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Korean Journal of Materials Research | 2010

Characterization of Hydrogen Gas Sensitivity of ZnO Thin Films

Young-Min Kong; Hak-Min Lee; Sung-Bo Huh; Sun-Kwang Kim; Yong-Zoo You; Daeil Kim

ZnO thin films were prepared on a glass substrate by radio frequency (RF) magnetron sputtering without intentional substrate heating and then surfaces of the ZnO films were irradiated with intense electrons in vacuum condition to investigate the effect of electron bombardment on crystallization, surface roughness, morphology and hydrogen gas sensitivity. In XRD pattern, as deposited ZnO films show a higher ZnO (002) peak intensity. However, the peak intensity for ZnO (002) is decreased with increase of electron bombarding energy. Atomic force microscope images show that surface morphology is also dependent on electron bombarding energy. The surface roughness increases due to intense electron bombardment as high as 2.7 nm. The observed optical transmittance means that the films irradiated with intense electron beams at 900 eV show lower transmittance than the others due to their rough surfaces. In addition, ZnO films irradiated by the electron beam at 900 eV show higher hydrogen gas sensitivity than the films that were electron beam irradiated at 450 eV. From XRD pattern and atomic force microscope observations, it is supposed that intense electron bombardment promotes a rough surface due to the intense bombardments and increased gas sensitivity of ZnO films for hydrogen gas. These results suggest that ZnO films irradiated with intense electron beams are promising for practical high performance hydrogen gas sensors.


international forum on strategic technology | 2006

Chromium Nitride Coating by Inductively Coupled Plasma-assisted RF Magnetron Sputtering

Ho-sung Jang; Yu-Sung Kim; Dae-Han Choi; Jae-young Lee; Ji-hye Park; J.I. Choi; Bi-kong Choi; Yong-Zoo You; Hui-Gon Chun; Daeil Kim

Chromium nitride (CrN) films were deposited by using inductively coupled plasma (ICP) assisted RF magnetron sputtering to investigate the effect of substrate bias voltage on the hardness, surface morphology roughness, and crystalline growth on Si(100) substrate. As increasing substrate bias voltage (Vb), surface hardness increased from 5 to 15 GPa. The grain size also increased proportionally as increasing Vb from -30 to -80, while beyond -80 Vb, the grain size was deteriorated by an intense N+ion bombardment.


Materials Chemistry and Physics | 2008

Electrical and optical study of ITO films on glass and polymer substrates prepared by DC magnetron sputtering type negative metal ion beam deposition

Yong-Zoo You; Y.S. Kim; Dong-Hyuk Choi; H.S. Jang; J.H. Lee; Daeil Kim


International Journal of Hydrogen Energy | 2011

Nitride films as protective layers for metallic bipolar plates of polymer electrolyte membrane fuel cell stacks

Byung-Chul Cha; Yong-Zoo You; Sung-Tae Hong; Jun-Ho Kim; Dae-Wook Kim; Byung-Seok Lee; Sun-Kwang Kim


Nuclear Instruments & Methods in Physics Research Section B-beam Interactions With Materials and Atoms | 2007

Growth and characteristics of diamond-like carbon (DLC) films deposited by direct negative carbon ion beam deposition

Daeil Kim; H.S. Jang; Y.S. Kim; Dong-Hyuk Choi; B.K. Choi; J.H. Lee; Yong-Zoo You; Hui-Gon Chun


Vacuum | 2012

Durability of a niobium thin film for bipolar plates in PEMFC

Jun-Ho Kim; Dong-Won Jung; Sun-Kwang Kim; Sung-Tae Hong; Yong-Zoo You; Daeil Kim


Journal of Korean Vacuum Science & Technology | 2002

Plasma - immersion Ion Deposition of Hydrogenated Diamond - like Carbon Films on Dielectric Substrates

K. V. Oskomov; Hui-Gon Chun; Tong-Yul Cho; N. S. Sochugov; Yong-Zoo You


Metallurgical and Materials Transactions A-physical Metallurgy and Materials Science | 1986

A solid-state emf study of the Cu-Cu2O-NiO three-phase equilibrium

Yong-Zoo You; Ker-Chang Hsieh; Y. Austin Chang


한국표면공학회지 | 2003

Pulsed Magnetron Sputtering Deposition of DLC Films

Hui-Gon Chun; Jing-Hyuk Lee; Yong-Zoo You; Yong-Duek Ko; Tong-Yul Cho


Journal of the Korean Society for Heat Treatment | 2012

Effect of Post Deposition Annealing Temperature on the Hydrogen Gas Sensitivity of SnO 2 Thin Films

Yong-Zoo You; S.K. Kim; Young-Jin Lee; Sung-Bo Heo; H.M. Lee; Daeil Kim

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K. V. Oskomov

Russian Academy of Sciences

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N. S. Sochugov

Russian Academy of Sciences

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