Yong-Zoo You
University of Ulsan
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Publication
Featured researches published by Yong-Zoo You.
Korean Journal of Materials Research | 2010
Young-Min Kong; Hak-Min Lee; Sung-Bo Huh; Sun-Kwang Kim; Yong-Zoo You; Daeil Kim
ZnO thin films were prepared on a glass substrate by radio frequency (RF) magnetron sputtering without intentional substrate heating and then surfaces of the ZnO films were irradiated with intense electrons in vacuum condition to investigate the effect of electron bombardment on crystallization, surface roughness, morphology and hydrogen gas sensitivity. In XRD pattern, as deposited ZnO films show a higher ZnO (002) peak intensity. However, the peak intensity for ZnO (002) is decreased with increase of electron bombarding energy. Atomic force microscope images show that surface morphology is also dependent on electron bombarding energy. The surface roughness increases due to intense electron bombardment as high as 2.7 nm. The observed optical transmittance means that the films irradiated with intense electron beams at 900 eV show lower transmittance than the others due to their rough surfaces. In addition, ZnO films irradiated by the electron beam at 900 eV show higher hydrogen gas sensitivity than the films that were electron beam irradiated at 450 eV. From XRD pattern and atomic force microscope observations, it is supposed that intense electron bombardment promotes a rough surface due to the intense bombardments and increased gas sensitivity of ZnO films for hydrogen gas. These results suggest that ZnO films irradiated with intense electron beams are promising for practical high performance hydrogen gas sensors.
international forum on strategic technology | 2006
Ho-sung Jang; Yu-Sung Kim; Dae-Han Choi; Jae-young Lee; Ji-hye Park; J.I. Choi; Bi-kong Choi; Yong-Zoo You; Hui-Gon Chun; Daeil Kim
Chromium nitride (CrN) films were deposited by using inductively coupled plasma (ICP) assisted RF magnetron sputtering to investigate the effect of substrate bias voltage on the hardness, surface morphology roughness, and crystalline growth on Si(100) substrate. As increasing substrate bias voltage (Vb), surface hardness increased from 5 to 15 GPa. The grain size also increased proportionally as increasing Vb from -30 to -80, while beyond -80 Vb, the grain size was deteriorated by an intense N+ion bombardment.
Materials Chemistry and Physics | 2008
Yong-Zoo You; Y.S. Kim; Dong-Hyuk Choi; H.S. Jang; J.H. Lee; Daeil Kim
International Journal of Hydrogen Energy | 2011
Byung-Chul Cha; Yong-Zoo You; Sung-Tae Hong; Jun-Ho Kim; Dae-Wook Kim; Byung-Seok Lee; Sun-Kwang Kim
Nuclear Instruments & Methods in Physics Research Section B-beam Interactions With Materials and Atoms | 2007
Daeil Kim; H.S. Jang; Y.S. Kim; Dong-Hyuk Choi; B.K. Choi; J.H. Lee; Yong-Zoo You; Hui-Gon Chun
Vacuum | 2012
Jun-Ho Kim; Dong-Won Jung; Sun-Kwang Kim; Sung-Tae Hong; Yong-Zoo You; Daeil Kim
Journal of Korean Vacuum Science & Technology | 2002
K. V. Oskomov; Hui-Gon Chun; Tong-Yul Cho; N. S. Sochugov; Yong-Zoo You
Metallurgical and Materials Transactions A-physical Metallurgy and Materials Science | 1986
Yong-Zoo You; Ker-Chang Hsieh; Y. Austin Chang
한국표면공학회지 | 2003
Hui-Gon Chun; Jing-Hyuk Lee; Yong-Zoo You; Yong-Duek Ko; Tong-Yul Cho
Journal of the Korean Society for Heat Treatment | 2012
Yong-Zoo You; S.K. Kim; Young-Jin Lee; Sung-Bo Heo; H.M. Lee; Daeil Kim