa Omron Tateisi Yotsuya; Yasuaki Tanimura


Archive | 1988

Apparat zum Untersuchen einer bestückten elektronischen Vorrichtung. Apparatus for inspecting a packaged electronic device.

Shigeki Omron Tateis Kobayashi; Teruhisa Omron Tateisi Yotsuya; Yasuaki Tanimura

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