Yong Shim Yoo

Bright visible light emission from graphene

Graphene and related two-dimensional materials are promising candidates for atomically thin, flexible and transparent optoelectronics. In particular, the strong light-matter interaction in graphene has allowed for the development of state-of-the-art photodetectors, optical modulators and plasmonic devices. In addition, electrically biased graphene on SiO2 substrates can be used as a low-efficiency emitter in the mid-infrared range. However, emission in the visible range has remained elusive. Here, we report the observation of bright visible light emission from electrically biased suspended graphene devices. In these devices, heat transport is greatly reduced. Hot electrons (∼2,800 K) therefore become spatially localized at the centre of the graphene layer, resulting in a 1,000-fold enhancement in thermal radiation efficiency. Moreover, strong optical interference between the suspended graphene and substrate can be used to tune the emission spectrum. We also demonstrate the scalability of this technique by realizing arrays of chemical-vapour-deposited graphene light emitters. These results pave the way towards the realization of commercially viable large-scale, atomically thin, flexible and transparent light emitters and displays with low operation voltage and graphene-based on-chip ultrafast optical communications.

Differential two-signal picosecond-pulse coherent anti-Stokes Raman scattering imaging microscopy by using a dual-mode optical parametric oscillator

We propose and demonstrate a novel differential two-signal technique of coherent anti-Stokes Raman scattering (CARS) imaging microscopy using a picosecond (ps) optical parametric oscillator (OPO). By adjusting a Lyot filter inside the cavity, we operated the OPO oscillating in two stable modes separated by a few nanometers. The CARS images generated by the two modes are separated by a spectrograph behind the microscope setup, and their differential image is directly obtained by balanced lock-in detection. The feasibility of the technique is experimentally verified by imaging micrometer-sized polystyrene beads immersed in water.

Simultaneous measurement of emittance, transmittance, and reflectance of semitransparent materials at elevated temperature

A two-substrate method is developed to simultaneously determine emissivity, transmittance, and reflectance of semitransparent materials with a single measurement under the same environment at elevated temperature. The three quantities can be obtained through the emissivities of substrates and the apparent emissivities resulting from the radiance of the sample heated by substrates. The two-substrate method is compared with the conventional method by measuring sapphire samples with various thicknesses, resulting in good agreements for all the samples. The present method will be useful to measure the temperature dependence of optical properties of porous ceramic materials.

Size-of-source Effect and Self-radiation Effect of an Infrared Radiation Thermometer

All radiation thermometers have a size-of-source effect (SSE) and a self-radiation effect (SRE). The SSE,defined as dependence of the detector signal of a radiation thermometer on the diameter of a source, is critically dependent on the wavelength since diffraction is the main cause. In this paper, we have measured the SSE and the SRE of TRT2 (Transfer Radiation Thermometer 2, HEITRONICS) widely used as a transfer standard in low and middle temperature range. At , The radiation temperature difference between the 60 mm diameter blackbody and 10 mm diameter blackbody due to the SSE was estimated to be in low temperature mode () and in middle temperature mode (). In addition, the measured radiation temperature difference of the blackbody due to the SRE was found to be 110 mK when the body temperature change of TRT2 was set at .

Realization of a radiation temperature scale from 0 °C to 232 °C by a thermal infrared thermometer based on a multiple-fixed-point technique

The radiation temperature scale for a pyroelectric detector based thermal infrared thermometer with its spectral response from 8??m to 14??m was realized in the temperature range from 0??C to 232??C by using four fixed-point blackbodies (ice, Ga, In and Sn). The Planck version of the Sakuma?Hattori equation was used to interpolate the scale between the fixed-point temperatures that are corrected by considering a size-of-source effect (SSE). The expanded uncertainties (k?=?2) of the scale were estimated to be 108?mK for ice, 99?mK for Ga, 175?mK for In and 234?mK for Sn.

Spectral responsivity calibration of the reference radiation thermometer at KRISS by using a super-continuum laser-based high-accuracy monochromatic source

We report on the calibration of the relative spectral responsivity of the reference radiation thermometer, model LP4, which is used for the experimental realisation of the international temperature scale of 1990 above 960 °C at the Korea Research Institute of Standards and Science. The relative spectral responsivity of LP4 is measured by using a monochromatic source consisting of a super-continuum laser and a double-grating monochromator. By monitoring the wavelength of the output beam directly with a calibrated wavelength-meter, we achieved a high-accuracy measurement of spectral responsivity with a maximum wavelength error of less than 3 pm, a narrow spectral bandwidth of less than 0.4 nm, and a high dynamic range over 8 decades. We evaluated the contributions of various uncertainty components of the spectral responsivity measurement to the uncertainty of the temperature scale based on a practical estimation approach, which numerically calculates the maximal effects of the variations of each component. As a result, we evaluate the uncertainty contribution from the spectral responsivity measurement to the temperature scale to be less than 64 mK (k = 1) in a range from 660 °C to 2749 °C for the LP4 with a filter at 650 nm.