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Dive into the research topics where Yasuhiro Ueda is active.

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Featured researches published by Yasuhiro Ueda.


international symposium on visual computing | 2008

High Resolution and High Dynamic Range Image Reconstruction from Differently Exposed Images

Hiroyuki Nakai; Shuhei Yamamoto; Yasuhiro Ueda; Yoshihide Shigeyama

In this research, we propose a method to reconstruct image of high resolution and high dynamic range from small number of low resolution images with some saturated pixels. In this method the low resolution images are captured with different exposure times and at different positions and the high resolution image is created with reconstruction based super resolution processing. The position of the CCD sensor in the camera is controlled by a piezo actuator and at each capturing position the exposure time is also controlled in specific arrangement. And in the reconstruction method a high resolution image is recursively updated by comparing simulated low resolution images which are created from high resolution image with assumed optical degradation and its exposure time and the captured images. In this paper we first describe how to capture the low resolution images and how to create high resolution image from images which have some saturated pixels and next show the evaluation of the result image created from real captured images.


Proceedings of SPIE | 2010

Image deblurring and denoising with non-local regularization constraint

Peter van Beek; Junlan Yang; Shuhei Yamamoto; Yasuhiro Ueda

In this paper, we investigate the use of the non-local means (NLM) denoising approach in the context of image deblurring and restoration. We propose a novel deblurring approach that utilizes a non-local regularization constraint. Our interest in the NLM principle is its potential to suppress noise while effectively preserving edges and texture detail. Our approach leads to an iterative cost function minimization algorithm, similar to common deblurring methods, but incorporating update terms due to the non-local regularization constraint. The dataadaptive noise suppression weights in the regularization term are updated and improved at each iteration, based on the partially denoised and deblurred result. We compare our proposed algorithm to conventional deblurring methods, including deblurring with total variation (TV) regularization. We also compare our algorithm to combinations of the NLM-based filter followed by conventional deblurring methods. Our initial experimental results demonstrate that the use of NLM-based filtering and regularization seems beneficial in the context of image deblurring, reducing the risk of over-smoothing or suppression of texture detail, while suppressing noise. Furthermore, the proposed deblurring algorithm with non-local regularization outperforms other methods, such as deblurring with TV regularization or separate NLM-based denoising followed by deblurring.


Archive | 2008

Super-Resolution Imaging for Automatic Visual Inspection Systems

Hiroyuki Nakai; Yasuhiro Ueda; Yoshihide Shigeyama

The purpose of this research is to apply super-resolution processing to defect inspections in order to automate such inspections and increase their precision. Super-resolution processing, which is a method that creates a high-resolution image from multiple low-resolution images, could be an effective solution in environments where images of sufficient resolution cannot be obtained. However, reduction of noise in the generated images is necessary in order to conduct inspections reliably. Therefore, in this paper, we propose a noise reduction method for super-resolution processing, and then report on the defect inspection performance when this super-resolution processing is implemented.


Machine vision and its optomechatronic applications. Conference | 2004

Conceptual framework design for integrated visual inspection system

Yasuhiro Ueda; Shuhei Yamamoto; Tamon Iden; Masakazu Yanase; Yoshihide Shigeyama; Atsuyoshi Nakamura

This paper describes a framework for automatic generation of an image processing algorithm that consists of preprocessing, feature extraction, classification and algorithm evaluation modules based on machine learning. With a view to applying the generated algorithm to industrial visual inspection system, we intend to offer a framework model equipped with the below-mentioned features. Also, we want to report on the experimental result of the offered model. 1.Automatically generate by machine learning an image processing algorithm to extract regions that have same characteristics as specified by users. 2.Generate in particular a high-precision image processing algorithm, improving the level of statistical separation between true and false defects that may cause a deterioration factor in classification accuracy. 3.Optimize an image improving filter sequence in preprocessing modules by means of GA (Genetic Algorithm).


Archive | 2010

Defect inspection method and defect inspection device for display panel

Naoki Matsumoto; Naoki Yoshimoto; Yasuhiro Ueda; Shota Ueki; Hidenobu Nakanishi


Archive | 2008

APPARATUS, METHOD, AND PROGRAM FOR DEFECT DETECTION AND RECORDING MEDIUM

Takeshi Murakami; Hiroyuki Nakai; Yasuhiro Ueda; 泰広 上田; 博之 中井; 豪 村上


Ieej Transactions on Electronics, Information and Systems | 2010

Super-resolved Imaging in Quantization by Using Piecewise Histogram Equalization

Takayuki Fujiwara; Hiroki Watanabe; Hiroyasu Koshimizu; Yasuhiro Ueda; Yoshihide Shigeyama; Atsuyoshi Nakamura


Archive | 2012

DISPLAY-PANEL INSPECTION METHOD, AND METHOD FOR FABRICATING DISPLAY DEVICE

Naoki Yoshimoto; Naoki Matsumoto; Shota Ueki; Hidenobu Nakanishi; Yasuhiro Ueda


Archive | 2010

Evaluation device, calibration method, calibration program, and recording medium

Shota Ueki; 章太 植木; Yasuhiro Ueda; 泰広 上田; Hiroyuki Nakai; 博之 中井


Archive | 2010

Method for inspecting display panel, and method for producing display device

Naoki Yoshimoto; 吉元直樹; Naoki Matsumoto; 松本直基; Shota Ueki; 植木章太; Hidenobu Nakanishi; 中西秀信; Yasuhiro Ueda; 上田泰広

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Hiroyuki Nakai

National Archives and Records Administration

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Yoshihide Shigeyama

National Archives and Records Administration

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Junlan Yang

University of Illinois at Chicago

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