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Dive into the research topics where Yasuhiro Fukuda is active.

Publication


Featured researches published by Yasuhiro Fukuda.


electrical overstress/electrostatic discharge symposium | 2004

ESD protection design using a mixed-mode simulation for advanced devices

Hirokazu Hayashi; Toshikazu Kuroda; Katsuhiro Kato; Koichi Fukuda; Shunsuke Baba; Yasuhiro Fukuda

In this paper, we propose a new ESD protection design methodology using a mixed-mode ESD simulation that takes account of a coupling effect for both device and circuit. As a result, we can analysis the each protection unit operation and select the optimized protection circuits in prevention of ESD failure on separated power supply units by prediction of the simulation.


Archive | 1997

Transistor protection circuit

Shinnichi Oki Electric Ind. Co. Ltd. Fukuzako; Yasuhiro Fukuda


Archive | 1989

Method of and apparatus for testing semiconductor device for electrostatic discharge damage

Yasuhiro Fukuda


Archive | 1998

Electrostatic damage protection circuit and dynamic random access memory

Katsuhiro Kato; Yasuhiro Fukuda


Archive | 1984

Method and apparatus for examining electrostatic discharge damage to semiconductor devices

Yasuhiro Fukuda; Ikuo Suganuma


Archive | 1995

Semiconductor device having a multi-layered conductive structure which includes an aluminum alloy layer, a high melting temperature metal layer, and a high melting temperature nitride layer

Makiko Nakamura; Yasuhiro Fukuda; Yasuyuki Tatara; Yusuke Harada; Hiroshi Onoda


Archive | 1990

Structure of a semiconductor chip having a conductive layer

Yasuhiro Fukuda; Tetsuhiko Sugahara; Norio Hirashita; Mitsuhiro Matsuo; Minoru Saito; Masayuki Kobayakawa; Fumitaka Yokoyama


Archive | 2006

Electro-static discharge protection circuit and semiconductor device having the same

Toshikazu Kuroda; Hirokazau Hayashi; Yasuhiro Fukuda


Archive | 1996

Semiconductor device having multi-layered metalization and method of manufacturing the same

Makiko Nakamura; Yasuhiro Fukuda; Yasuyuki Tatara; Yusuke Harada; Hiroshi Onoda


Archive | 2003

Electrostatic breakdown preventing circuit for semiconductor device

Yasuhiro Fukuda

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