Yasushi Kokubo

Measurement of partial specific thickness (net thickness) of critical-point-dried cultured fibroblast by energy analysis

The relative specimen thickness obtained with an energy analyser is one of the most important parameters in electron microscopy. It has been made clear that this parameter can be applied not only to inorganic specimens, but also to organic and biological specimens. Moreover, the partial specific thickness of a critical-point-dried cultured fibroblast, that is, a net thickness converted in terms of Epon, was calculated from the relative specimen thickness. The partial specific thickness of each domain of the critical-point-dried cultured fibroblast is: CC 0.05 microns, PE 0.14 microns, ED 0.32 microns and PN 0.54 microns. As a result, it is suggested that 27% of the volume of this specimen consists of biological materials.

Thickness dependence of signal/background ratio of inner-shell electron excitation loss in eels

Abstract The influence of the specimen thickness on the core-edge loss intensity has been studied using the relative specimen thickness ( t R ) as the standard rule for the specimen thickness in EELS. The core-edge loss intensity monotonously increased with the increasing relative specimen thickness, 0 t R ⪷ 1, and monotonously decreased with increasing relative specimen thickness, t R ⪸ 1, behind the maximum of core-edge intensity at t R ≅ 1. “Optimum specimen thickness” to get the highest core-edge intensity is suggested for the thickness of t R = 1. The thickness-dependent factor T ( t R ) should be considered in a practical measurement in EELS.

Construction of an energy filter for 200 kV CTEM

Abstract An Ω-type energy filter has been fabricated in the column of a JEM-200CX 200 kV CTEM. Energy resolution of 4 eV at 200 kV, and energy dispersions of 2.6 μm/eV at 100 kV and 1.4 μm/eV at 200 kV are obtained. Also, unfiltered and energy-filtered images of aluminium-evaporated film on a carbon microgrid are shown comparatively.

Electron Energy-Loss Spectroscopy in a 400kV Transmission Electron Microscope (TEELS)

Electron energy-loss spectroscopy in the transmission electron microscopy (TEELS) is a powerful technique to investigate the “electron and atom interaction in specimen microareas”. This paper reports some experimental data of TEELS concerning specimen thickness effect and advantages of 400 kV TEM, and introduces newly developed digital processing of EELS spectra, which is a powerful technique to get the information from the specimen materials.